IP Library › Granted Patent US 12,507,409
Granted Patent B2
US 12,507,409 · App. 17/672,597 · Granted Dec 23, 2025

Memory devices and methods of manufacturing thereof

Inventors: Meng-Han Lin (Hsinchu, TW); Chia-En Huang (Hsinchu, TW)
Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
H10B43/27G11C16/0483H10B41/10H10B41/27H10B43/10
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Quick Facts
Patent No.
US 12,507,409
App. No.
17/672,597
Granted
Dec 23, 2025
Kind
B2
Abstract

A semiconductor device includes a first and a second areas. The first area includes a plurality of first conductive stripes extending along a lateral direction and spaced from one another along a vertical direction, a first memory layer extending along the vertical direction, a first semiconductor layer extending along the vertical direction and coupled to a portion of the first memory layer, and second and third conductive stripes extending along the vertical direction, wherein the second and third conductive stripes are coupled to end portions of a sidewall of the first semiconductor layer. The second area includes a plurality of conductive sheets extending along the lateral direction and spaced from one another along the vertical direction, a second memory layer extending along the vertical direction and wrapped by the plurality of conductive sheets, and a second semiconductor layer extending along the vertical direction and wrapped by the second memory layer.

Claims (48)

1 . A memory device, comprising:

a substrate including a first area and a second area;

wherein the memory device, in the first area, comprises:

a plurality of first conductive stripes extending along a lateral direction and spaced from one another along a vertical direction;

a first memory layer extending along the vertical direction;

a first semiconductor layer extending along the vertical direction and coupled to a portion of the first memory layer; and

second and third conductive stripes extending along the vertical direction, wherein the second and third conductive stripes are coupled to end portions of a sidewall of the first semiconductor layer; and

wherein the memory device, in the second area, comprises:

a plurality of conductive sheets extending along the lateral direction and spaced from one another along the vertical direction;

a second memory layer extending along the vertical direction and wrapped by the plurality of conductive sheets; and

a second semiconductor layer extending along the vertical direction and wrapped by the second memory layer.

2 . The memory device of claim 1 , wherein the first area is located immediately next to the second area.

3 . The memory device of claim 1 , wherein the second memory layer continuously extends along the vertical direction, with a plurality of portions discretely wrapped by the plurality of conductive sheets, respectively.

4 . The memory device of claim 1 , wherein the second semiconductor layer continuously extends along the vertical direction, with a plurality of portions discretely wrapped by the plurality of conductive sheets, respectively.

5 . The memory device of claim 1 , wherein the plurality of first conductive stripes, the first memory layer, the first semiconductor layer, and the second and third conductive stripes collectively function as a portion of an active memory array, while the plurality of conductive sheets, the second memory layer, and the second semiconductor layer collectively function as a portion of a dummy memory array.

6 . The memory device of claim 1 , wherein the memory device, in the second area, further comprises:

a pair of fourth conductive stripes extending along the vertical direction;

wherein the second semiconductor layer wraps the pair of fourth conductive stripes and a single dielectric pillar interposed between the pair of fourth conductive stripes.

7 . The memory device of claim 1 , wherein the memory device, in the second area, further comprises:

a single fifth conductive structure extending along the vertical direction;

wherein the second semiconductor layer wraps the fifth conductive structure and a pair of dielectric pillars disposed on opposite sides of the single fifth conductive structure, respectively.

8 . The memory device of claim 1 , wherein the memory device, in the second area, further comprises:

a single sixth conductive structure extending along the vertical direction;

wherein the second semiconductor layer wraps the sixth conductive structure and a single dielectric pillar disposed on a side of the sixth conductive structure.

9 . The memory device of claim 1 , further comprises:

a dielectric pillar extending along the vertical direction;

wherein the second semiconductor layer wraps the dielectric pillar, with no conductive material disposed between the dielectric pillar and the second semiconductor layer.

10 . The memory device of claim 1 , further comprises:

a single seventh conductive structure extending along the vertical direction;

wherein the second semiconductor layer wraps the single seventh conductive structure, with no dielectric material disposed between the single seventh conductive structure and the second semiconductor layer.

11 . The memory device of claim 10 , wherein the single seventh conductive structure has a cross-section with a rectangular shape, a square shape, a circular shape, or an elliptical shape.

12 . A memory device, comprising:

a plurality of active memory arrays disposed over a substrate; and

a plurality of dummy memory arrays disposed over the substrate, wherein each of the plurality of active memory arrays is interposed between a pair of the plurality of dummy memory arrays along a first lateral direction;

wherein each of the plurality of active memory arrays comprises a plurality of first memory layers extending along a vertical direction and a plurality of first semiconductor layers extending along the vertical direction; and

wherein each of the plurality of dummy memory arrays comprises a plurality of second memory layers extending along the vertical direction and a plurality of second semiconductor layers extending along the vertical direction.

13 . The memory device of claim 12 , wherein one of the plurality of first semiconductor layers extends along a portion of a sidewall of a corresponding one of the plurality of first memory layers.

14 . The memory device of claim 12 , wherein one of the plurality of second memory layers wraps around a corresponding one of the plurality of second semiconductor layers.

15 . The memory device of claim 14 , wherein each of the plurality of second semiconductor layers surrounds at least one of: a conductive structure extending along the vertical direction or a dielectric pillar extending along the vertical direction.

16 . The memory device of claim 12 , wherein each of the plurality of active memory arrays comprises a plurality of conductive stripes separated from one another along the vertical direction and extending along a second lateral direction perpendicular to the first lateral direction.

17 . The memory device of claim 15 , wherein each of the plurality of dummy memory arrays comprises a plurality of conductive sheets separated from one another along the vertical direction and extending along a second lateral direction perpendicular to the first lateral direction.

18 . A memory device, comprising:

a plurality of active memory arrays disposed over a substrate; and

a plurality of dummy memory arrays disposed over the substrate, wherein the plurality of active memory arrays and the plurality of dummy arrays are arranged in an alternating pattern along a first lateral direction;

wherein each of the plurality of active memory arrays comprises a plurality of first memory layers extending along a vertical direction and a plurality of first semiconductor layers extending along the vertical direction; and

wherein each of the plurality of dummy memory arrays comprises a plurality of second memory layers extending along the vertical direction and a plurality of second semiconductor layers extending along the vertical direction, each of the plurality of second semiconductor layers encloses each corresponding one of the second memory layers.

19 . The memory device of claim 18 , wherein each of the plurality of second semiconductor layers encloses a conductive structure extending along the vertical direction, a dielectric pillar extending along the vertical direction, or both.

20 . The memory device of claim 19 , wherein each of the plurality of second semiconductor layers encloses the conductive structure and the dielectric pillar, and wherein the dielectric pillar is interposed between portions of the conductive structure.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 15, 2022
From: LIN, MENG-HAN; HUANG, CHIA-EN
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Reel/Frame 059020/0711 →
Continuity (1)
Related Publication 20230262977A1 · Aug 17, 2023
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