Ion source with gas delivery for high-fidelity analysis

1. A system for analyzing gas, comprising:

a gas analyzer in a gas analyzer chamber configured to measure a quantity of ions generated from a gas;

a gas analyzer vacuum pump configured to evacuate the gas analyzer chamber;

an ionization source comprising:

an ionization chamber encompassing an ionization region in which particles of the gas are charged to form the ions, including 1) an aperture permitting passage of the ions between the ionization chamber and the gas analyzer chamber, 2) an opening substantially larger than the aperture and positioned away from the aperture, and 3) a perforation through the chamber, at a position between the aperture and the opening, for electrons to enter the ionization region; and

an electron source configured to direct electrons into the ionization chamber via the perforation and through the gas in the ionization chamber into the ionization region to ionize the gas;

a channel configured to direct the gas from a gas source into the ionization chamber at a location between the aperture and the ionization region and in a direction extending away from the aperture, the channel extending to a surface of the ionization chamber; and

an ionization source vacuum pump in gaseous communication with the ionization chamber via the opening, the ionization source vacuum pump configured to draw gas from the ionization chamber.

2. The system of claim 1 , wherein the gas analyzer is removeable axially from the gas analyzer chamber.

3. The system of claim 2 , wherein the channel extends axially beside the gas analyzer and is removed axially with the gas analyzer and the ionization chamber.

4. The system of claim 1 , wherein the channel extends to the surface of the ionization chamber at a location closer to the aperture than the opening.

5. The system of claim 1 , wherein the aperture and the opening are located at opposite ends of the ionization chamber.

6. The system of claim 1 , wherein the channel is adapted to direct at least a portion of the gas into the ionization region prior to collision with an interior surface of the ionization chamber.

7. The system of claim 1 , wherein the channel includes a terminal segment that is oriented towards the ionization region.

8. The system of claim 7 , wherein the terminal segment extends into the ionization chamber to a location adjacent to an electron stream from the electron source.

9. The system of claim 1 , wherein the ionization chamber is configured to maintain a gas pressure higher than a gas pressure of the gas analyzer chamber.

10. The system of claim 9 , wherein the ionization chamber is configured to contain the gas at a pressure below 5×10-2 Torr, and wherein the gas analyzer chamber is configured to contain the gas at a pressure below 1×10-4 Torr.

11. The system of claim 1 , wherein the channel extends to the surface of the ionization chamber at a location between the perforation for the electrons and the aperture.

12. The system of claim 1 , wherein the gas analyzer is a quadrupole mass analyzer (QMA).

13. A system for analyzing gas, comprising:

an ionization source comprising:

an ionization chamber encompassing an ionization region in which particles of the gas are charged to form ions, including 1) an aperture permitting passage of the ions from the ionization chamber to an evacuated gas analyzer chamber and 2) an opening substantially larger than the aperture and positioned away from the aperture, and 3) a perforation through the chamber, at a position between the aperture and the opening, for electrons to enter the ionization region;

a channel configured to direct the gas from a gas source to the ionization chamber at a location between the aperture and the ionization region and in a direction extending away from the aperture, the channel extending through a surface of the ionization chamber, and

an electron source configured to direct electrons into the ionization chamber via the perforation and through the gas in the ionization chamber to ionize the gas, the ionization chamber encompassing an ionization region in which particles of the gas form the ions; and

an ionization source vacuum pump in gaseous communication with the ionization chamber via the opening, the ionization source vacuum pump configured to draw gas from the ionization chamber.

14. The system of claim 13 , wherein the channel and ionization chamber are removable axially from the gas analyzer chamber.

15. The system of claim 14 , wherein the channel extends to the surface of the ionization chamber at a location closer to the aperture than the opening.

16. The system of claim 13 , wherein the aperture and the opening are located at opposite ends of the ionization chamber.

17. The system of claim 13 , wherein the channel is adapted to direct at least a portion of the gas into the ionization region prior to collision with an interior surface of the ionization chamber.

18. The system of claim 13 , wherein the channel includes a terminal segment that is oriented towards the ionization region.

19. The system of claim 18 , wherein the terminal segment extends into the ionization chamber to a location adjacent to an electron stream from the electron source.

20. A method of analyzing gas, comprising:

evacuating a gas analyzer chamber via a gas analyzer vacuum pump;

directing, via a channel, gas from a gas source to an ionization chamber within the gas analyzer chamber, the channel extending to a surface of the ionization chamber;

directing electrons through the gas in the ionization chamber to ionize the gas, the ionization chamber encompassing an ionization region in which particles of the gas are charged to form ions;

causing passage of the ions from the ionization chamber to a gas analyzer in the gas analyzer chamber via an aperture at the ionization chamber; and

drawing gas from the ionization chamber through an opening at the ionization chamber via an ionization source vacuum pump, the opening being substantially larger than the aperture and positioned away from the aperture,

wherein the channel extends to the surface of the ionization chamber at a location between the aperture and the ionization region, and

wherein directing the gas includes directing the gas a direction extending away from the aperture.

21. The method of claim 20 , further comprising measuring a quantity of ions generated from a gas via a gas analyzer.

22. A system for analyzing gas, comprising:

a gas analyzer in a gas analyzer chamber configured to measure a quantity of ions generated from a gas;

a gas analyzer vacuum pump configured to evacuate the gas analyzer chamber;

an ionization source comprising:

an ionization chamber encompassing an ionization region in which particles of the gas are charged to form the ions, including 1) an aperture permitting passage of the ions between the ionization chamber and the gas analyzer chamber, 2) an opening substantially larger than the aperture and positioned away from the aperture, and 3) a perforation through the ionization chamber, at a position between the aperture and the opening, for electrons to enter the ionization region; and

an electron source configured to direct electrons into the ionization chamber via the perforation and through the gas in the ionization chamber into the ionization region to ionize the gas;

a channel configured to direct the gas from a gas source into the ionization chamber, the channel having a terminal segment located in the ionization chamber at a location closer to the aperture than the opening; and

an ionization source vacuum pump in gaseous communication with the ionization chamber via the opening, the ionization source vacuum pump configured to draw gas from the ionization chamber.

23. The system of claim 22 , wherein the terminal segment is located between the perforation for the electrons and the aperture.