IP Library Granted Patent US 12,524,592
Granted Patent B2
US 12,524,592 · App. 17/629,650 · Granted Jan 13, 2026

Verification processing device, verification method, and program

Inventors: Kenji Takao (Tokyo, JP); Keita Hirayama (Tokyo, JP); Kenta Masumori (Yokohama, JP)
Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.
G06F30/3323G06F11/3608G06F30/20G06F30/3308G06F30/367G06F30/398G06F2119/02
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Quick Facts
Patent No.
US 12,524,592
App. No.
17/629,650
Granted
Jan 13, 2026
Kind
B2
Abstract

A verification processing device includes: an inspection processing unit which extracts elements of which states change in a process leading to an insecure event by means of a model inspection for a model to be inspected; a refinement processing unit which determines, for each of the extracted elements, whether the element contributes to the occurrence of the insecure event and refines a cause element which is an element of a cause of the insecure event; and a receiving unit which receives, from an operator, a selection of at least one cause element from among a plurality of the cause elements, wherein the inspection processing unit performs the model inspection once again on an improved model to be inspected which is a new model to be inspected in which a prescribed measure is executed for the selected cause element.

Claims (40)

1 . A verification processing device, comprising:

an inspection processing unit which extracts elements of which states change in a process leading to an insecure event by means of a model inspection for a model to be inspected;

a refinement processing unit which determines, for each of the extracted elements, whether the element contributes to the occurrence of the insecure event and refines a cause element which is an element of a cause of the insecure event; and

a receiving unit which receives, from an operator, a selection of at least one cause element from among a plurality of the cause elements

wherein the inspection processing unit performs the model inspection once again on an improved model to be inspected which is a new model to be inspected in which a prescribed measure is executed for the selected cause element.

2 . The verification processing device according to claim 1 , wherein the receiving unit further receives an input of details of the measure to be taken for the selected cause element.

3 . The verification processing device according to claim 2 , further comprising:

a display processing unit which displays a history of the selected cause element and results of the model inspection performed once again.

4 . The verification processing device according to claim 3 , wherein the receiving unit is able to return to an arbitrary stage in the history and receive a selection of the cause element once again.

5 . The verification processing device according to claim 4 , further comprising:

a generating unit which generates a measure list showing a list of cause elements selected until there is no insecure event in the model inspection performed once again of a first model to be inspected,

wherein the inspection processing unit performs a model inspection on a second model to be inspected for the improved model to be inspected to which a prescribed measure has been executed for all the cause elements shown in the measure list.

6 . The verification processing device according to claim 3 , further comprising:

a generating unit which generates a measure list showing a list of cause elements selected until there is no insecure event in the model inspection performed once again of a first model to be inspected,

wherein the inspection processing unit performs a model inspection on a second model to be inspected for the improved model to be inspected to which a prescribed measure has been executed for all the cause elements shown in the measure list.

7 . The verification processing device according to claim 2 , further comprising:

a generating unit which generates a measure list showing a list of cause elements selected until there is no insecure event in the model inspection performed once again of a first model to be inspected,

wherein the inspection processing unit performs a model inspection on a second model to be inspected for the improved model to be inspected to which a prescribed measure has been executed for all the cause elements shown in the measure list.

8 . The verification processing device according to claim 1 , further comprising:

a display processing unit which displays a history of the selected cause element and results of the model inspection performed once again.

9 . The verification processing device according to claim 8 , wherein the receiving unit is able to return to an arbitrary stage in the history and receive a selection of the cause element once again.

10 . The verification processing device according to claim 9 , further comprising:

a generating unit which generates a measure list showing a list of cause elements selected until there is no insecure event in the model inspection performed once again of a first model to be inspected,

wherein the inspection processing unit performs a model inspection on a second model to be inspected for the improved model to be inspected to which a prescribed measure has been executed for all the cause elements shown in the measure list.

11 . The verification processing device according to claim 8 , further comprising:

a generating unit which generates a measure list showing a list of cause elements selected until there is no insecure event in the model inspection performed once again of a first model to be inspected,

wherein the inspection processing unit performs a model inspection on a second model to be inspected for the improved model to be inspected to which a prescribed measure has been executed for all the cause elements shown in the measure list.

12 . The verification processing device according to claim 1 , further comprising:

a generating unit which generates a measure list showing a list of cause elements selected until there is no insecure event in the model inspection performed once again of a first model to be inspected,

wherein the inspection processing unit performs a model inspection on a second model to be inspected for the improved model to be inspected to which a prescribed measure has been executed for all the cause elements shown in the measure list.

13 . A verification method, comprising:

a step of extracting elements of which states change in a process leading to an insecure event by means of a model inspection for a model to be inspected;

a step of determining, for each of the extracted elements, whether the element contributes to the occurrence of the insecure event and refining a cause element which is an element of a cause of the insecure event;

a step of receiving, from an operator, a selection of at least one cause element from among a plurality of the cause elements; and

a step of performing the model inspection once again on an improved model to be inspected which is a new model to be inspected in which a prescribed measure is executed for the selected cause element.

14 . A non-transitory computer-readable recording medium storing a program causing a computer of a verification processing device to execute:

a step of extracting elements of which states change in a process leading to an insecure event by means of a model inspection for a model to be inspected;

a step of determining, for each of the extracted elements, whether the element contributes to the occurrence of the insecure event and refining a cause element which is an element of a cause of the insecure event;

a step of receiving, from an operator, a selection of at least one cause element from among a plurality of the cause elements; and

a step of performing the model inspection once again on an improved model to be inspected which is a new model to be inspected in which a prescribed measure is executed for the selected cause element.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 14, 2023
From: MHI ENGINEERING, LTD.
To: MITSUBISHI HEAVY INDUSTRIES, LTD.
Reel/Frame 065869/0305 →
CHANGE OF NAME Recorded Nov 30, 2023
From: MITSUBISHI HEAVY INDUSTRIES ENGINEERING, LTD.
To: MHI ENGINEERING, LTD.
Reel/Frame 065727/0234 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 24, 2022
From: TAKAO, KENJI; HIRAYAMA, KEITA; MASUMORI, KENTA
To: MITSUBISHI HEAVY INDUSTRIES ENGINEERING, LTD.
Reel/Frame 058746/0387 →
Priority Claims (1)
JP 2019-140118 · Jul 30, 2019 · national
Continuity (1)
Related Publication 20220253582A1 · Aug 11, 2022
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