IP Library Granted Patent US 12,226,765
Granted Patent B2
US 12,226,765 · App. 17/663,821 · Granted Feb 18, 2025

Microwave assisted fluidized bed reactor

Inventors: George L. Skoptsov (Pittsburgh, PA); Aayush Mantri (Pittsburgh, PA); Vignesh Viswanathan (Pittsburgh, PA); Preet K. Jain (Pittsburgh, PA)
Assignee: H QUEST VANGUARD, INC.
B01J8/1872B01J8/1836B01J8/388B01J19/126B01J2208/00442B01J2208/00548
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Quick Facts
Patent No.
US 12,226,765
App. No.
17/663,821
Granted
Feb 18, 2025
Kind
B2
Abstract

System and methods for plasma treatment of a fluidized bed of particles are disclosed. The systems include an energy coupling zone configured to generate a plasma from microwave radiation and an interface element configured to propagate the plasma from the energy coupling zone to a reaction zone. The reaction zone is configured to receive the plasma, receive a plurality of reactant particles in a fluidization plane direction from a fluidization assembly positioned below the reaction zone, and form a product in presence of the plasma. The fluidization plane is substantially perpendicular to the propagated plasma.

Claims (69)

1. A system for plasma treatment of a fluidized bed of particles, the system comprising:

an energy coupling zone configured to generate a plasma from microwave radiation;

an interface element configured to propagate the plasma from the energy coupling zone to a reaction zone;

a fluidization chamber configured for holding and fluidizing a plurality of reactant particles;

a perforated distributor;

one or more fluidization gas ports for receiving a fluidization gas; and

the reaction zone configured to receive the plasma, wherein the reaction zone is further configured to:

receive, from the fluidization assembly positioned below the reaction zone, the plurality of reactant particles in a fluidization plane, a direction of the fluidization plane being substantially perpendicular to a direction of propagation of plasma in the reaction zone, and

form a product in presence of the plasma.

2. The system of claim 1 , wherein the energy coupling zone comprises:

a radiation source for providing the microwave radiation; and

a discharge tube coupled to the radiation source, the discharge tube configured to:

receive a plasma forming material, and generate the plasma from the plasma forming material in presence of the microwave radiation.

3. The system of claim 2 , wherein the discharge tube extends at least partially within the interface element.

4. The system of claim 1 , wherein a length of the interface element is configured such that a head of the plasma is propagated within the reaction zone.

5. The system of claim 1 , wherein the one or more fluidization ports are in fluid communication with the perforated distributor such that the fluidization gas may fluidize static reactant particles.

6. The system of claim 1 , wherein the one or more fluidization ports are located on one or more walls of the fluidization chamber to provide a tangential flow of the fluidization gas.

7. The system of claim 1 , wherein the perforated distributor is a mesh.

8. The system of claim 1 , wherein the perforated distributor is a fritted disc.

9. The system of claim 1 , wherein the fluidization assembly further comprises a spouting tube configured to receive a spouting gas, the spouting tube comprising;

a plurality of holes; and

a spouting end configured to recirculate the plurality of reactant particles in the reaction zone.

10. The system of claim 9 , wherein the plurality of holes are configured to receive the plurality of reaction material particles from a fluidized bed formed within the fluidization chamber.

11. The system of claim 1 , further comprising an exhaust assembly comprising a conduit for receiving an exhaust gas from the reaction zone.

12. A method for plasma treatment of a fluidized bed of particles, the method comprising:

generating a layered plasma from microwave radiation, the layered plasma comprising a higher temperature plasma surrounded by a lower temperature plasma;

propagating the plasma into a reaction zone;

receiving, in the reaction zone, a plurality of reactant particles in a fluidization plane, a direction of the fluidization plane being substantially perpendicular to a direction of propagation of plasma in the reaction zone; and

forming a product in presence of the plasma.

13. The method of claim 12 , further comprising fluidizing, using a fluidization gas and a perforated distributor, static reactant particles in the fluidization plane.

14. The method of claim 13 , further comprising selecting a gas flow velocity of the fluidization gas for controlling a residence time of the plurality of reactant particles within the plasma.

15. The method of claim 12 , further comprising recirculating one or more of the plurality of reactant particles into the reaction zone using a spouting gas.

16. The method of claim 12 , further comprising eliminating, via an exhaust assembly, an exhaust gas from the reaction zone.

17. The method of claim 12 , further comprising:

collecting sensor data; and

using feedback control to control one or more process conditions.

18. The method of claim 17 , wherein collecting the sensor data comprises collecting the sensor data from at least one of the following: temperature sensors, pressure sensors, optical emission spectrometers, or gas chromatographs, or gas mass spectrometers.

19. A method for plasma treatment of a fluidized bed of particles, the method comprising:

generating a plasma from microwave radiation;

propagating the plasma into a reaction zone;

fluidizing, using a fluidization gas and a perforated distributor, static reactant particles in the fluidization plane;

receiving, in the reaction zone, a plurality of reactant particles in the fluidization plane, a direction of the fluidization plane being substantially perpendicular to a direction of propagation of plasma in the reaction zone; and

forming a product in presence of the plasma.

20. The method of claim 19 , further comprising selecting a gas flow velocity of the fluidization gas for controlling a residence time of the plurality of reactant particles within the plasma.

21. The method of claim 19 , further comprising recirculating one or more of the plurality of reactant particles into the reaction zone using a spouting gas.

22. The method of claim 19 , further comprising eliminating, via an exhaust assembly, an exhaust gas from the reaction zone.

23. The method of claim 19 , further comprising:

collecting sensor data; and

using feedback control to control one or more process conditions.

24. The method of claim 23 , wherein collecting the sensor data comprises collecting the sensor data from at least one of the following: temperature sensors, pressure sensors, optical emission spectrometers, or gas chromatographs, or gas mass spectrometers.

25. A method for plasma treatment of a fluidized bed of particles, the method comprising:

generating a plasma from microwave radiation;

propagating the plasma into a reaction zone;

receiving, in the reaction zone, a plurality of reactant particles in the fluidization plane, a direction of the fluidization plane being substantially perpendicular to a direction of propagation of plasma in the reaction zone;

recirculating one or more of the plurality of reactant particles into the reaction zone using a spouting gas; and

forming a product in presence of the plasma.

26. The method of claim 25 , further comprising eliminating, via an exhaust assembly, an exhaust gas from the reaction zone.

27. The method of claim 25 , further comprising:

collecting sensor data; and

using feedback control to control one or more process conditions.

28. The method of claim 27 , wherein collecting the sensor data comprises collecting the sensor data from at least one of the following: temperature sensors, pressure sensors, optical emission spectrometers, or gas chromatographs, or gas mass spectrometers.

29. A method for plasma treatment of a fluidized bed of particles, the method comprising:

generating a plasma from microwave radiation;

propagating the plasma into a reaction zone;

receiving, in the reaction zone, a plurality of reactant particles in the fluidization plane, a direction of the fluidization plane being substantially perpendicular to a direction of propagation of plasma in the reaction zone;

forming a product in presence of the plasma;

collecting sensor data; and

using feedback control to control one or more process conditions.

30. The method of claim 29 , wherein collecting the sensor data comprises collecting the sensor data from at least one of the following: temperature sensors, pressure sensors, optical emission spectrometers, or gas chromatographs, or gas mass spectrometers.

Assignments (2)
CONFIRMATORY LICENSE Recorded Jan 31, 2025
From: H QUEST VANGUARD, INC.
To: UNITED STATES DEPARTMENT OF ENERGY
Reel/Frame 070076/0571 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 17, 2022
From: SKOPTSOV, GEORGE L; MANTRI, AAYUSH; VISWANATHAN, VIGNESH; JAIN, PREET K
To: H QUEST VANGUARD, INC.
Reel/Frame 059937/0141 →
Continuity (2)
Provisional Application 63189548 · May 17, 2021
Related Publication 20220362731A1 · Nov 17, 2022
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