IP Library › Granted Patent US 11,581,027
Granted Patent B2
US 11,581,027 · App. 17/543,046 · Granted Feb 14, 2023

Memory sense amplifier trimming

Inventors: Yi-Chun Shih (Taipei, TW); Chia-Fu Lee (Hsinchu, TW); Yu-Der Chih (Hsin-Chu, TW)
Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
G11C7/08G11C7/067G11C7/1039G11C11/1673G11C29/42
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Quick Facts
Patent No.
US 11,581,027
App. No.
17/543,046
Granted
Feb 14, 2023
Kind
B2
Abstract

A memory device, such as an MRAM memory, includes a memory array with a plurality of bit cells. The memory array is configured to store trimming information and store user data. A sense amplifier is configured to read the trimming information from the memory array, and a trimming register is configured to receive the trimming information from the sense amplifier. The sense amplifier is configured to receive the trimming information from the trimming register so as to operate in a trimmed mode for reading the user data from the memory array.

Claims (40)

1. A memory device, comprising:

a memory array configured to store trimming information;

a sense amplifier configured to read the trimming information from the memory array;

a trimming register configured to store the trimming information and apply the trimming information to the sense amplifier; and

wherein a first bit cell of the memory array is configured to store a first bit of the trimming information and a second bit cell of the memory array is configured to store a complement of the first bit of the trimming information.

2. The memory device of claim 1 , wherein the memory array includes MRAM bit cells.

3. The memory device of claim 1 , wherein the sense amplifier is configured to read the trimming information from the memory array in an untrimmed mode in which the trimming information is not applied to the sense amplifier.

4. The memory device of claim 1 , wherein the trimming register is configured to apply the trimming information to the sense amplifier.

5. The memory device of claim 1 , wherein the trimming information is stored in the memory array in a one-cell-per-bit mode.

6. The memory device of claim 5 , further comprising a reference circuit including a reference bit cell, wherein the sense amplifier is configured to compare a read current of a bit cell of the memory array with a reference current of the reference bit cell in the one-cell-per-bit mode.

7. The memory device of claim 1 , further comprising an error correction code (ECC) decoder connected to an output of the sense amplifier, and wherein:

the memory array is configured to store ECC data;

the sense amplifier is configured to read the ECC data from the memory array in the untrimmed mode; and

the ECC decoder is configured to receive the trimming information and the ECC data from the sense amplifier and output the trimming information to the trimming register.

8. The memory device of claim 1 , further comprising a majority voting decoder connected to an output of the sense amplifier, and wherein:

the memory array is configured to store multiple copies of each bit of the trimming information;

the sense amplifier is configured to read each of the multiple copies of each bit of the trimming information in the untrimmed mode; and

the majority voting decoder is configured receive the multiple copies of each bit of the trimming information and output the trimming information to the trimming register in response to the multiple copies of each bit of the trimming information.

9. The memory device of claim 1 , wherein the sense amplifier is configured to repeatedly read a predetermined data pattern from the memory array before reading the trimming information from the memory array.

10. A method, comprising:

storing trimming information for a sense amplifier and error correction code (ECC) data in a memory array;

reading the trimming information and the ECC data from the memory array by the sense amplifier;

receiving the trimming information and the ECC data by an ECC decoder from the sense amplifier; and

outputting the trimming information to a trimming register.

11. The method of claim 10 , wherein the memory array is an MRAM array.

12. The method of claim 10 , further comprising storing user data in the memory array.

13. The method of claim 12 , further comprising:

applying the trimming information from the trimming register to the sense amplifier; and thereafter

reading the user data from the memory array by the sense amplifier.

14. The method of claim 10 , wherein reading the trimming information includes comparing a first read current of a first bit cell of the memory array to a second read current of a second bit cell of the memory array.

15. The method of claim 10 , further comprising repeatedly reading a predetermined data pattern from the memory array before reading the trimming information from the memory array.

16. A method, comprising:

storing multiple copies of each bit of trimming information for a sense amplifier in a memory array;

reading each of the multiple copies of each bit of the trimming information from the memory array by the sense amplifier;

receiving the multiple copies of each bit of the trimming information by a majority voting decoder from the sense amplifier; and

outputting the trimming information to a trimming register in response to the multiple copies of each bit of the trimming information.

17. The method of claim 16 , wherein the memory array is an MRAM array.

18. The method of claim 16 , wherein reading the trimming information includes comparing a first read current of a first bit cell of the memory array to a second read current of a second bit cell of the memory array.

19. The method of claim 16 , further comprising applying the trimming information from the trimming register to the sense amplifier.

20. The method of claim 16 , further comprising repeatedly reading a predetermined data pattern from the memory array before reading the trimming information from the memory array.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 6, 2021
From: SHIH, YI-CHUN; LEE, CHIA-FU; CHIH, YU-DER
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Reel/Frame 058309/0016 →
Continuity (2)
Continuation 16870220 · May 8, 2020
Related Publication 20220093142A1 · Mar 24, 2022
Cited By (2)
US 12,211,579 US 12,366,973