Semiconductor storage device
Transistors N 1 , N 5 corresponding to a drive transistor PD 1 are formed in a cell lower part and a cell upper part, respectively, and transistors N 2 , N 6 corresponding to a drive transistor PD 2 are formed in the cell lower part and the cell upper part, respectively. A transistor P 1 corresponding to a load transistor PU 2 is formed in the cell lower part, and a transistor P 2 corresponding to a load transistor PU 1 is formed in the cell upper part.
1. A semiconductor storage device including a two-port SRAM cell, the two-port SRAM cell comprising:
a first transistor with one of its nodes connected to a first power supply that supplies a first voltage, the other node connected to a first node, and its gate connected to a second node:
a second transistor with one of its nodes connected to the first power supply, the other node connected to the second node, and its gate connected to the first node;
a third transistor with one of its nodes connected to the first node, the other node connected to a second power supply that supplies a second voltage, and its gate connected to the second node;
a fourth transistor with one of its nodes connected to the second node, the other node connected to the second power supply, and its gate connected to the first node;
a fifth transistor with one of its nodes connected to a first bit line, the other node connected to the first node, and its gate connected to a first word Ime;
a sixth transistor with one of its nodes connected to a second bit line constituting a first complementary bit line pair with the first bit fine, the other node connected to the second node, and tis gate connected to the first word lime:
a seventh transistor with one of its nodes connected to a third bit line, the other node connected to the first node, and its gate connected to a second word line; and
an eighth transistor with one of its nodes connected to a fourth bit line constituting a second complementary bit line pair with the third bit line, the other node connected to the second node, and its gate connected to the second word line, wherein
the third and fourth transistors are each constituted by a plurality of three-dimensional transistors of a first conductivity type formed in a first layer side by side in a second direction perpendicular to a first direction, the first direction being a direction which channel portions of the first to eighth transistors extend,
the first and second transistors are each constituted by a three-dimensional transistor of a second conductivity type different from the first conductivity type formed in a second layer located above the first layer, and overlap the third and fourth transistors, respectively, at least partly as viewed in plan, and
the fifth to eighth transistors each include a three-dimensional transistor of the first conductivity type formed in the second layer; and wherein
the three-dimensional transistors of the first to fourth transistors are constituted by a stacked transistor structure comprising at least one nanowire extending through a gate electrode in the first direction and one of first and second conductivity types semiconductor layers arranged on both ends of the at least one nanowire.