Scan apparatus capable of fault diagnosis and scan chain fault diagnosis method
Provided are scan device and method of diagnosing scan chain fault. The scan device for diagnosing a fault includes a scan partition including a plurality of scan chains which include path control scan flipflops connected to scan flipflops in cascade. In the scan partition, connection paths of the scan flipflops are controllable. The connection paths of the path control scan flipflops are controlled to detect a position of a fault such that a fault range in the scan partition is reduced to diagnose the fault.
1. A scan device comprising a scan partition including a plurality of scan chains which include path control scan flipflops connected to scan flipflops in cascade,
wherein connection paths of the scan flipflops in the scan partition are controllable, and
the connection paths of the path control scan flipflops are controlled to detect a position of a fault such that a fault range in the scan partition is reduced to diagnose the fault.
2. The scan device of claim 1 , wherein the path control scan flipflops are disposed in an array in the scan partition, and
the connection paths of the path control scan flipflops disposed in the same column in the array are controlled with the same path control signal.
3. The scan device of claim 1 , wherein each of the path control scan flipflops comprises:
a first input to which an output of a previous stage is provided in the scan chain in which the path control scan flipflop is disposed;
a second input to which an output of the same column as the path control scan flipflop in another scan chain included in the scan partition is provided;
a multiplexer (MUX) configured to output any one of signals provided to the first input and the second input according to a path control signal; and
a flipflop.
4. The scan device of claim 1 , wherein the scan device diagnosing the fault:
performs a first phase of controlling the connection paths of the path control scan flipflops to reduce the fault range in the scan partition and detect the position of the fault; and
further performs a second phase when three or more faults are detected in the scan partition as a result of the first phase.
5. The scan device of claim 4 , wherein each of the scan chains includes L of the scan flipflops,
the scan partition includes the N scan chains, and
the first phase comprises:
(a) performing a flush test without changing the paths;
(b) providing a path control signal to an (N i ) th column, where N i is smaller than but closest to L, to change the paths and performing a flush test; and
(c) sequentially providing the path control signal to (multiples of N i-1 ) th columns and (multiples of N i-2 ) th columns to a first column, of which the paths have not been changed, to change the paths and performing a flush test (N, L, and i: integers greater than or equal to 0).
6. The scan device of claim 5 , wherein the paths formed in the second phase are paths which are not connected in operations (a) to (c).
7. The scan device of claim 4 , wherein, when no fault is detected or two or fewer faults are detected in the scan partition as a result of the first phase, the scan device stops detecting the position of the fault.
8. The scan device of claim 5 , wherein the position of the fault is detected through the flush test, which provides a flush pattern including logic highs and logic lows at a predetermined ratio, and
when an input signal including the logic highs and the logic lows at the predetermined ratio is output with a changed phase, the path control scan flipflop is determined to be faulty.
9. A method of diagnosing a scan chain fault, the method comprising:
a first phase of changing connection paths of path control scan flipflops to reduce a fault range in a scan partition, which includes a plurality of scan chains including the path control scan flipflops connected to simple scan flipflops in cascade, and detect a fault; and
a second phase in which the path control scan flipflops are connected to connection paths, which have not been changed in the first phase, according to a result of the first phase to detect a position of the fault in the scan partition.
10. The method of claim 9 , wherein the path control scan flipflops are disposed in an array in the scan partition, and
the connection paths of the path control scan flipflops disposed in the same column in the array are controlled with the same path control signal.
11. The method of claim 9 , wherein each of the path control scan flipflops comprises:
a first input to which an output of a previous stage is provided in the scan chain in which the path control scan flipflop is disposed;
a second input to which an output of the same column as the path control scan flipflop in another scan chain included in the scan partition is provided;
a multiplexer (MUX) configured to output any one of signals provided to the first input and the second input according to a path control signal; and
a flipflop.
12. The method of claim 9 , wherein the second phase is performed when three or more faults are detected in the scan partition as a result of the first phase.
13. The method of claim 9 , wherein each of the scan chains includes L of the scan flipflops,
the scan partition includes the N scan chains, and
the first phase comprises:
(a) performing a flush test without changing the paths;
(b) providing a path control signal to an (N i ) th column, where N i is smaller than but closest to L, to change the paths and performing a flush test; and
(c) sequentially providing the path control signal to (multiples of N i-1 ) th columns and (multiples of N i-2 ) th columns to a first column, of which the paths have not been changed, to change the paths and performing a flush test (N, L, and i: integers greater than or equal to 0).
14. The method of claim 13 , wherein the second phase comprises providing the path control signal to the (N i ) th column and N i-1 th column to the first column in order of not receiving the path control signal in operations (a) to (c) to detect the fault.
15. The method of claim 9 , wherein, when no fault is detected or two or fewer faults are detected in the scan partition as a result of the first phase, the detection of the position of the fault is stopped.
16. The method of claim 13 , wherein the position of the fault is detected through the flush test, which provides a flush pattern including logic highs and logic lows at a predetermined ratio, and
when an input signal having the logic highs and the logic lows at the predetermined ratio is output with a different phase than the input flush pattern, the path control scan flipflop is determined to be faulty.