IP Library Granted Patent US 12,480,605
Granted Patent B2
US 12,480,605 · App. 17/673,374 · Granted Nov 25, 2025

Tube, method for producing tube, and method for storing tube

Inventors: Hitoshi Imamura (Osaka, JP); Hiroyuki Hamada (Osaka, JP); Eri Mukai (Osaka, JP); Yuuki Kuwajima (Osaka, JP); Manabu Fujisawa (Osaka, JP)
Assignee: DAIKIN INDUSTRIES, LTD.
F16L11/06B29C48/022B29C48/09B29C48/274B29C48/32B29D23/00B29D23/001C08F214/262B29C48/69B29C48/865B29C48/92B29C2948/92704B29C2948/92904B29K2027/18B29K2105/0085B29K2995/0072B29L2023/00C08J5/00C08J2327/18C08L27/18
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Quick Facts
Patent No.
US 12,480,605
App. No.
17/673,374
Granted
Nov 25, 2025
Kind
B2
Abstract

Provided is a tube comprising a tetrafluoroethylene/fluoroalkyl vinyl ether copolymer, wherein the tube inner surface has a surface roughness Ra of 5 nm or less measured by atomic force microscopy (AFM) with an evaluation length set to 3 μm, and the tube has an amount of metals eluted from the tube inner surface of 0.30 ng/cm 2 or less.

Claims (12)

1 . A tube comprising a tetrafluoroethylene/fluoroalkyl vinyl ether copolymer,

wherein the tube inner surface has a surface roughness Ra of 5 nm or less measured by atomic force microscopy (AFM) with an evaluation length set to 3 μm, and

the tube has an amount of metals eluted from the tube inner surface of 0.30 ng/cm 2 or less.

2 . The tube according to claim 1 , wherein the tube inner surface has an average spherulite size of 1 to 150 μm.

3 . The tube according to claim 1 , wherein the tube inner surface has an average spherulite size of more than 15 μm.

4 . The tube according to claim 1 , wherein the fluoroalkyl vinyl ether is perfluoro(propyl vinyl ether).

5 . The tube according to claim 1 , wherein the tube is used for transporting a high-purity chemical solution for manufacturing a semiconductor device.

6 . The tube according to claim 1 , wherein the tube is obtained by extruding the tetrafluoroethylene/fluoroalkyl vinyl ether copolymer, while flowing a gas which has passed through a filter having a filtration accuracy of 5 nm or less into a hollow part of a tube extruded from the die equipped in an extruder.

7 . The tube according to claim 1 , wherein the content of a fluoroalkyl vinyl ether unit in the tetrafluoroethylene/fluoroalkyl vinyl ether copolymer is 1.0 to 8.0 mass % relative to the total monomer units.

8 . A method for producing the tube according to claim 1 , comprising, by using an extruder in which a die is equipped, extruding the tetrafluoroethylene/fluoroalkyl vinyl ether copolymer, while flowing a gas which has passed through a filter having a filtration accuracy of 5 nm or less into a hollow part of a tube extruded from the tip of the die.

9 . The production method according to claim 8 , wherein a resin temperature of the tetrafluoroethylene/fluoroalkyl vinyl ether copolymer at the tip of the die is 350 to 370° C.

10 . A method for storing the tube according to claim 1 , comprising storing the tube with a high-purity liquid filled inside the tube.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 16, 2022
From: IMAMURA, HITOSHI; HAMADA, HIROYUKI; MUKAI, ERI; KUWAJIMA, YUUKI; FUJISAWA, MANABU
To: DAIKIN INDUSTRIES, LTD.
Reel/Frame 059140/0757 →
Priority Claims (1)
JP 2019-150911 · Aug 21, 2019 · national
Continuity (2)
Continuation PCTJP2020029884 · Aug 4, 2020
Related Publication 20220170573A1 · Jun 2, 2022
References Cited (26)
US 5473018A · Namura et al. · 1995 [cited by applicant]
US 5603999A · Namura et al. · 1997 [cited by applicant]
US 20030013791A1 · Blong · 2003 [cited by examiner]
US 20080081139A1 · Iwahara et al. · 2008 [cited by applicant]
US 20200139604A1 · Yabe · 2020 [cited by examiner]
CN 1464543A · 2003 [cited by applicant]
JP 58160135A · 1983 [cited by applicant]
JP 61159589A · 1986 [cited by applicant]
JP 770397A · 1995 [cited by applicant]
JP 8245723A · 1996 [cited by applicant]
JP 10086205A · 1998 [cited by applicant]
JP 11217478A · 1999 [cited by applicant]
JP 2000233435A · 2000 [cited by applicant]
JP 2001247627A · 2001 [cited by applicant]
JP 2001356627A · 2001 [cited by applicant]
JP 2004249606A · 2004 [cited by applicant]
JP 2008105401A · 2008 [cited by applicant]
JP 2010125634A · 2010 [cited by applicant]
JP 2017214478A · 2017 [cited by applicant]
JP 20196983A · 2019 [cited by applicant]
KR 1019980044886A · 1998 [cited by applicant]
WO 2014054685A1 · 2014 [cited by applicant]
Partial Supplementary European Search Report issued Sep. 1, 2023 in European Application No. 20854340.5. [cited by applicant]
Extended European Search Report issued Dec. 5, 2023 in corresponding European Application No. 20854340.5. [cited by applicant]
International Search Report for PCT/JP2020/029884 dated Oct. 20, 2020. [cited by applicant]
International Preliminary Report on Patentability with the translation of Written Opinion dated Feb. 17, 2022 from the International Bureau in International Application No. PCT/JP2020/029884. [cited by applicant]