IP Library › Granted Patent US 12,523,668
Granted Patent B2
US 12,523,668 · App. 17/637,442 · Granted Jan 13, 2026

Systems and methods for laboratory deck setup verification

Inventors: Matthew S. Davis (Indianapolis, IN); Yilin Liu-Leitke (Indianapolis, IN); Rachel Ellen Moschell (Carmel, IN); Peter Robert Nei (Brownsburg, IN); John S. Snider (Brownsburg, IN); Robert J. Zigon (Carmel, IN)
Assignee: Beckman Coulter, Inc.
G01N35/00722B01L1/00G01N2035/00891
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,523,668
App. No.
17/637,442
Granted
Jan 13, 2026
Kind
B2
Abstract

A laboratory workstation for preparing a sample according to a programmed protocol. The laboratory workstation may include a display device configured to display an instruction for loading a first item of labware onto a deck of the laboratory workstation at a position on the deck specified by the programmed protocol; an imaging device configured to monitor the deck of the laboratory workstation by creating one or more images of the deck; and a processor configured to recognize, in the one or more images created by the imaging device, an item of labware loaded onto the deck by an operator. In some embodiments, the processor may be configured to indicate on the display device whether the recognized item of labware loaded by the operator is arranged on the deck in accordance with the programmed protocol.

Claims (35)

1 . A laboratory workstation for preparing a sample according to a programmed protocol, the laboratory workstation comprising:

a display device configured to display an instruction for loading a first item of labware onto a deck of the laboratory workstation at a position on the deck specified by the programmed protocol;

an imaging device configured to monitor the deck of the laboratory workstation by creating one or more images of the deck; and

a processor configured to recognize, in the one or more images created by the imaging device, an item of labware loaded onto the deck by an operator;

wherein the processor is further configured to indicate on the display device whether the recognized item of labware loaded by the operator is arranged on the deck in accordance with the programmed protocol.

2 . The laboratory workstation of claim 1 , wherein the processor is configured to indicate on the display device whether the recognized item of labware is the first item of labware loaded onto the deck at the position specified by the programmed protocol.

3 . The laboratory workstation of claim 1 , wherein recognizing an item of labware loaded onto the deck by an operator comprises identifying the item using at least one of an artificial neural network, image comparison, and template matching.

4 . The laboratory workstation of claim 1 , wherein the programmed protocol calls for a plurality of items of labware to be arranged on the deck, and wherein the processor is configured to recognize each of the plurality of items of labware as it is placed on the deck, regardless of order of placement.

5 . The laboratory workstation of claim 1 , wherein the recognized item of labware comprises a plurality of components, and wherein recognizing the item of labware comprises counting the plurality of components.

6 . The laboratory workstation of claim 5 , wherein the plurality of components are arranged in a stacked configuration.

7 . The laboratory workstation of claim 1 , wherein the imaging device is configured to create one or more images or videos of the deck each time the operator places an item of labware on the deck.

8 . The laboratory workstation of claim 1 , wherein the imaging device is configured to collect one or more images or videos of the deck continuously, at intervals, intermittently, or on demand.

9 . The laboratory workstation of claim 1 , further comprising a reflective surface configured to reflect a view toward the imaging device.

10 . The laboratory workstation of claim 9 , wherein the reflective surface is arranged to reflect a view of a thermal cycler toward the imaging device.

11 . The laboratory workstation of claim 1 , wherein the display device is further configured to display an instruction for unloading the first item of labware from the deck in accordance with the programmed protocol, and wherein the processor is further configured to:

recognize, in the one or more images created by the imaging device, removal of the first item of labware from the deck by an operator; and

indicate on the display device whether the first item was removed from the deck in accordance with the programmed protocol.

12 . The laboratory workstation of claim 1 , wherein the processor is configured to perform the recognizing and indicating steps within between approximately 0.1 to approximately 0.8 seconds.

13 . The laboratory workstation of claim 1 , wherein the processor is configured to recognize, in the one or more images of the deck, when an operator has loaded an item of labware onto the deck.

14 . The laboratory workstation of claim 1 , wherein the processor is further configured to analyze the one or more images of the deck using template matching, wherein template matching comprises counting a number of templates identifiable in the one or more images of the deck, wherein the template comprises at least one of a pipette tip and an opening for receiving a pipette tip.

15 . A method of verifying arrangement of labware on a deck of a laboratory workstation in accordance with a programmed protocol, the method comprising:

displaying on a display device an instruction for loading labware onto the deck;

monitoring the deck by creating one or more images of the deck using an imaging device;

from the one or more images of the deck, identifying an item of labware loaded onto the deck by an operator;

from the one or more images of the deck, determining whether the item of labware is arranged on the deck in accordance with the programmed protocol; and

providing feedback to the operator regarding arrangement of the item of labware.

16 . The method of claim 15 , wherein the deck is monitored and feedback is provided continuously, substantially in real time, at intervals, intermittently, or on demand.

17 . The method of claim 16 , further comprising:

the operator following instructions from the provided feedback.

18 . The method of claim 16 , further comprising:

the operator ignoring the provided feedback.

19 . The method of claim 16 , further comprising:

the operator overruling the provided feedback.

20 . The method of claim 16 , further comprising:

the operator correcting deck set up errors based on the provided feedback.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 22, 2022
From: DAVIS, MATTHEW S.; LIU-LEITKE, YILIN; MOSCHELL, RACHEL ELLEN; NEI, PETER; SNIDER, JOHN S.; ZIGON, ROBERT J.
To: BECKMAN COULTER, INC.
Reel/Frame 059070/0537 →
Continuity (2)
Provisional Application 62890790 · Aug 23, 2019
Related Publication 20220276274A1 · Sep 1, 2022
References Cited (21)
US 9446418B2 · Johns · 2016 [cited by examiner]
US 20030129755A1 · Sadler · 2003 [cited by examiner]
US 20130079599A1 · Holmes et al. · 2013 [cited by applicant]
US 20130132006A1 · Gwynn · 2013 [cited by examiner]
US 20130333490A1 · Tanoue · 2013 [cited by examiner]
US 20160205360A1 · Allen · 2016 [cited by applicant]
US 20170230561A1 · Mueller et al. · 2017 [cited by applicant]
US 20180045747A1 · Chang et al. · 2018 [cited by applicant]
US 20220050028A1 · Mohiuddin · 2022 [cited by examiner]
CN 103592447B · 2016 [cited by applicant]
CN 107431788A · 2017 [cited by applicant]
EP 2693218B1 · 2016 [cited by applicant]
JP 2018507407A · 2018 [cited by applicant]
WO 2016090113A2 · 2016 [cited by applicant]
WO 2016133919A1 · 2016 [cited by applicant]
WO 2019152604A1 · 2019 [cited by applicant]
Anonymous: “Image analysis—Wikipedia,” retrieved from the Internet: http://www.en.wikipedia.org/wiki/Image_analysis (Jun. 24, 2019). [cited by applicant]
Anonymous: “Template matching—Wikipedia,” retrieved from the Internet: https://www.en.wikipedia.org/w/index.php?title=Template-matching&oldid=866520552 (Oct. 30, 2018). [cited by applicant]
International Search Report and Written Opinion, PCT/US2020/047409, Beckman Coulter, Inc., 11 pages (Nov. 4, 2020). [cited by applicant]
Labplan: “DeckOptix Final Check,” retrieved from the Internet: https://www.youtube.com/watch?v=jZ7wiF2LgZc (May 2, 2019). [cited by applicant]
European Patent Office; Communication—Extended European Search Report for Application No. 24178106.1 mailed Jul. 3, 2024; 14 pages. [cited by applicant]