IP Library Granted Patent US 12,352,686
Granted Patent B2
US 12,352,686 · App. 17/570,302 · Granted Jul 8, 2025

In-situ contamination monitoring

Inventors: Rocky G. Morales (Long Beach, CA); Aileen O. Hui (Los Angeles, CA); De-Ling Liu (Manhattan Beach, CA)
Assignee: THE AEROSPACE CORPORATION
G01N21/211B64G1/66G02B21/0004G02B21/34
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Quick Facts
Patent No.
US 12,352,686
App. No.
17/570,302
Granted
Jul 8, 2025
Kind
B2
Abstract

A multi-purpose in-situ contamination sampler includes an inner frame surrounded by a plurality of removable or attachable pieces, each of which include of a single witness surface configured to collect both particulate and molecular contamination within an environment on a payload or a spacecraft.

Claims (28)

1. A multi-purpose in-situ contamination sampler, comprising:

an inner frame surrounded by a plurality of removable or attachable pieces, each of which comprise of a single witness surface configured to collect both particulate and molecular contamination within an environment where sensitive hardware or material is housed; and

a plurality of outer lids, each of which are attached to a corresponding one of the plurality of removable or attachable pieces preventing the collected particulate and the collected molecular contamination from escaping.

2. The sampler of claim 1 , wherein the single witness surface on each of the plurality of removable or attachable pieces comprise a silicon window configured to collect both the particulate and the molecular contamination where the sensitive hardware or material is housed.

3. The sampler of claim 1 ,

wherein each of the plurality of outer lids provides a protective surface to prevent cross-contamination and damage to a corresponding piece of the plurality of removable or attachable pieces.

4. The sampler of claim 3 , wherein each of the plurality of outer lids comprises a silicon window that accounts for particle redistribution between the silicon window on the corresponding piece and the silicon window on each of the plurality of outer lids.

5. The sampler of claim 1 , wherein one piece of the plurality of removable or attachable pieces lacks the single witness surface and is attached to an adjacent surface inside of the environment.

6. The sampler of claim 5 , wherein the one piece is mounted to the adjacent surface by way of screws and/or magnets.

7. The sampler of claim 5 , wherein the one piece comprises a magnetic surface configured to attach to the adjacent surface by way of magnetic force.

8. The sampler of claim 1 , further comprising a dimension of 2 inch×2 inch×2 inch with the single witness window being 1 inch in diameter×approximately 3 millimeters in thickness.

9. A multi-purpose in-situ contamination sampler, comprising:

an inner frame surrounded by a plurality of removable or attachable pieces, each of which comprise of a single witness surface configured to collect both particulate and molecular contamination within an environment where sensitive hardware or material is housed, wherein

the single witness surface on each of the plurality of removable or attachable pieces comprise a silicon window configured to collect both the particulate and the molecular contamination within the environment on the payload or the spacecraft; and

a plurality of outer lids, each of which are attached to a corresponding one of the plurality of removable or attachable pieces preventing the collected particulate and the collected molecular contamination from escaping.

10. The sampler of claim 9 ,

wherein each of the plurality of outer lids provides a protective surface to prevent damage and cross-contamination to a corresponding piece of the plurality of removable or attachable pieces.

11. The sampler of claim 10 , wherein each of the plurality of outer lids comprises a silicon window that accounts for particle distribution between the silicon window on the corresponding piece and the silicon window on each of the plurality of outer lids.

12. The sampler of claim 9 , wherein one piece of the plurality of removable or attachable pieces lacks the single witness surface and is attached to an adjacent surface inside of the environment.

13. The sampler of claim 12 , wherein the one piece is mounted to the adjacent surface by way of screws and/or magnets.

14. The sampler of claim 12 , wherein the one piece comprises a magnetic surface configured to attach to the adjacent surface by way of magnetic force.

15. The sampler of claim 9 , further comprising a dimension of 2×inches×2 inches×2 inches with the single witness window being 1 inch in diameter×approximately 3 millimeters in thickness.

16. A multi-purpose in-situ contamination sampler, comprising:

an inner frame surrounded by a plurality of removable or attachable pieces, each of which comprise of a single witness surface configured to collect both particulate and molecular contamination within an environment where sensitive hardware or material is housed, wherein

the single witness surface on each of the plurality of removable or attachable pieces comprise a silicon window configured to collect both the particulate and the molecular contamination within an environment; and

a plurality of attachable outer lids, each of which are attached to a corresponding one of the plurality of removable or attachable pieces preventing the collected particulate and the collected molecular contamination from escaping the silicon window.

17. The sampler of claim 16 ,

wherein the corresponding attachable lid provides a protective surface to prevent cross-contamination and damage to a corresponding piece of the removable or attachable piece.

Assignments (2)
CONFIRMATORY LICENSE Recorded Sep 7, 2023
From: THE AEROSPACE CORPORATION
To: THE GOVERNMENT OF THE UNITED STATES AS REPRESENTED BY THE SECRETARY OF THE AIR FORCE
Reel/Frame 064823/0492 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 7, 2022
From: MORALES, ROCKY G.; HUI, AILEEN O.; LIU, DE-LING
To: THE AEROSPACE CORPORATION
Reel/Frame 058577/0795 →
Continuity (1)
Related Publication 20230228672A1 · Jul 20, 2023
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