IP Library Granted Patent US 11,662,364
Granted Patent B1
US 11,662,364 · App. 17/544,312 · Granted May 30, 2023

Integrated waveguide tuner

Inventor: Christos Tsironis (Kirkland, CA)
G01R1/06772H01P3/121H01P5/08
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Quick Facts
Patent No.
US 11,662,364
App. No.
17/544,312
Granted
May 30, 2023
Kind
B1
Abstract

A wafer probe-to-waveguide adapter is transformed to a load pull device by integrating in the straight section of the waveguide a two-slug tuner with fixed penetration into diametral slots in the waveguide controlled by linear stepper actuators crossing over and sharing the same section of the waveguide.

Claims (25)

1. A wafer probe to waveguide adapter comprising:

a bent waveguide transmission line between a waveguide flange and the wafer probe and

an integrated automated slide screw tuner, having two remotely controlled tuning probes;

wherein

the waveguide transmission line has two broad walls, a top broad wall, and a bottom broad wall, and two narrow sidewalls, and

two slots parallel to a longitudinal axis of the waveguide transmission line, placed facing each-other, one on the top and one on the bottom broad wall;

wherein

the slots are positioned offset of a center line of the waveguide transmission line by at least a thickness of the tuning probes,

and wherein

two remotely controlled stepper actuators A# 1 and A# 2 are mounted opposite to each-other, one on the top broad wall and one on the bottom broad wall, and control associated tuning probes P# 1 and P# 2 , which are inserted diametrical into the slots at a fixed penetration into and move along the waveguide transmission line, sharing this way a section of the waveguide transmission line;

and wherein

actuator A# 1 moves probe P# 1 to a position X 1 , and

actuator A# 2 moves probe P# 2 to a position X 2 .

2. The wafer probe to waveguide adapter of claim 1 ,

wherein

the slots are at least one half of a wavelength (λ/2) long at a lowest frequency of operation (Fmin).

3. The wafer probe to waveguide adapter of claim 1 ,

wherein

the tuning probes are at least partly metallic or metallized rods.

4. The wafer probe to waveguide adapter of claim 1 ,

wherein

the tuning probes are at least partly metallic or metallized blocks.

5. The wafer probe to waveguide adapter of claim 1 ,

wherein

the tuning probes traverse the slots in a contactless manner.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 10, 2026
From: FOCUSMW IP INC
To: FOCUS MICROWAVES INC.
Reel/Frame 075742/0030 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 18, 2025
From: TSIRONIS, CHRISTOS
To: FOCUSMW IP. INC.
Reel/Frame 073588/0660 →