ELASTIC PROBE ELEMENT, ELASTIC PROBE ASSEMBLY, AND TESTING DEVICE
An elastic probe element, an elastic probe assembly, and a testing device are provided. The testing device includes a substrate, a guiding member, and multiple ones of the elastic probe elements. The guiding member has a plurality of through holes for the multiple ones of the elastic probe elements correspondingly passing through. The elastic probe element includes a main body, a first contact segment, and a second contact segment that are integrally formed. The main body has a plurality of needle structures, and any two adjacent needle structures have a gap arranged therebetween. The needle structures are connected to each other through a first connection part and a second connection part arranged at a first end and a second end of the elastic probe element, respectively. The first contact segment is arranged at the first end. The second contact segment is arranged at the second end.
1 . An elastic probe element, comprising:
a body having a plurality of needle structures, wherein two adjacent ones of the needle structures have a gap arranged therebetween, and the plurality of needle structures are connected to each other through a first connection part and a second connection part that are respectively arranged at a first end and a second end of the elastic probe element;
a first contact segment arranged at the first end of the elastic probe element; and
a second contact segment arranged at the second end of the elastic probe element;
wherein the main body, the first contact segment, and the second contact segment are integrally formed.
2 . The elastic probe element according to claim 1 , wherein the body is made of a highly electrically conductive material.
3 . The elastic probe element according to claim 1 , wherein the first end includes at least one first tapered end, and the second end includes at least one second tapered end.
4 . The elastic probe element according to claim 1 , wherein the plurality of needle structures of the body are parallel to each other.
5 . An elastic probe assembly, comprising:
multiple ones of the elastic probe elements according to claim 1 ;
wherein the multiple ones of the elastic probe elements are stacked in a same direction so as to form the elastic probe assembly;
wherein one part of the elastic probe assembly extends along the first end so as to form a first contact end of the elastic probe assembly, and another part of the elastic probe assembly extends along the second end so as to form a second contact end of the elastic probe assembly.
6 . A testing device, comprising:
a substrate;
at least one guiding member having a plurality of through holes; and
multiple ones of the elastic probe elements according to claim 1 respectively corresponding to the plurality of through holes, and each passing through a corresponding one of the through holes.
7 . The testing device according to claim 6 , wherein each of the plurality of through holes is strip-shaped.
8 . The testing device according to claim 6 , wherein the plurality of through holes are arranged in a predetermined pattern on the at least one guiding member.
9 . The testing device according to claim 6 , further comprising:
at least one block arranged on a side of the first contact segment that is away from a first contact end and is adjacent to a corresponding one of the through holes.
10 . The testing device according to claim 6 , wherein a part of the first contact segment is accommodated in a corresponding one of the through holes.
11 . The testing device according to claim 6 , wherein the first connection part is accommodated in a corresponding one of the through holes.
12 . A testing device, comprising:
a substrate;
at least one guiding member having a plurality of through holes; and
multiple ones of the elastic probe assemblies according to claim 5 respectively corresponding to the plurality of through holes, and each passing through a corresponding one of the through holes.
13 . The testing device according to claim 12 , wherein each of the plurality of through holes is strip-shaped.
14 . The testing device according to claim 12 , further comprising:
at least one block arranged on a side of the first contact segment or a side of the second contact segment that is away from the first contact end and is adjacent to a corresponding one of the through holes.