IP Library Granted Patent US 12,555,975
Granted Patent B2
US 12,555,975 · App. 17/650,748 · Granted Feb 17, 2026

Illumination diagnosis for LIDAR driver

Inventor: Jean-Paul Anna Joseph Eggermont (Pellaines, BE)
Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
H01S5/0021G01S7/484G01S7/497H01S5/0428H01S5/4025
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Quick Facts
Patent No.
US 12,555,975
App. No.
17/650,748
Granted
Feb 17, 2026
Kind
B2
Abstract

Implementations described herein are related to a diode driver that recirculates residual current from an operating current pulse in an inductor. Such recirculation produces a diagnostic current pulse to a diode array for measuring a voltage drop across a portion of the array. For example, after a controller charges an inductor of a diode driver to deliver operating current pulses to a portion of a diode array for illumination, the controller causes a residual current to remain and recirculate in the inductor. In some implementations, in response to the recirculating current reaching a monitoring threshold, the controller delivers a monitoring pulse to the portion of the diode array to measure a voltage drop across the portion of the diode array. In some implementations, the controller may infer defectivity in the portion of the array from such voltage drop measurements over time.

Claims (51)

1 . A diode driver for driving an array of diodes, comprising:

a current pulse generator configured to deliver an operating current pulse to a portion of the array of diodes, the current pulse generator producing a diagnostic current pulse in an inductor based on a residual current from the operating current pulse recirculating in the inductor, the diagnostic current pulse being less than the operating current pulse;

a voltage drop measurement device configured to measure a voltage drop resulting from a delivery of the diagnostic current pulse to the portion of the array of diodes; and

a device state analyzer configured to determine whether the portion of the array of diodes is defective based on the voltage drop of the portion of the array of diodes.

2 . The diode driver as in claim 1 , wherein the diagnostic current pulse is a first diagnostic current pulse and the voltage drop is a first voltage drop,

wherein the current pulse generator, after producing the first diagnostic current pulse, produces a second diagnostic current pulse for measuring a second voltage drop, and

wherein the device state analyzer determines whether the portion of the array of diodes is defective based on the first voltage drop and the second voltage drop.

3 . The diode driver as in claim 2 , wherein the device state analyzer includes:

a first capacitor storing charge from diagnostic current pulses, and

a conversion device to convert first charge stored on the first capacitor from the first diagnostic current pulse and second charge stored on the first capacitor from the second diagnostic current pulse to a voltage signal that indicates a variation of voltage drop of the portion of the array of diodes over time.

4 . The diode driver as in claim 3 , wherein the conversion device includes:

a second capacitor, a hold switch, and a comparator connected in parallel, the hold switch holding charge on the second capacitor for measurement, and

a transfer device transferring the charge on the first capacitor to the second capacitor after the diagnostic current pulse has been delivered.

5 . The diode driver as in claim 3 , wherein the first capacitor is reset prior to the current pulse generator delivering the first diagnostic current pulse.

6 . The diode driver as in claim 1 , wherein each portion of the array of diodes is a respective row of the array of diodes, and wherein the device state analyzer is connected to each row of the array of diodes via a parallel connection.

7 . The diode driver as in claim 1 , wherein the diagnostic current pulse has a width between 2 nanoseconds and 10 nanoseconds.

8 . The diode driver as in claim 1 , wherein the current pulse generator includes:

a low-side switch (SWL) which, in response to being closed, is configured to couple a second induction terminal to a ground terminal, and

a shorting switch (SHRT) which, in response to being closed, is configured to couple a first induction terminal to the ground terminal, and

wherein the current pulse generator recirculates current in the inductor when the SWL and the SHRT are both closed.

9 . The diode driver as in claim 1 , wherein the current pulse generator includes a current threshold detector that detects when the residual current in the inductor has reached a threshold in response to which the current pulse generator is configured to deliver the diagnostic current pulse.

10 . The diode driver as in claim 9 , wherein the current pulse generator includes a low-side switch (SWL) which, when closed, couples a second induction terminal to a ground terminal, and a shorting switch (SHRT) which, when closed, is configured to couple a first induction terminal to the ground terminal, and

wherein the current threshold detector is arranged between the SWL and the ground terminal.

11 . The diode driver as in claim 1 , wherein the voltage drop measurement device includes an analog/digital (A/D) converter, and

wherein the device state analyzer configured to determine whether the portion of the array of diodes is defective based on the voltage drop of the portion of the array of diodes is further configured to determine based on a digital algorithm.

12 . A method, comprising:

delivering, via a current pulse generator, an operating current pulse to a portion of an array of diodes in response to a current in an inductor being greater than or equal to a target current, the current pulse generator producing a diagnostic current pulse in the inductor based on a residual current from the operating current pulse recirculating in the inductor, the diagnostic current pulse being less than the target current;

measuring a voltage drop resulting from a delivery of the diagnostic current pulse to the portion of the array of diodes; and

determining whether the portion of the array of diodes is defective based on the voltage drop of the portion of the array of diodes.

13 . The method as in claim 12 , wherein the operating current pulse is delivered to the portion of the array of diodes via the inductor.

14 . The method as in claim 12 , wherein the operating current pulse is delivered to the portion of the array of diodes without measuring a voltage drop.

15 . The method as in claim 12 , wherein the diagnostic current pulse is a first diagnostic current pulse and the voltage drop is a first voltage drop,

wherein the method further comprises:

after producing the first diagnostic current pulse, producing a second diagnostic current pulse for measuring a second voltage drop, and wherein determining whether the portion of the array of diodes is defective includes:

determining whether the portion of the array of diodes is defective based on the first voltage drop and the second voltage drop.

16 . The method as in claim 15 , wherein determining whether the portion of the array of diodes is defective includes:

storing charge from diagnostic current pulses on a first capacitor; and

converting first charge stored on the first capacitor from the first diagnostic current pulse and second charge stored on the first capacitor from the second diagnostic current pulse to a voltage signal that indicates a variation of voltage drop of the portion of the array of diodes over time.

17 . The method as in claim 16 , wherein converting includes

transferring the first charge on the first capacitor to produce a second charge on a second capacitor after the diagnostic current pulse has been delivered; and

holding the second charge on the second capacitor for measurement.

18 . The method as in claim 16 , further comprising:

resetting the first capacitor prior to the current pulse generator generating the diagnostic current pulse.

19 . A lidar system, comprising:

an array of diodes configured to produce illumination in response to receiving an amount of current, and

a diode driver for driving an array of diodes, comprising:

a current pulse generator configured to deliver an operating current pulse to a portion of the array of diodes, the current pulse generator producing a diagnostic current pulse in an inductor based on a residual current from the operating current pulse recirculating in the inductor, the diagnostic current pulse being less than the operating current pulse;

a voltage drop measurement device configured to measure a voltage drop resulting from a delivery of the diagnostic current pulse to the portion of the array of diodes; and

a device state analyzer configured to determine whether the portion of the array of diodes is defective based on the voltage drop of the portion of the array of diodes.

20 . The lidar system of claim 19 , wherein

the current pulse generator includes a current threshold detector that detects when the current in the inductor has reached a threshold after which the current pulse generator is configured to deliver the diagnostic current pulse.

Assignments (3)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 059847, FRAME 0433 Recorded Nov 9, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 065525/0001 →
SECURITY INTEREST Recorded May 3, 2022
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 059847/0433 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 11, 2022
From: EGGERMONT, JEAN-PAUL ANNA JOSEPH
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 058991/0052 →
Continuity (2)
Provisional Application 63171445 · Apr 6, 2021
Related Publication 20220320817A1 · Oct 6, 2022
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