IP Library Granted Patent US 11,967,610
Granted Patent B2
US 11,967,610 · App. 17/659,127 · Granted Apr 23, 2024

Integrated high voltage capacitor

Inventor: Christopher David Ainsworth (South Wales, GB)
Assignee: Semtech Corporation
H01L28/60H01L23/585H01L23/647H01L24/32H01L24/48H01L24/85H01L25/167H01L28/20H01L31/02005H01L31/02019H01L31/107H03F3/08H01L24/05H01L24/73H01L2224/0231H01L2224/02331H01L2224/04042H01L2224/05569H01L2224/32145H01L2224/48091H01L2224/48106H01L2224/48137H01L2224/48145H01L2224/48229H01L2224/73265H01L2924/12043H01L2924/19011H01L2924/19041H01L2924/19043H03F2200/165
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,967,610
App. No.
17/659,127
Granted
Apr 23, 2024
Kind
B2
Abstract

A semiconductor device comprises a semiconductor die and an integrated capacitor formed over the semiconductor die. The integrated capacitor is configured to receive a high voltage signal. A transimpedance amplifier is formed in the semiconductor die. An avalanche photodiode is disposed over or adjacent to the semiconductor die. The integrated capacitor is coupled between the avalanche photodiode and a ground node. A resistor is coupled between a high voltage input and the avalanche photodiode. The resistor is an integrated passive device (IPD) formed over the semiconductor die. A first terminal of the integrated capacitor is coupled to a ground voltage node. A second terminal of the integrated capacitor is coupled to a voltage greater than 20 volts. The integrated capacitor comprises a plurality of interdigitated fingers in one embodiment. In another embodiment, the integrated capacitor comprises a plurality of vertically aligned plates.

Claims (49)

1. A method of making a transimpedance amplifier device, comprising:

providing a semiconductor;

forming a high voltage integrated capacitor over the semiconductor, wherein the high voltage integrated capacitor includes a plurality of interdigitated fingers with a finger spacing of 0.3 μm or greater between individual fingers of the plurality of interdigitated fingers; and

forming an integrated resistor over the semiconductor, wherein the integrated resistor and the high voltage integrated capacitor form a radio frequency (RF) filter on the semiconductor along with a transimpedance amplifier.

2. The method of claim 1 , further including coupling the high voltage integrated capacitor to receive a high voltage signal through the integrated resistor.

3. The method of claim 2 , wherein the high voltage signal is between 60 and 90 volts.

4. The method of claim 1 , wherein the plurality of interdigitated fingers are vertically aligned with each other by common polarity.

5. The method of claim 1 , further including disposing an avalanche photodiode (APD) over the transimpedance amplifier device.

6. The method of claim 5 , further including:

coupling a cathode of the APD to a circuit node between the high voltage integrated capacitor and the integrated resistor; and

coupling an anode of the APD to the transimpedance amplifier.

7. A method of making a transimpedance amplifier device, comprising:

providing a semiconductor substrate;

forming an integrated capacitor over the semiconductor substrate; and

forming an integrated resistor over the semiconductor substrate, wherein the integrated resistor and the integrated capacitor form a radio frequency (RF) filter on the semiconductor substrate along with a transimpedance amplifier.

8. The method of claim 7 , further including coupling the integrated capacitor to receive a high voltage signal through the integrated resistor.

9. The method of claim 8 , wherein the high voltage signal is 35 volts or greater.

10. The method of claim 7 , further including disposing an avalanche photodiode (APD) over the transimpedance amplifier device.

11. The method of claim 10 , further including:

coupling a cathode of the APD to a circuit node between the integrated capacitor and the integrated resistor; and

coupling an anode of the APD to the transimpedance amplifier.

12. The method of claim 10 , further including:

disposing the transimpedance amplifier device into a can-shaped package; and

disposing a lens in an opening of the can-shaped package, wherein the can-shaped package is adapted to guide a fiber-optic signal through the lens and onto the APD.

13. The method of claim 7 , wherein the integrated capacitor includes a first terminal that is electrically isolated from all components formed in the semiconductor substrate.

14. A transimpedance amplifier device, comprising:

a semiconductor substrate;

an integrated capacitor formed over the semiconductor substrate; and

an integrated resistor formed over the semiconductor substrate, wherein the integrated resistor and the integrated capacitor form a radio frequency (RF) filter on the semiconductor substrate along with a transimpedance amplifier.

15. The transimpedance amplifier device of claim 14 , wherein the integrated capacitor is coupled to a high voltage power input circuit node through the integrated resistor.

16. The transimpedance amplifier device of claim 15 , wherein the high voltage power input circuit node is configured to receive a voltage greater than or equal to 35 volts.

17. The transimpedance amplifier device of claim 14 , further including an avalanche photodiode (APD) disposed over the semiconductor substrate.

18. The transimpedance amplifier device of claim 17 , wherein a cathode of the APD is coupled to a circuit node between the integrated capacitor and the integrated resistor and an anode of the APD is coupled to the transimpedance amplifier.

19. The transimpedance amplifier device of claim 17 , further including a conductive epoxy or solder disposed between the semiconductor substrate and avalanche photodiode.

20. The transimpedance amplifier device of claim 17 , further including:

a can-shaped package with the semiconductor substrate disposed in the can-shaped package; and

a lens disposed in an opening of the can-shaped package, wherein the can-shaped package is adapted to guide a fiber-optic signal through the lens and onto the APD.

21. A transimpedance amplifier semiconductor die, comprising:

a transimpedance amplifier;

an integrated capacitor; and

an integrated resistor, wherein the integrated resistor and the integrated capacitor form a radio frequency (RF) filter on the transimpedance amplifier semiconductor die.

22. The transimpedance amplifier die of claim 21 , wherein the integrated capacitor is coupled to a high voltage power input circuit node through the integrated resistor.

23. The transimpedance amplifier die of claim 22 , wherein the high voltage power input circuit node is configured to receive a voltage greater than or equal to 35 volts.

24. The transimpedance amplifier die of claim 21 , further including an avalanche photodiode (APD) disposed over the transimpedance amplifier semiconductor die.

25. The transimpedance amplifier die of claim 24 , wherein a cathode of the APD is coupled to a circuit node between the integrated capacitor and the integrated resistor and an anode of the APD is coupled to the transimpedance amplifier.

26. The transimpedance amplifier die of claim 24 , further including a conductive epoxy or solder disposed between the transimpedance amplifier semiconductor die and avalanche photodiode.

27. The transimpedance amplifier die of claim 24 , further including:

a can-shaped package with the transimpedance amplifier semiconductor die disposed in the can-shaped package; and

a lens disposed in an opening of the can-shaped package, wherein the can-shaped package is adapted to guide a fiber-optic signal through the lens and onto the APD.

Assignments (2)
GRANT OF SECURITY INTEREST IN PATENT RIGHTS Recorded Jan 12, 2023
From: SEMTECH CORPORATION; TRIUNE SYSTEMS, L.L.C.; TRIUNE IP, LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 062389/0057 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 13, 2022
From: AINSWORTH, CHRISTOPHER DAVID
To: SEMTECH CORPORATION
Reel/Frame 059589/0687 →
Continuity (3)
Continuation 16377070 · Apr 5, 2019
Provisional Application 62658073 · Apr 16, 2018
Related Publication 20220238635A1 · Jul 28, 2022
Cited By (1)
US 12,237,867