IP Library Granted Patent US 12,083,509
Granted Patent B2
US 12,083,509 · App. 17/606,912 · Granted Sep 10, 2024

Beta-type zeolite and catalyst containing same

Inventors: Yuichi Senoo (Saitama, JP); Katsuhiko Hayashi (Saitama, JP); Junki Tomita (Saitama, JP); Takahiro Kogawa (Saitama, JP); Akihiro Kanno (Saitama, JP)
Assignee: Mitsui Mining &Smelting Co., Ltd.
B01J29/7057B01J35/50B01J35/58C01B39/46C07C4/06B01J2229/18C01P2002/72C07C2529/70
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Quick Facts
Patent No.
US 12,083,509
App. No.
17/606,912
Granted
Sep 10, 2024
Kind
B2
Abstract

Provided is a beta zeolite satisfying P>76.79Q−29.514 in a range in which Q is less than 0.4011 nm, wherein, P represents an AB value that is an intensity ratio of A to B, A represents a diffraction intensity of a main peak of the beta zeolite observed by X-ray diffraction measurement, B represents a diffraction intensity of the (116) plane of α-alumina obtained by X-ray diffraction measurement under the same conditions as those for the X-ray diffraction measurement on the beta zeolite, the α-alumina being the standard substance 674a distributed by the American National Institute of Standards and Technology, and Q represents a lattice interplanar spacing of the main peak of the beta zeolite observed by X-ray diffraction measurement. It is preferable that the formula (1) above is satisfied in a range in which Q is from 0.3940 to 0.4000 nm.

Claims (16)

1. A beta zeolite satisfying formula (1) below in a range in which Q is less than 0.4011 nm,

P> 76.79 Q− 29.514  (1),

wherein, P represents an A/B value that is an intensity ratio of A to B,

A represents a diffraction intensity of a main peak of the beta zeolite observed by X-ray diffraction measurement,

B represents a diffraction intensity of the (116) plane of α-alumina obtained by X-ray diffraction measurement under the same conditions as those for the X-ray diffraction measurement on the beta zeolite, the α-alumina being the standard substance 674a distributed by the American National Institute of Standards and Technology, and

Q represents a lattice interplanar spacing of the main peak of the beta zeolite observed by X-ray diffraction measurement.

2. The beta zeolite according to claim 1 , wherein the formula (1) is satisfied in a range in which Q is from 0.3940 to 0.4000 nm.

3. The beta zeolite according to claim 1 , wherein the formula (1) is satisfied in a range in which Q is 0.3963 nm or less, and a full width at half maximum of the main peak of the beta zeolite observed by X-ray diffraction measurement is 0.135° or less.

4. The beta zeolite according to claim 1 , which is synthesized without using an organic structure directing agent.

5. The beta zeolite according to claim 1 , which is ion-exchanged with a transition metal ion.

6. The beta zeolite according to claim 1 , comprising an oxide of phosphorus, zirconium, zinc, or silicon on a surface of the beta zeolite.

7. The beta zeolite according to claim 1 , comprising at least one element selected from the group consisting of titanium, tin, zinc, niobium, tantalum, and zirconium.

8. The beta zeolite according to claim 7 , comprising at least one element selected from titanium, tin, zinc, niobium, tantalum, and zirconium in a framework of the beta zeolite.

9. A catalyst comprising the beta zeolite according to claim 1 .

10. The catalyst according to claim 9 , being a catalyst for cracking a long-chain hydrocarbon.

11. The catalyst according to claim 9 , having a film form or a pellet form.

Assignments (2)
CHANGE OF NAME Recorded Mar 31, 2026
From: MITSUI MINING AND SMELTING COMPANY, LIMITED
To: MITSUI KINZOKU COMPANY, LIMITED
Reel/Frame 075357/0342 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 28, 2021
From: SENOO, YUICHI; HAYASHI, KATSUHIKO; TOMITA, JUNKI; KOGAWA, TAKAHIRO; KANNO, AKIHIRO
To: MITSUI MINING & SMELTING CO., LTD.
Reel/Frame 057949/0957 →
Priority Claims (1)
JP 2019-124816 · Jul 3, 2019 · national
Continuity (1)
Related Publication 20220203344A1 · Jun 30, 2022