Testing device and probe elements thereof
A testing device and probe elements thereof are provided. The testing device includes a circuit substrate, a plurality of probe elements, a first housing and a second housing. The plurality of probe elements are independent of each other and arranged at fixed intervals. Each probe element comprises a body, a first contact section and a second contact section. The body is provided with a plurality of strip-shaped perforations, and the body includes a first lateral side and a second lateral side opposite to each other. The first contact section is connected to the first lateral side, and the second contact section is connected to the second lateral side. The extension direction of the first contact section relative to the body and the extension direction of the second contact section relative to the body are distinct from each other.
1. A probe element, the probe element comprising:
a body comprising a first lateral side and a second lateral side opposite to each other, the body being provided with a plurality of strip-shaped perforations;
a first contact section connected to the first lateral side; and
a second contact section connected to the second lateral side, the extension direction of the second contact section relative to the body and the extension direction of the first contact section relative to the body being distinct from each other,
wherein two step structures are formed respectively on the first lateral side and the second lateral side of the body.
2. The probe element according to claim 1 , wherein at least two of the strip-shaped perforations are of same size and shape.
3. The probe element according to claim 1 , wherein at least two of the strip-shaped perforations are arranged side by side top and down.
4. The probe element according to claim 1 , wherein the elastic coefficient of the probe element is changed by adjusting the number, spacing, size and/or shape of the strip-shaped perforations.
5. The probe element according to claim 1 , wherein a thickness of the probe element is between 40 microns and 50 microns.
6. A testing device, the testing device comprising:
a circuit substrate;
a plurality of probe elements independent of each other and arranged at fixed intervals, each of the probe elements comprising a body, a first contact section and a second contact section, at least one of the body, the first contact section and the second contact section being provided with a plurality of strip-shaped perforations, a first end of the first contact section abutting an object under test, and a second end of the second contact section abutting the circuit substrate;
a first housing disposed above each of the probe elements and abutting against a first lateral side of each of the probe elements; and
a second housing disposed below each of the probe elements and abutting against a second lateral side of each of the probe elements,
wherein two step structures are formed respectively on the first lateral side and the second lateral side of the body,
wherein the first housing abuts against the step structure of the first lateral side and the second housing abuts against the step structure of the second lateral side, the first housing and the second housing fix the probe elements in the horizontal direction.
7. The testing device according to claim 6 , wherein the object under test has a plurality of contact points, each of the probe elements abutting each of the contact points of the object under test.
8. The testing device according to claim 7 , wherein at least two probe elements of the plurality of probe elements abut each of the contact points of the object under test.
9. The testing device according to claim 7 , wherein at least two of the probe elements are combined into one.
10. The testing device according to claim 6 , wherein the plurality of probe elements, the first housing and the second housing are integrated into a module or a socket.
11. The testing device according to claim 6 , wherein at least two of the strip-shaped perforations are of the same size and shape.
12. The testing device according to claim 6 , wherein at least two of the strip-shaped perforations are arranged side by side top and down.
13. The testing device according to claim 6 , wherein the elastic coefficient of each of the probe elements is changed by adjusting the number, spacing, size and/or shape of the strip-shaped perforations.
14. The testing device according to claim 6 , wherein a thickness of each of the probe elements is between 40 microns and 50 microns.