Array architecture and interconnection for transducers
A method of fabricating a transducer includes embedding signal flexes and ground-return flexes inside a backing block. The method includes forming stack configurations with a height in elevation and a width perpendicular to the height. The forming includes: dicing a piezoelectric layer in the elevation into rows (separating the piezoelectric layer into portions); defining a beam pattern for the transducer by aligning the portions on the backing block; and forming gaps in-between each piezoelectric layer portion and each adjacently aligned piezoelectric layer portion. The method includes forming stacks by bonding one or more matching layers to the piezoelectric layer portions by utilizing a conductive surface of a first matching layer of the one or more matching layers. The method also includes forming cavities in the one or more matching layers in elevation, dicing the stacks along an elevation direction into multiple elements, and filling the cavities with a material.
1 . A transducer comprising:
a lens;
signal flexes and ground-return flexes inside a backing block; and
stack configurations aligned on the backing block, wherein the stack configurations each comprise:
a piezoelectric layer, wherein a gap is formed in elevation in-between each piezoelectric layer and each adjacently aligned piezoelectric layer, wherein each stack configuration has a height in elevation, a width perpendicular to the height, and a stack-up thicknesses-configuration, wherein the stack-up thicknesses-configuration is perpendicular to the height and perpendicular to the width; and
one or more matching layers coupled to the lens and bonded to each piezoelectric layer, wherein a conductive surface of a matching layer of the one or more matching layers is coupled to a top surface of each piezoelectric layer, wherein the one or more matching layers comprise one or more cavities, wherein the cavities are filled with a material,
wherein the backing block comprises three or more U-shaped trough block sections and each stack configuration of the stack configurations aligned on the backing block is aligned inside of one or more of the three or more U-shaped trough block sections forming at least two outer rows and a center row, and further
wherein the center row generates a first frequency signal and the at least two outer rows generate a second frequency signal, and wherein a frequency of the first frequency signal is not equivalent to a frequency of the second frequency signal.
2 . The transducer of claim 1 , wherein the heights of the stack configurations are equivalent to each other or are not equivalent to each other, wherein the widths of the stack configurations are equivalent to each other, and wherein the stack-up thicknesses-configurations are equivalent to each other or are not equivalent to each other.
3 . The transducer of claim 1 , wherein at least one stack configuration further comprises a de-matching layer coupled to the piezoelectric layer of the at least one stack configuration.
4 . The transducer of claim 1 , wherein the three or more U-shaped trough block sections comprise machined backing shoulder strippers, wherein the ground-return flexes are embedded into the machined backing shoulder strippers, and wherein the signal flexes are at a bottom position on the backing block to define connections for the stack configurations.
5 . The transducer of claim 4 , the machined backing shoulder strippers comprising two outer machined backing shoulder strippers and two or more inner machined backing shoulder strippers.
6 . The transducer of claim 1 , wherein the cavities extend through each layer of the one or more matching layers.
7 . The transducer of claim 1 , wherein the cavities do not extend through the conductive surface.
8 . The transducer of claim 1 , wherein the material used to fill in the cavities is from the group consisting of: air, room-temperature-vulcanizing silicone, backing material, and a material mixed with micro-balloons.
9 . The transducer of claim 1 , wherein the one or more matching layers bonded to each stack configuration have a layer height in the elevation, a layer width perpendicular to the layer height, and a layer-up thicknesses-configuration, wherein the layer-up thicknesses-configuration is perpendicular to the layer height and perpendicular to the layer width, the one or more matching layers bonded to each stack configuration do not have equivalent layer heights.
10 . The transducer of claim 1 , wherein the one or more matching layers have a layer height in the elevation, a layer width perpendicular to the layer height, and a layer-up thicknesses-configuration, wherein the layer-up thicknesses-configuration is perpendicular to the layer height and perpendicular to the layer width, and the layer width for each matching layer of the one or more matching layers is equivalent.
11 . The transducer of claim 1 , wherein the one or more matching layers bonded to each stack configuration have a layer height in the elevation, a layer width perpendicular to the layer height, and a layer-up thicknesses-configuration, wherein the layer-up thicknesses-configuration is perpendicular to the layer height and perpendicular to the layer width, the one or more matching layers bonded to each stack configuration do not have equivalent layer-up thicknesses-configurations.
12 . The transducer of claim 1 , wherein the conductive surface comprises an electrode.
13 . The transducer of claim 1 , wherein the stack configurations are aligned on the backing block in both an elevation direction and in an azimuth direction.
14 . A transducer comprising:
a lens;
signal flexes and ground-return flexes inside a backing block; and
stack configurations aligned on the backing block, wherein each stack configuration of the stack configurations aligned on the backing block in a row of at least two outer rows and a center row, wherein the center row generates a first frequency signal and the at least two outer rows generate a second frequency signal, wherein a frequency of the first frequency signal is not equivalent to a frequency of the second frequency signal, and wherein the stack configurations each comprise:
a piezoelectric layer, wherein a gap is formed in elevation in-between each piezoelectric layer and each adjacently aligned piezoelectric layer; and
one or more matching layers coupled to the lens and bonded to each piezoelectric layer, wherein a conductive surface of a matching layer of the one or more matching layers is coupled to a top surface of each piezoelectric layer, wherein the one or more matching layers comprise one or more cavities, where in the cavities are filled with a material.
15 . The transducer of claim 14 , wherein the widths of the stack configurations are equivalent to each other.
16 . The transducer of claim 14 , wherein three or more U-shaped trough block sections of the backing block comprise machined backing shoulder strippers, wherein the ground-return flexes are embedded into the machined backing shoulder strippers, and wherein the signal flexes are at a bottom position on the backing block to define connections for the stack configurations.
17 . The transducer of claim 16 , the machined backing shoulder strippers comprising two outer machined backing shoulder strippers and two or more inner machined backing shoulder strippers.
18 . The transducer of claim 14 , wherein the one or more matching layers bonded to each stack configuration have a layer height in the elevation, a layer width perpendicular to the layer height, and a layer-up thicknesses-configuration, wherein the layer-up thicknesses-configuration is perpendicular to the layer height and perpendicular to the layer width, the one or more matching layers bonded to each stack configuration do not have equivalent layer heights.
19 . The transducer of claim 14 , wherein the one or more matching layers have a layer height in the elevation, a layer width perpendicular to the layer height, and a layer-up thicknesses-configuration, wherein the layer-up thicknesses-configuration is perpendicular to the layer height and perpendicular to the layer width, and the layer width for each matching layer of the one or more matching layers is equivalent.
20 . The transducer of claim 14 , wherein the one or more matching layers bonded to each stack configuration have a layer height in the elevation, a layer width perpendicular to the layer height, and a layer-up thicknesses-configuration, wherein the layer-up thicknesses-configuration is perpendicular to the layer height and perpendicular to the layer width, the one or more matching layers bonded to each stack configuration do not have equivalent layer-up thicknesses-configurations.