IP Library Granted Patent US 12,134,805
Granted Patent B2
US 12,134,805 · App. 17/603,843 · Granted Nov 5, 2024

Aluminum alloy member for forming fluoride film thereon and aluminum alloy member having fluoride film

Inventor: Isao Murase (Oyama, JP)
Assignee: SHOWA DENKO K.K.
C22C21/06C22F1/04C23C14/06C23C16/30
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Quick Facts
Patent No.
US 12,134,805
App. No.
17/603,843
Granted
Nov 5, 2024
Kind
B2
Abstract

An aluminum alloy member forms a fluoride film thereon, which does not form a black dot-shaped bulged portion and, therefore, has excellent smoothness and excellent corrosion resistance against a corrosive gas, plasma, and others. An aluminum alloy member for forming a fluoride film thereon, consists of: Si: 0.01 mass % to 0.3 mass %; Mg: 0.5 mass % to 5.0 mass %; Fe: 0.05 mass % to 0.5 mass %; Cu: 0.5 mass % or less; Mn: 0.30 mass % or less; Cr: 0.30 mass % or less, and the balance being Al and inevitable impurities, wherein when an average major diameter of Fe-based crystallized products in the aluminum alloy member is “D” (μm), and an average crystalline particle diameter in the aluminum alloy member is “Y” (μm), a relational expression: Log 10 Y<−0.320D+4.60 . . . (1) is satisfied. A fluoride film is formed on at least a part of a surface of the aluminum alloy.

Claims (19)

1. An aluminum alloy member having a fluoride film thereon,

wherein the fluoride film is formed on at least a part of a surface of the aluminum alloy member wherein the aluminum alloy member consists of:

Si: 0.01 mass % to less than 0.3 mass %;

Mg: 0.5 mass % to 5.0 mass %;

Fe: 0.05 mass % to 0.5 mass %;

Cu: 0.5 mass % or less;

Mn: 0.30 mass % or less;

Cr: 0.30 mass % or less, and

the balance being Al and inevitable impurities,

wherein when an average major diameter of Fe-based crystallized products in the aluminum alloy member is “D” (μm), and an average crystalline particle diameter in the aluminum alloy member is “Y” (μm), a relational expression:

Log 10 Y<− 0.320 D+ 4.60  (1)

is satisfied, and

wherein the fluoride film is composed of a first film layer formed on the surface of the aluminum alloy member for forming a fluoride film thereon and a second film layer formed on a surface of the first film layer,

wherein the first film layer is a film containing a magnesium fluoride, and

wherein the second film layer is a film containing an oxide of aluminum fluoride and aluminum.

2. The aluminum alloy member having a fluoride film thereon of claim 1 ,

wherein the aluminum alloy member is suitable for use as a member for a semiconductor producing apparatus.

3. The aluminum alloy member having a fluoride film of claim 1 ,

wherein the fluoride film has a thickness of 0.1 μm to 10 μm.

Assignments (3)
CHANGE OF ADDRESS Recorded Feb 9, 2024
From: RESONAC CORPORATION
To: RESONAC CORPORATION
Reel/Frame 066547/0677 →
CHANGE OF NAME Recorded Apr 18, 2023
From: SHOWA DENKO K.K.
To: RESONAC PACKAGING CORPORATION
Reel/Frame 064535/0265 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 14, 2021
From: MURASE, ISAO
To: SHOWA DENKO K.K.
Reel/Frame 057814/0293 →