IP Library › Granted Patent US 12,196,624
Granted Patent B2
US 12,196,624 · App. 17/522,363 · Granted Jan 14, 2025

Apparatus and method for estimating body temperature

Inventors: So Young Lee (Suwon-si, KR); Sang Kyu Kim (Yongin-si, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
G01K7/22G01K1/165G01K13/20
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Quick Facts
Patent No.
US 12,196,624
App. No.
17/522,363
Filed
Nov 9, 2021
Granted
Jan 14, 2025
Kind
B2
Art Unit
2855
USPC
374/185
Abstract

An apparatus for estimating body temperature includes a sensor including a first sensor board; an object contact surface provided below the first sensor board; a thermally conductive material provided on an upper end of the first sensor board; a second sensor board provided on an upper end of the thermally conductive material; at least one first temperature sensor provided on the first sensor board and being configured to measure a surface temperature of the object; and at least one second temperature sensor provided on the second sensor board and being configured to measure a surface temperature of the thermally conductive material; and a processor configured to: measure a heat flux based on the surface temperature of the object and the surface temperature of the thermally conductive material; and estimate core temperature based on the measured heat flux and the surface temperature of the object.

Claims (46)

1. An apparatus for estimating a temperature of an object, the apparatus comprising:

a sensor comprising:

a first sensor board;

a thermally conductive material provided on an upper end of the first sensor board;

a second sensor board provided on an upper end of the thermally conductive material;

at least one first temperature sensor provided on the first sensor board, the at least one first temperature sensor being configured to measure a surface temperature of the object; and

at least one second temperature sensor provided on the second sensor board, the at least one second temperature sensor being configured to measure a surface temperature of the thermally conductive material; and

a processor configured to:

measure a heat flux based on the surface temperature of the object and the surface temperature of the thermally conductive material;

calculate a correction factor based on a thermal resistance value of the thermally conductive material and the heat flux; and

estimate a core temperature of the object based on a combination of the surface temperature of the object with a ratio between the heat flux and the calculated correction factor.

2. The apparatus of claim 1 , wherein a distance between the first sensor board and the second sensor board is 10 mm or less.

3. The apparatus of claim 1 , wherein the thermally conductive material has a thermal conductivity of 0.1 W/mK or less.

4. The apparatus of claim 1 , wherein the thermally conductive material has a thickness in a range of 0.1 mm to 5 mm.

5. The apparatus of claim 1 , wherein the thermally conductive material comprises air.

6. The apparatus of claim 1 , wherein at least one of the at least one first temperature sensor and at least one of the at least one second temperature sensor are thermistors.

7. The apparatus of claim 1 , wherein at least one of the at least one first temperature sensor and at least one of the at least one second temperature sensor are disposed on a straight line facing each other.

8. The apparatus of claim 1 , wherein the processor is further configured to measure the heat flux based on a value obtained by subtracting the surface temperature of the object and the surface temperature of the thermally conductive material.

9. The apparatus of claim 1 , further comprising a contact layer disposed on a lower end of the first sensor board, the contact layer being configured to contact the object.

10. The apparatus of claim 9 , wherein the contact layer has a thermal conductivity in a range of 1 W/mK to 500 W/mK.

11. The apparatus of claim 1 , further comprising a first convection blocker spaced apart by a predetermined distance from the sensor, the first convection blocker being configured to block convection from an upper end of the sensor, and a second convection blocker configured to block convection from a side surface of the sensor.

12. The apparatus of claim 11 , wherein the predetermined distance is in a range of 0.1 mm to 10 mm.

13. The apparatus of claim 1 , wherein the sensor further comprises a heat flux increasing layer provided on an upper portion of the second sensor board and configured to increase the heat flux.

14. The apparatus of claim 13 , wherein the heat flux increasing layer has a thermal conductivity of 10 W/mK to 500 W/mK.

15. A method of estimating a temperature of an object, the method comprising:

measuring, based on an output of a first temperature sensor disposed on a first sensor board of a sensor, a surface temperature of an object;

measuring, based on an output of a second temperature sensor disposed on a second sensor board of the sensor, a surface temperature of a thermally conductive material disposed between the first sensor board and the second sensor board;

measuring a heat flux based on the surface temperature of the object and the surface temperature of the object of the thermally conductive material;

calculating a correction factor based on a thermal resistance value of the thermally conductive material and the heat flux; and

estimating a core temperature based on a combination of the surface temperature of the object with a ratio between the heat flux and the calculated correction factor.

16. The method of claim 15 , wherein the measuring of the heat flux comprises measuring the heat flux based on a value obtained by subtracting the surface temperature of the object and the surface temperature of the thermally conductive material.

17. An electronic device comprising:

a sensor comprising:

a first sensor board;

a second sensor board which is spaced apart from the first sensor board;

a thermally conductive material provided between the first sensor board and the second sensor board;

a second sensor board provided on an upper end of the thermally conductive material;

at least one first temperature sensor provided on the first sensor board and configured to measure a surface temperature of an object;

at least one second temperature sensor provided on the second sensor board, and configured to measure a surface temperature of the thermally conductive material; and

a heat flux increasing layer provided on the second sensor board and configured to increase a heat flux; and

a processor configured to:

measure the heat flux based on the surface temperature of the object and the surface temperature of the thermally conductive material; and

estimate a core temperature of the object based on the heat flux and the surface temperature of the object.

18. The electronic device of claim 17 , further comprising:

a first convection blocker spaced apart by a predetermined distance from the sensor and configured to block convection from an upper end of the sensor; and

a second convection blocker configured to block convection from a side surface of the sensor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 9, 2021
From: LEE, SO YOUNG; KIM, SANG KYU
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 058063/0011 →
Priority Claims (1)
KR 10-2021-0114781 · Aug 30, 2021 · national
Continuity (1)
Related Publication 20230066222A1 · Mar 2, 2023
References Cited (39)
US 7249883B2 · Kuroda et al. · 2007 [cited by applicant]
US 8226294B2 · Bieberich et al. · 2012 [cited by applicant]
US 8716629B2 · Klewer et al. · 2014 [cited by applicant]
US 9354122B2 · Bieberich et al. · 2016 [cited by applicant]
US 9699546B2 · Qian et al. · 2017 [cited by applicant]
US 9716937B2 · Qian et al. · 2017 [cited by applicant]
US 9939334B2 · Yarden · 2018 [cited by applicant]
US 10088373B2 · Durrer et al. · 2018 [cited by applicant]
US 10260965B2 · Ikeda et al. · 2019 [cited by applicant]
US 10274383B2 · Bieberich et al. · 2019 [cited by applicant]
US 10405755B2 · Shrubsole et al. · 2019 [cited by applicant]
US 10668206B2 · Newell et al. · 2020 [cited by applicant]
US 10765409B2 · Lafon et al. · 2020 [cited by applicant]
US 10830649B2 · Tsuchimoto · 2020 [cited by applicant]
US 11071814B2 · Newell et al. · 2021 [cited by applicant]
US 11090423B2 · Newell et al. · 2021 [cited by applicant]
US 11090424B2 · Newell et al. · 2021 [cited by applicant]
US 20070225614A1 · Naghavi et al. · 2007 [cited by applicant]
US 20130331728A1 · Sun · 2013 [cited by examiner]
US 20160213354A1 · Levin et al. · 2016 [cited by applicant]
US 20190159680A1 · Tanaka et al. · 2019 [cited by applicant]
US 20200037884A1 · Ishida · 2020 [cited by examiner]
US 20200060869A1 · Telfort et al. · 2020 [cited by applicant]
US 20200085310A1 · Zahner et al. · 2020 [cited by applicant]
US 20200217727A1 · Heitz et al. · 2020 [cited by applicant]
US 20220087534A1 · Mansky · 2022 [cited by examiner]
US 20230104844A1 · Tanaka · 2023 [cited by examiner]
JP 2007212407A · 2007 [cited by applicant]
JP 2009222543A · 2009 [cited by applicant]
JP 2013200152A · 2013 [cited by applicant]
JP 5898204B2 · 2016 [cited by applicant]
WO WO2008078271A1 · 2008 [cited by examiner]
WO 2017062923A1 · 2017 [cited by applicant]
WO WO2019126607A1 · 2019 [cited by examiner]
WO 2020171701A1 · 2020 [cited by applicant]
WO WO2021220395A1 · 2021 [cited by examiner]
Matweb, “Overview of materials for Silicone, RTV, Adhesive/Sealant Grade”. [cited by examiner]
Matweb, “Overview of materials for Silicone Foam”. [cited by examiner]
The Engineering Toolbox, “Air-Thermophysical Properties”. [cited by examiner]