Charged particle beam device and operation method therefor
When adjusting optical axes of a multi-beam charged particle beam device, because parameters of optical systems are inter-dependent, the time required to adjust the parameters increases. Thus, the present invention provides a charged particle beam device provided with an optical parameter setting unit for setting parameters of optical systems for emitting a plurality of primary charged particle beams to a sample, detectors for individually detecting a plurality of secondary charged particle beams discharged from the sample, a plurality of memories for storing signals detected by the detectors and converted into digital pixels in the form of images, evaluation value derivation units for deriving evaluation values of the primary charged particle beams from the images, and a GUI capable of displaying the images and receiving an input from a user, wherein the GUI displays the images and evaluation results based on the evaluation values and changes various optical parameters in real-time.
1. A charged particle beam device, comprising:
an optical system configured to irradiate a sample with a plurality of primary charged particle beams;
an optical parameter setting unit configured to set a parameter of the optical system;
a detector configured to individually detect a plurality of secondary charged particle beams emitted from the sample;
a plurality of storage units each configured to store a signal, that is detected by the detector and converted into a digital pixel, in a form of a detected image;
an evaluation value derivation unit configured to derive an evaluation value of the primary charged particle beam from the detected image; and
a GUI configured to display an image and receive an input from a user;
an image reduction unit configured to reduce the detected image;
a display image memory configured to store the image reduced by the image reduction unit; and
a display control unit configured to simultaneously display, on a screen of the GUI, a plurality of reduced images stored in the display image memory and evaluation results based on the evaluation values adjacently.
2. The charged particle beam device according to claim 1 , further comprising:
a scan control unit configured to generate a scan signal of the primary charged particle beam; and
an overall control unit configured to set information input from the GUI into the optical parameter setting unit and set scan information into the scan control unit.
3. The charged particle beam device according to claim 2 , wherein
the GUI includes a display selection input unit through which the image to be displayed is selected, and an image display unit on which a predetermined number of images selected by a user and corresponding evaluation results are displayed adjacently.
4. The charged particle beam device according to claim 3 , wherein
the GUI further includes a parameter selection unit through which the parameter is selected, a slider input unit through which the parameter is able to be changed in real time, and a specified value input unit through which a specified value of the evaluation value is input.
5. The charged particle beam device according to claim 4 , wherein
the GUI further includes a manual adjustment button and an automatic adjustment button through which a manual adjustment or an automatic adjustment is selected by a user.
6. The charged particle beam device according to claim 1 , wherein
the display control unit controls the GUI to display frame rate reduction information when a scan stop period occurs between scanning for each frame.
7. A charged particle beam device comprising:
an optical system configured to irradiate a sample with a plurality of primary charged particle beams;
an optical parameter setting unit configured to set a parameter of the optical system;
a detector configured to individually detect a plurality of secondary charged particle beams emitted from the sample;
a plurality of storage units each configured to store a signal, that is detected by the detector and converted into a digital pixel, in a form of a detected image;
an evaluation value derivation unit configured to derive an evaluation value of the primary charged particle beam from the detected image;
a GUI configured to receive an input from a user;
an image reduction unit configured to reduce the detected image;
a display image memory configured to store the image reduced by the image reduction unit;
a display control unit configured to display, on a screen of the GUI, the image stored in the display image memory and the evaluation result based on the evaluation value;
a scan control unit configured to generate a scan signal of the primary charged Particle beam; and
a controller configured to control write and read of an image of the storage unit, wherein
the controller includes a scan pixel counter configured to count the digital pixel and a transmission pixel counter configured to count the number of transmission pixels during image transmission,
performs a write control so as to switch the storage unit configured to store the image when scanning completion is determined based on the number of scan pixels output from the scan pixel counter and a preset image size, and
performs a read control so as to switch the storage unit configured to read the image when transmission completion is determined based on the number of transmission pixels output from the transmission pixel counter and a preset image size.
8. The charged particle beam device according to claim 7 , wherein
the scan control unit is instructed to start scanning based on the transmission completion of the controller corresponding to a plurality of the detectors.
9. The charged particle beam device according to claim 7 , wherein
the controller executes a mismatch determination for determining whether the storage unit configured to store an image and the storage unit configured to read the image do not match, and
instructs the scan control unit to start scanning, based on the mismatch determination of the controller corresponding to a plurality of the detectors.
10. An operation method for a charged particle beam device, the charged particle beam device including a GUI configured to display an image and receive an input from a user, the operation method comprising:
setting a parameter for an optical system configured to irradiate a sample with a plurality of primary charged particle beams;
individually detecting a plurality of secondary charged particle beams emitted from the sample;
converting a detected signal into a digital pixel and storing the digital pixel as an image;
deriving an evaluation value of the primary charged particle beam from the image; and
reducing a plurality of the detected images and simultaneously displaying, on a screen of the GUI, the reduced images and evaluation results based on the evaluation values adjacently.
11. The operation method for the charged particle beam device according to claim 10 , wherein
the GUI displays a predetermined number of images selected by a user and corresponding evaluation results adjacently.
12. The operation method for the charged particle beam device according to claim 11 , wherein
the GUI is capable of changing the parameter in real time by selecting the parameter.
13. The operation method for the charged particle beam device according to claim 12 , wherein
on the GUI, a user is able to select a manual adjustment or an automatic adjustment of the parameter.