IP Library Granted Patent US 11,535,047
Granted Patent B2
US 11,535,047 · App. 17/614,977 · Granted Dec 27, 2022

Method for producing transparent conducting film

Inventor: Shigeru Yamaki (Tokyo, JP)
Assignee: SHOWA DENKO K.K.
B41M3/006B82Y40/00H01B5/14H01B13/0036
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Quick Facts
Patent No.
US 11,535,047
App. No.
17/614,977
Granted
Dec 27, 2022
Kind
B2
Abstract

Provided is a transparent conducting film having a favorable optical property, favorable electrical property, and almost no in-plane resistance anisotropy. A method for producing a transparent conducting film provided with a conducting layer containing a metal nanowire and a binder resin, comprises steps of: preparing a coating liquid containing the metal nanowire and the binder resin, and coating the coating liquid on one main face of a transparent substrate, wherein, in the coating step, a bar-coat printing method is performed using a bar provided with a groove having a pitch (P) and a depth (H) which satisfy a ratio P/H of 5 to 30.

Claims (17)

1. A method for producing a transparent conducting film provided with a conducting layer containing metal nanowires and a binder resin, comprising steps of:

preparing a coating liquid containing the metal nanowire and the binder resin, and

coating the coating liquid on one main face of a transparent substrate,

wherein, in the coating step, a bar-coat printing method is performed using a bar provided with a groove having a pitch (P) and a depth (H) which satisfy a ratio P/H of 5 to 30, and

wherein a ratio (R TD /R MD ) of a resistance value of the conducting layer in a direction perpendicular to an in-plane coating direction of the coating liquid (R TD ) to a resistance value of the conducting layer in the in-plane coating direction of the coating liquid (R MD ) is 0.93 to 1.59.

2. The method for producing a transparent conducting film according to claim 1 , wherein a material forming a surface of the bar has a friction coefficient of 0.05 to 0.45.

3. The method for producing a transparent conducting film according to claim 2 , wherein, when the coating liquid is coated on one main face of the transparent substrate, a relative moving velocity (coating velocity) V (mm/sec) of the transparent substrate relative to the bar satisfies 2000≥V≥350.

4. The method for producing a transparent conducting film according claim 3 , wherein when the groove formed on the bar has a pitch (P) and a depth (H), a ratio P/H is 9 to 30.

5. The method for producing a transparent conducting film according to claim 2 , wherein when the groove formed on the bar has a pitch (P) and a depth (H), a ratio P/H is 9 to 30.

6. The method for producing a transparent conducting film according to claim 1 , wherein a material forming a surface of the bar has a friction coefficient of 0.05 to 0.40.

7. The method for producing a transparent conducting film according to claim 6 , wherein, when the coating liquid is coated on one main face of the transparent substrate, a relative moving velocity (coating velocity) V (mm/sec) of the transparent substrate relative to the bar satisfies 2000≥V≥50.

8. The method for producing a transparent conducting film according to claim 7 , wherein when the groove formed on the bar has a pitch (P) and a depth (H), a ratio P/H is 9 to 30.

9. The method for producing a transparent conducting film according to claim 6 , wherein when the groove formed on the bar has a pitch (P) and a depth (H), a ratio P/H is 9 to 30.

10. The method for producing a transparent conducting film according to claim 1 , wherein when the groove formed on the bar has a pitch (P) and a depth (H), a ratio P/H is 9 to 30.

11. The method for producing a transparent conducting film according to claim 1 , wherein the metal nanowires have an average length of 1 to 100 μm and an average diameter of 1 to 500 nm.

12. The method for producing a transparent conducting film according to claim 1 , wherein the coating liquid has a viscosity in a range of 1 to 50 mPa·s.

13. The method for producing a transparent conducting film according to claim 1 , wherein the metal nanowire has an average diameter size of 5 to 100 nm, an average major axis length of 2 to 70 μm, and an average aspect ratio 100 or more.

Assignments (2)
CHANGE OF NAME Recorded Jun 23, 2023
From: SHOWA DENKO K.K.
To: RESONAC CORPORATION
Reel/Frame 064082/0513 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 2, 2021
From: YAMAKI, SHIGERU
To: SHOWA DENKO K.K.
Reel/Frame 058273/0680 →