IP Library Granted Patent US 12,543,567
Granted Patent B2
US 12,543,567 · App. 17/525,661 · Granted Feb 3, 2026

Tunable stack-up DIMM form factor cold plate with embedded peltier devices for enhanced cooling capability

Inventors: Prabhakar Subrahmanyam (San Jose, CA); Yi Xia (Campbell, CA); Ying-Feng Pang (San Jose, CA); Ridvan A. Sahan (Sunnyvale, CA)
Assignee: Intel Corporation
H01L23/38H01L23/42H01L24/32H01L2224/32245
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Quick Facts
Patent No.
US 12,543,567
App. No.
17/525,661
Granted
Feb 3, 2026
Kind
B2
Abstract

An apparatus is described. The apparatus includes a metallic chamber having a first outer surface with first Peltier devices and a second outer surface with second Peltier devices. The first and second outer surfaces face in opposite directions such that the first Peltier devices are to cool first semiconductor chips that face the first outer surface and the second Peltier devices are to cool second semiconductor chips that face the second outer surface.

Claims (35)

1 . An apparatus comprising:

a metallic cold plate defining a chamber, the metallic cold plate having a first outer surface and a second outer surface, the first and second outer surfaces facing in opposite directions; and

first Peltier devices coupled to the first outer surface, the first Peltier devices to cool first semiconductor chips that face the first outer surface; and

second Peltier devices coupled to the second outer surface, the second Peltier devices to cool second semiconductor chips that face the second outer surface, wherein respective wires for the first and second Peltier devices are mechanically integrated with the first and second outer surfaces.

2 . The apparatus of claim 1 , wherein the first semiconductor chips are components of a first Dual In-Line Memory Module (DIMM) and the second semiconductor chips are components of a second DIMM.

3 . The apparatus of claim 1 , wherein the first Peltier devices are located in grooves formed in the first outer surface.

4 . The apparatus of claim 1 , wherein the respective wires run to at least one electrical connector that is mechanically integrated with the metallic cold plate.

5 . The apparatus of claim 1 , wherein an elastic epoxy resides between the respective wires and the first and second outer surfaces.

6 . The apparatus of claim 1 , wherein the metallic cold plate has a fluidic input and a fluidic output.

7 . The apparatus of claim 1 , wherein the metallic cold plate has internal fins positioned to form a fluidic channel that causes a same fluid to cool more than one of the first Peltier devices.

8 . An apparatus comprising:

a metallic cold plate including a first plate having a first outer surface with first Peltier devices and a second plate having a second outer surface with second Peltier devices, the first and second outer surfaces facing in opposite directions, the metallic cold plate defining a chamber and including an O-ring, the chamber sealed with the O-ring between the first and second plates;

a first Dual In-Line Memory Module (DIMM) having first packaged semiconductor chips in thermal contact with the first Peltier devices; and

a second DIMM having second packaged semiconductor chips in thermal contact with the second Peltier devices, the metallic cold plate including a threaded element to lessen compression of the first and second plates to cause the O-ring to expand and press the first Peltier devices into the first packaged semiconductor chips and press the second Peltier devices into the second packaged semiconductor chips.

9 . The apparatus of claim 8 , wherein the first Peltier devices are located in grooves formed in the first outer surface.

10 . The apparatus of claim 8 , wherein respective wires for the first and second Peltier devices are mechanically integrated with the first and second outer surfaces.

11 . The apparatus of claim 8 , wherein respective wires run to at least one electrical connector that is mechanically integrated with the metallic cold plate and is connected to a PC board that the first and second DIMMs are installed upon.

12 . The apparatus of claim 10 , wherein an elastic epoxy resides between the respective wires and the first and second outer surfaces.

13 . A data center, comprising:

multiple racks;

at least one network;

pumping and cooling equipment to receive warmed fluid and to provide cooled fluid; and

multiple electronic systems that are installed into the multiple racks and are communicatively coupled by the at least one network, wherein, at least one of the electronic systems includes:

a cold plate including a first plate having a first outer surface with first Peltier devices and a second plate having a second outer surface with second Peltier devices, the first and second outer surfaces facing in opposite directions, the cold plate including a fluidic input to receive the cooled fluid and a fluidic output to provide the warmed fluid, the cold plate including an O-ring, the cold plate defining a chamber sealed with the O-ring between the first and second plates;

a first Dual In-Line Memory Module (DIMM) having first packaged semiconductor chips that are in thermal contact with the first Peltier devices; and

a second DIMM having second packaged semiconductor chips that are in thermal contact with the second Peltier devices, the cold plate including a threaded element to lessen compression of the first and second plates to cause the O-ring to expand and press the first Peltier devices into the first packaged semiconductor chips and press the second Peltier devices into the second packaged semiconductor chips.

14 . The data center of claim 13 , wherein the first Peltier devices are located in grooves formed in the first outer surface.

15 . The data center of claim 13 , wherein respective wires for the first and second Peltier devices are mechanically integrated with the first and second outer surfaces.

16 . The data center of claim 15 , wherein the respective wires run to at least one electrical connector that is mechanically integrated with the cold plate and is connected to a PC board that the first and second DIMMs are installed upon.

17 . The data center of claim 15 , wherein an elastic epoxy resides between the respective wires and the first and second outer surfaces.

18 . The data center of claim 13 , wherein the first and second DIMMs conform to a Joint Electronic Device Engineering Council (JEDEC) Double Data Rate (DDR) standard.

19 . An apparatus, comprising:

a cold plate to be inserted between first and second Dual In-Line Memory Modules (DIMMs) when the first and second DIMMs are plugged into respective first and second DIMM connectors, the cold plate having a first outer surface to face the first DIMM, the first outer surface having a first active device to be placed in thermal contact with the first DIMM, the cold plate having a second outer surface to face the second DIMM, the second outer surface having a second active device to be placed in thermal contact with the second DIMM, the cold plate to hold liquid that is to receive heat generated from the first and second DIMMs;

electrical connections emanating from the cold plate, the electrical connections to be coupled to an electrical connector that resides between the first and second DIMM connectors; and

electrical wiring that is integrated with the cold plate and that runs between the electrical connections to the first and second active devices.

Assignments (2)
CORRECTIVE ASSIGNMENT TO CORRECT THE ADDRESS OF THE RECEIVING PARTY PREVIOUSLY RECORDED ON REEL 58103 FRAME 189. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT . Recorded Jan 6, 2026
From: SUBRAHMANYAM, PRABHAKAR; XIA, YI; PANG, YING-FENG; SAHAN, RIDVAN A.
To: INTEL CORPORATION
Reel/Frame 074117/0936 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 12, 2021
From: SUBRAHMANYAM, PRABHAKAR; XIA, YI; PANG, YING-FENG; SAHAN, RIDVAN A.
To: INTEL CORPORATION
Reel/Frame 058103/0189 →
Continuity (1)
Related Publication 20220077023A1 · Mar 10, 2022
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