IP Library Granted Patent US 12,050,205
Granted Patent B2
US 12,050,205 · App. 17/519,573 · Granted Jul 30, 2024

Material testing machine and control method of material testing machine

Inventors: Mitsuhiro Mouri (Kyoto, JP); Hiroshi Tsuji (Kyoto, JP)
Assignee: SHIMADZU CORPORATION
G01N3/08G01N3/068G01N3/62G01N2203/0017G01N2203/021G01N2203/0688
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,050,205
App. No.
17/519,573
Granted
Jul 30, 2024
Kind
B2
Abstract

The disclosure provides a tensile testing machine and includes: a processing filter that removes a noise component included in a test force measurement signal output from a load cell; and an adjustment unit that adjusts a frequency characteristic of the processing filter. The adjustment unit receives a detection signal output from the sensor, and adjusts the frequency characteristic of the processing filter on a basis of a difference between output signals of two low-pass filters having different frequency characteristics.

Claims (31)

1. A material testing machine comprising:

a processing filter that removes a noise component included in a detection signal output from a sensor; and

an adjustment unit that adjusts a frequency characteristic of the processing filter,

wherein the adjustment unit receives the detection signal output from the sensor, and adjusts the frequency characteristic of the processing filter on a basis of a difference between output signals of two low-pass filters having different frequency characteristics and serving as the processing filter.

2. The material testing machine according to claim 1 , wherein

an output signal of the processing filter is used as a display signal to be displayed on a display.

3. The material testing machine according to claim 1 , further comprising:

a first determination unit that determines whether the difference between the output signals of the two low-pass filters is equal to or larger than a first threshold value, wherein

the processing filter is configured by a low-pass filter, and

the adjustment unit decreases a cutoff frequency of the processing filter according to a determination result of the first determination unit.

4. The material testing machine according to claim 3 , further comprising:

a first low-pass filter having a cutoff frequency of a first frequency;

a second low-pass filter having a cutoff frequency of a second frequency lower than the first frequency;

a third low-pass filter having a cutoff frequency of a third frequency lower than the second frequency; and

a selection unit that selects the two low-pass filters from among the first low-pass filter, the second low-pass filter, and the third low-pass filter, wherein

in a case where the second low-pass filter is set as the processing filter, the selection unit selects the first low-pass filter and the second low-pass filter as the two low-pass filters, and

the adjustment unit switches the processing filter from the second low-pass filter to the third low-pass filter according to the determination result of the first determination unit.

5. The material testing machine according to claim 1 , further comprising:

a second determination unit that determines whether a difference between output signals of the two low-pass filters is equal to or less than a second threshold value, wherein

the processing filter is configured by a low-pass filter, and

the adjustment unit increases a cutoff frequency of the processing filter according to a determination result of the second determination unit.

6. The material testing machine according to claim 5 , further comprising:

a first low-pass filter having a cutoff frequency of a first frequency;

a second low-pass filter having a cutoff frequency of a second frequency lower than the first frequency;

a third low-pass filter having a cutoff frequency of a third frequency lower than the second frequency; and

a selection unit that selects the two low-pass filters from among the first low-pass filter, the second low-pass filter, and the third low-pass filter, wherein

in a case where the third low-pass filter is set as the processing filter, the selection unit selects the first low-pass filter and the third low-pass filter as the two low-pass filters, and

the adjustment unit switches the processing filter from the third low-pass filter to the second low-pass filter according to the determination result of the second determination unit.

7. A control method of a material testing machine which includes a processing filter of removing a noise component included in a detection signal output from a sensor, the control method comprising:

receiving the detection signal output from the sensor;

adjusting a frequency characteristic of the processing filter on a basis of a difference between output signals of two low-pass filters having different frequency characteristics and serving as the processing filter.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 8, 2021
From: MOURI, MITSUHIRO; TSUJI, HIROSHI
To: SHIMADZU CORPORATION
Reel/Frame 058052/0522 →
Priority Claims (1)
JP 2020-200222 · Dec 2, 2020 · national
Continuity (1)
Related Publication 20220170833A1 · Jun 2, 2022