Sensor device and method of use
A device may determine a time-of-flight measurement by performing a sample of a sensor based on light received via at least one first spectral filter, wherein the at least one first spectral filter is associated with a spectral range for a time-of-flight measurement; determine that a condition is satisfied with regard to the time-of-flight measurement, wherein the condition relates to an orientation or a position of the sensor or the sensor device relative to a measurement target; trigger a spectrometry measurement to be performed based on determining that the condition is satisfied with regard to the time-of-flight measurement; and perform, based on light received via at least one second spectral filter and by performing a sample of the sensor, the spectrometry measurement for the measurement target based on the condition being satisfied with regard to the time-of-flight measurement.
1. A sensor device, comprising:
a spectrometry filter configured to pass one or more first wavelengths of light for performance of a spectrometry measurement on a measurement target, wherein the spectrometry filter is a multichannel spectral filter; and
one or more time-of-flight (ToF) filters configured to:
pass one or more second wavelengths of light for performance of a ToF measurement on the measurement target, and
one or more of:
enable a measurement of a distance between the sensor device and the measurement target, or
enable a measurement of an orientation of the sensor device relative to the measurement target.
2. The sensor device of claim 1 , wherein at least one of the one or more first wavelengths of light or the one or more second wavelengths of light are in a near-infrared range.
3. The sensor device of claim 1 , wherein the one or more ToF filters include a single ToF filter configured to enable the measurement of the distance between the sensor device and the measurement target.
4. The sensor device of claim 1 , wherein the one or more ToF filters include multiple ToF filters configured to enable the measurement of the orientation of the sensor device relative to the measurement target.
5. The sensor device of claim 1 , wherein the spectrometry filter and the one or more ToF filters are coplanar.
6. The sensor device of claim 1 , further comprising:
one or more first sensors configured to determine the spectrometry measurement; and
one or more second sensor configured to determine the ToF measurement.
7. The sensor device of claim 1 , further comprising:
one or more light sources configured to provide light for one or more of the spectrometry measurement or the ToF measurement.
8. The sensor device of claim 7 , wherein the spectrometry filter and the one or more ToF filters are between the one or more light sources and the measurement target.
9. The sensor device of claim 1 , wherein the one or more ToF filters include:
a first ToF filter,
a second ToF filter that connects to the first ToF filter via a first axis, and
a third ToF filter that connects to the second ToF filter via a second axis that is orthogonal to the first axis.
10. The sensor device of claim 1 , further comprising:
a sensor configured to determine one or more of the spectrometry measurement or the ToF measurement,
wherein the sensor is between one or more light sources and the measurement target.
11. A device, comprising:
a spectrometry filter configured to pass one or more first wavelengths of light; and
a plurality of time-of-flight (ToF) filters configured to pass one or more second wavelengths of light,
wherein the plurality of ToF filters include:
a first ToF filter,
a second ToF filter that connects to the first ToF filter via a first axis, and
a third ToF filter that connects to the second ToF filter via a second axis that is orthogonal to the first axis.
12. The device of claim 11 , wherein the spectrometry filter is a multichannel spectral filter.
13. The device of claim 11 , wherein at least one of the one or more first wavelengths of light or the one or more second wavelengths of light is in a near-infrared range.
14. The device of claim 11 , further comprising:
a sensor configured to determine one or more of a spectrometry measurement or a ToF measurement based on one or more of the one or more first wavelengths of light or the one or more second wavelengths of light.
15. The device of claim 11 , wherein the plurality of ToF filters are configured to enable a measurement of an orientation of the device relative to a measurement target.
16. A device, comprising:
a spectrometry filter configured to pass one or more first wavelengths of light for performance of a spectrometry measurement on a measurement target; and
one or more time-of-flight (ToF) filters configured to pass one or more second wavelengths of light for performance of a ToF measurement on the measurement target,
wherein the spectrometry filter and the one or more ToF filters are between one or more light sources and the measurement target.
17. The device of claim 16 , further comprising one or more of:
one or more first sensors configured to determine the spectrometry measurement; or
one or more second sensors configured to determine the ToF measurement.
18. The device of claim 16 , further comprising:
the one or more light sources,
wherein the one or more light sources are configured to provide light for one or more of the spectrometry measurement or the ToF measurement.
19. The device of claim 16 , wherein at least one of the one or more first wavelengths of light or the one or more second wavelengths of light are in a near-infrared range.
20. The device of claim 16 , wherein the spectrometry filter and the one or more ToF filters are coplanar.