IP Library › Granted Patent US 11,716,087
Granted Patent B1
US 11,716,087 · App. 17/582,466 · Granted Aug 1, 2023

Calibration loop for differential sub-sampling phase detector in sub-sampling phase locked loop

Inventors: Abhishek Bhat (Allentown, PA); Romesh Kumar Nandwana (Breinigsville, PA)
Assignee: CISCO TECHNOLOGY, INC.
H03L7/091H03L7/0992
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Quick Facts
Patent No.
US 11,716,087
App. No.
17/582,466
Granted
Aug 1, 2023
Kind
B1
Abstract

Presented herein are techniques for implementing a differential sub-sampling phase locked loop (PLL). A method includes detecting a common-mode voltage on an output of a differential sub-sampling phase detector operating in the differential sub-sampling phase locked loop, and controlling, based on the common-mode voltage, a duty cycle of a feedback signal of the differential sub-sampling phase locked loop that is fed back to the differential sub-sampling phase detector.

Claims (32)

1. A method comprising:

detecting a common-mode voltage on an output of a differential sub-sampling phase detector operating in a differential sub-sampling phase locked loop; and

controlling, based on the common-mode voltage, a duty cycle of a feedback signal of the differential sub-sampling phase locked loop that is fed back to the differential sub-sampling phase detector.

2. The method of claim 1 , further comprising detecting the common-mode voltage with a common-mode detector;

supplying an output of the common-mode detector to a first input of a comparator;

operating a replica common-mode detector; and

supplying an output of the replica common-mode detector to a second input of the comparator.

3. The method of claim 2 , further comprising supplying an output of the comparator to a digital engine.

4. The method of claim 2 , further comprising generating a K-wide digital signal based on the output of the comparator.

5. The method of claim 4 , further comprising supplying the K-wide digital signal to K switchable transistors that control the duty cycle of the feedback signal of the differential sub-sampling phase locked loop.

6. The method of claim 5 , further comprising controlling the duty cycle of the feedback signal based on a number of the K switchable transistors that are enabled given the K-wide digital signal.

7. The method of claim 3 , further comprising executing, by the digital engine, a least mean square routine that causes an average output of the comparator to be zero.

8. The method of claim 1 , further comprising controlling a voltage controlled oscillator with a differential control signal generated by a differential loop filter of the differential sub-sampling phase locked loop.

9. The method of claim 1 , further comprising frequency dividing an output of the differential sub-sampling phase locked loop to generate the feedback signal of the differential sub-sampling phase locked loop.

10. The method of claim 1 , wherein variation of jitter of the differential sub-sampling phase locked loop across process, voltage, temperature (PVT) is reduced compared to variation of jitter of an identical differential sub-sampling phase locked loop, but without duty cycle control of a feedback signal.

11. A device comprising:

a differential sub-sampling phase detector;

a differential transconductance amplifier in communication with an output of the differential sub-sampling phase detector;

a differential loop filter in communication with an output of the differential transconductance amplifier;

a voltage controlled oscillator in communication with an output of the differential loop filter; and

a duty cycle control circuit configured to supply a duty-cycle controlled form of an output of the voltage controlled oscillator to the differential sub-sampling phase detector.

12. The device of claim 11 , further comprising a sub-sampling phase detector control loop that controls operation of the duty cycle control circuit.

13. The device of claim 12 , wherein the sub-sampling phase detector control loop comprises a common-mode detector arranged to detect a common-mode voltage carried by the output of the differential sub-sampling phase detector.

14. The device of claim 13 , further comprising a replica common-mode detector and a comparator, the comparator arranged to receive, at first input thereof, an output of the common-mode detector, and further arranged to receive, at a second input thereof, an output of the replica common-mode detector.

15. The device of claim 14 , further comprising a digital engine arranged to receive an output of the comparator.

16. The device of claim 15 , wherein the digital engine is configured to generate a K-wide digital signal based on the output of the comparator, wherein the K-wide digital signal is used to control a duty cycle of the output of the voltage controlled oscillator using K programmable units.

17. A device comprising:

a differential sub-sampling phase detector; and

a sub-sampling phase detector calibration loop comprising a duty cycle control circuit configured to supply a duty-cycle controlled form of an output of a voltage controlled oscillator of a phase locked loop to the differential sub-sampling phase detector.

18. The device of claim 17 , wherein the duty cycle control circuit comprises K programmable units.

19. The device of claim 18 , wherein the K programmable units are respectively enabled based on a common-mode voltage carried by an output of the differential sub-sampling phase detector.

20. The device of claim 18 , further comprising a common-mode detector, a replica common-mode detector, and a comparator, wherein an output of the common-mode detector is supplied to a first input of the comparator, and the output of the replica common-mode detector is supplied to a second input of the comparator.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 24, 2022
From: BHAT, ABHISHEK; NANDWANA, ROMESH KUMAR
To: CISCO TECHNOLOGY, INC.
Reel/Frame 058744/0473 →
Cited By (1)
US 12,633,933