Optoelectronic sensor component for measuring light with built-in redundancy
An optoelectronic sensor component for measuring light may include a first signal channel, a second signal channel, a first light-sensitive detection assembly, a second light-sensitive detection assembly, a further light-sensitive detection assembly, and an assigned further signal channel. The first signal channel may provide a first electrical signal, which represents the intensity of light incident on the sensor component. The second signal channel may provide a second electrical signal representing the intensity of the light incident on the sensor component. The first and second light-sensitive detection assemblies may generate the first and second electrical signals, respectively, and be assigned to the first and second signal channels, respectively. Both detection assemblies may have an identical spectral sensitivity and are thus redundant with respect to one another. The spectral sensitivity of both detection assemblies may have a photopic profile. The further light-sensitive detection assembly may be configured for detecting only infrared light.
1. An optoelectronic sensor component configured to measure light, comprising:
a first signal channel configured to provide a first electrical signal, which represents an intensity of light incident on the optoelectronic sensor component;
a second signal channel separate from the first signal channel in terms of signaling, wherein the second signal channel is configured to provide a second electrical signal independent of the first electrical signal, and wherein the second signal channel represents an intensity of the light incident on the optoelectronic sensor component;
a first light-sensitive detection assembly configured to generate the first electrical signal, and wherein the first light-sensitive detection assembly is assigned to the first signal channel;
a second light-sensitive detection assembly configured to generate the second electrical signal, and wherein the second light-sensitive detection assembly is assigned to the second signal channel;
wherein the first light-sensitive detection assembly and the second light-sensitive detection assembly have an identical spectral sensitivity and are thus redundant with respect to one another, and wherein the identical spectral sensitivity of the first light-sensitive detection assembly and the second light-sensitive detection assembly has a photopic profile;
an assigned third signal channel; and
a third light-sensitive detection assembly configured to detect only infrared light.
2. The optoelectronic sensor component as claimed in claim 1 , further comprising:
at least one signal processing circuit configured to condition the first electrical signal and the second electrical signal.
3. The optoelectronic sensor component as claimed in claim 2 ,
wherein the first light-sensitive detection assembly, the second light-sensitive detection assembly, and the at least one signal processing circuit are embodied as a single integrated circuit with a common voltage supply.
4. The optoelectronic sensor component as claimed in claim 2 , wherein the at least one signal processing circuit comprises:
a first signal processing circuit configured to condition the first electrical signal; and
a separate second signal processing circuit configured to condition the second electrical signal.
5. The optoelectronic sensor component as claimed in claim 1 , further comprising:
an assigned further signal channel; and
a further light-sensitive detection assembly, wherein the further light-sensitive detection assembly has an identical spectral sensitivity to the first light-sensitive detection assembly and the second light-sensitive detection assembly, and is shielded from ambient light, such that the further light-sensitive detection assembly can supply a reference signal for darkness.
6. The optoelectronic sensor component as claimed in claim 1 , wherein each light-sensitive detection assembly of the first light-sensitive detection assembly and the second light-sensitive detection assembly comprises at least one photodiode.
7. The optoelectronic sensor component as claimed in claim 6 , further comprising:
a light-sensitive total measurement area subdivided into a plurality of measurement elements,
wherein the plurality of measurement elements is formed by the at least one photodiode of each light-sensitive detection assembly of the first light-sensitive detection assembly and the second light-sensitive detection assembly.
8. The optoelectronic sensor component as claimed in claim 1 , wherein the first light-sensitive detection assembly defines a first light-sensitive measurement area and the second light-sensitive detection assembly defines a second light-sensitive measurement area, and wherein the first light-sensitive measurement area is an integral multiple of the second light-sensitive measurement area.
9. The optoelectronic sensor component as claimed in claim 1 , wherein the optoelectronic sensor component is an ambient light sensor.
10. The optoelectronic sensor component as claimed in claim 1 , wherein the first light-sensitive detection assembly and the second light-sensitive detection assembly are configured to detect only visible light.
11. A system for measuring light with function checking, wherein the system comprises:
the optoelectronic sensor component as claimed in claim 1 ; and
a function checking device configured to check a function of the optoelectronic sensor component,
wherein the function checking device is configured to compare the first electrical signal and the second electrical signal generated from the first light-sensitive detection assembly and the second light-sensitive detection assembly, and to deduce a malfunction of the optoelectronic sensor component based on a result of comparing of the first electrical signal and the second electrical signal.
12. The system as claimed in claim 11 , wherein the comparing effected by the function checking device consists in forming a difference between the first electrical signal and the second electrical signal and deducing a malfunction when an absolute value of the difference exceeds a specific threshold value.
13. The system as claimed in claim 11 , wherein each light-sensitive detection assembly of the first light-sensitive detection assembly and the second light-sensitive detection assembly comprises at least one photodiode; wherein a plurality of measurement elements is formed by the at least one photodiode of the first light-sensitive detection assembly and the second light-sensitive detection assembly; and where a light-sensitive total measurement area is subdivided based on the plurality of measurement elements; wherein the function checking device is further configured to compare a reference signal with the first electrical signal and the second electrical signal, and configured to deduce a malfunction of the optoelectronic sensor component when an absolute value of at least one of the first and second electrical signals electrical signal and the second electrical signal is less than an absolute value of the reference signal.
14. A system for electronic control based on measuring light comprising;
the optoelectronic sensor component as claimed in claim 1 ; and
an electronic control unit,
wherein the optoelectronic sensor component and the electronic control unit are connected to one another via a digital communication interface, such that the optoelectronic sensor component is configured to transmit measurement results in a form of digital data to the electronic control unit, and
wherein the system provides a method for checking an error-free data transmission between the optoelectronic sensor component and the electronic control unit.
15. The system as claimed in claim 14 , further comprising:
a function checking device configured to check a function of the optoelectronic sensor component,
wherein the function checking device is configured to compare the first electrical signal and the second electrical signal generated from the first light-sensitive detection assembly and the second light-sensitive detection assembly, and to deduce a malfunction of the optoelectronic sensor component based on a result of comparing of the first electrical signal and the second electrical signal.
16. The system as claimed in claim 15 , wherein the comparing effected by the function checking device consists in forming a difference between the first electrical signal and the second electrical signal generated from the first light-sensitive detection assembly and the second light-sensitive detection assembly, and deducing a malfunction when an absolute value of the difference exceeds a specific threshold value.
17. The system as claimed in claim 15 , wherein each light-sensitive detection assembly of the first light-sensitive detection assembly and the second light-sensitive detection assembly comprises at least one photodiode;
wherein a plurality of measurement elements is formed by the at least one photodiode of the first light-sensitive detection assembly and the second light-sensitive detection assembly; and
where a light-sensitive total measurement area is subdivided based on the plurality of measurement elements;
wherein the function checking device is further configured to compare a reference signal with the first electrical signal and the second electrical signal, and configured to deduce a malfunction of the optoelectronic sensor component when an absolute value of at least one of the first electrical signal and the second electrical signal is less than an absolute value of the reference signal.