Vapor deposition method and vapor deposition device

1. A vapor deposition method using a vapor deposition device which is provided with a ring-shaped carrier that supports an outer edge of a wafer, and which uses a plurality of the carriers to transport a plurality of before-treatment wafers at least to a susceptor in a reaction chamber in which a CVD film is formed on the wafer, the method comprising:

at a frequency,

removing deposits adhering to the carrier, the reaction chamber, and the susceptor by supplying a cleaning gas into the reaction chamber; and thereafter

forming a polysilicon film on the surface of the susceptor.

2. The vapor deposition method according to claim 1 , which the vapor deposition device uses a plurality of the carriers to:

transport the plurality of before-treatment wafers, through a factory interface, a load-lock chamber and a wafer transfer chamber, to the reaction chamber in that order; and

transport a plurality of after-treatment wafers from the reaction chamber, through the wafer transfer chamber and the load-lock chamber to the factory interface in that order,

wherein the load-lock chamber communicates with the factory interface via a first door and also communicates with the wafer transfer chamber via a second door,

the wafer transfer chamber communicates, via a gate valve, with the reaction chamber,

the wafer transfer chamber is provided with a first robot that deposits the before-treatment wafer transported into the load-lock chamber into the reaction chamber in a state where the before-treatment wafer is mounted on the carrier and also withdraws the after-treatment wafer for which treatment in the reaction chamber has ended from the reaction chamber in a state where the after-treatment wafer is mounted on the carrier and transports the after-treatment wafer to the load-lock chamber,

the factory interface is provided with a second robot that extracts the before-treatment wafer from a wafer storage container and mounts the before-treatment wafer on the carrier standing by in the load-lock chamber, and also stores in the wafer storage container the after-treatment wafer mounted on the carrier that has been transported to the load-lock chamber, and

the load-lock chamber is provided with a holder that supports the carrier.

3. The vapor deposition method according to claim 2 , wherein when the polysilicon film is formed on the surface of the susceptor after removing the deposits adhering to the carrier and the susceptor, the carrier standing by in the load-lock chamber is deposited into the reaction chamber to mount on the susceptor by using the first robot in a state where the before-treatment wafer is not mounted on the carrier, the cleaning gas is supplied in a state that the reaction chamber is maintained at a cleaning temperature, the carrier that has been cleaned in the reaction chamber is transported to the load lock chamber by using the first robot, and thereafter the polysilicon film is formed on the surface of the susceptor by supplying reaction gas to the reaction chamber.

4. A vapor deposition device which is provided with a ring-shaped carrier that supports an outer edge of a wafer, and which uses a plurality of the carriers to transport a plurality of before-treatment wafers at least to a susceptor in a reaction chamber in which a CVD film is formed on the wafer, wherein

a gas supplier is configured to supply a cleaning gas into the reaction chamber to remove deposits adhering to the carrier, the reaction chamber, and the susceptor, and

a polysilicon film is formed on a surface of the susceptor and the polysilicon film is not formed on a surface of the carrier.

5. The vapor deposition device according to claim 4 , which uses a plurality of the carriers to:

transport the plurality of before-treatment wafers, through a factory interface, a load-lock chamber and a wafer transfer chamber, to the reaction chamber in that order; and

transport a plurality of after-treatment wafers from the reaction chamber, through the wafer transfer chamber and the load-lock chamber to the factory interface in that order,

wherein the load-lock chamber communicates with the factory interface via a first door and also communicates with the wafer transfer chamber via a second door,

the wafer transfer chamber communicates, via a gate valve, with the reaction chamber,

the wafer transfer chamber is provided with a first robot that deposits the before-treatment wafer transported into the load-lock chamber into the reaction chamber in a state where the before-treatment wafer is mounted on the carrier and also withdraws the after-treatment wafer for which treatment in the reaction chamber has ended from the reaction chamber in a state where the after-treatment wafer is mounted on the carrier and transports the after-treatment wafer to the load-lock chamber,

the factory interface is provided with a second robot that extracts the before-treatment wafer from a wafer storage container and mounts the before-treatment wafer on the carrier standing by in the load-lock chamber, and also stores in the wafer storage container the after-treatment wafer mounted on the carrier that has been transported to the load-lock chamber, and

the load-lock chamber is provided with a holder that supports the carrier.

6. The vapor deposition device according to claim 5 , wherein the first robot deposits the carrier standing by in the load-lock chamber into the reaction chamber to mount on the susceptor in a state where the before-treatment wafer is not mounted on the carrier, the cleaning gas is supplied in a state that the reaction chamber is maintained at a cleaning temperature, the first robot transports the carrier that has been cleaned in the reaction chamber to the load-lock chamber, and thereafter the polysilicon film is formed on the surface of the susceptor by supplying reaction gas to the reaction chamber.