IP Library › Granted Patent US 11,682,446
Granted Patent B2
US 11,682,446 · App. 17/679,656 · Granted Jun 20, 2023

Selective wordline scans based on a data state metric

Inventors: Vamsi Pavan Rayaprolu (San Jose, CA); Kishore Kumar Muchherla (Fremont, CA); Harish R. Singidi (Fremont, CA); Ashutosh Malshe (Fremont, CA); Gianni S. Alsasua (Rancho Cordova, CA)
Assignee: Micron Technology, Inc.
G11C11/40622G11C11/409G11C11/4085G11C29/44
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Quick Facts
Patent No.
US 11,682,446
App. No.
17/679,656
Granted
Jun 20, 2023
Kind
B2
Abstract

Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations including performing a first data integrity check on memory pages of a first set of wordlines of the memory device; performing a second data integrity check on memory pages of a second set of wordlines comprising a plurality of wordlines from the first set of wordlines; identifying, among the first set of wordlines and the second set of wordlines, a wordline having a first data state metric value obtained from the first data integrity check equal to a second data state metric value obtained from the second data integrity check; and performing a third data integrity check on a third set of wordlines comprising at least one wordline from the first set of wordlines, wherein the third data integrity check excludes the identified wordline.

Claims (45)

1. A system comprising:

a memory device; and

a processing device, operatively coupled to the memory device, to perform operations comprising:

performing a first data integrity check on memory pages of a first set of wordlines of the memory device, wherein the data integrity check comprises determining a data state metric value of each wordline of the first set of wordlines;

performing a second data integrity check on memory pages of a second set of wordlines comprising a plurality of wordlines from the first set of wordlines;

identifying, among the first set of wordlines and the second set of wordlines, a wordline having a first data state metric value obtained from the first data integrity check equal to a second data state metric value obtained from the second data integrity check; and

performing a third data integrity check on a third set of wordlines comprising at least one wordline from the first set of wordlines, wherein the third data integrity check excludes the identified wordline.

2. The system of claim 1 , wherein the processing device performs further operations comprising:

including the excluded wordline in a subsequent determining of further new values of the data state metric.

3. The system of claim 1 , wherein the first data state metric value comprises a residual bit error rate (RBER) value.

4. The system of claim 1 , wherein the processing device performs further operations comprising:

identifying, among the first plurality of wordlines, a wordline having a current data state metric value satisfying a first condition; and

excluding the identified wordline from the second data integrity check.

5. The system of claim 4 , wherein the first condition comprises the current value of the data state metric being below an inclusion threshold criterion.

6. The system of claim 1 , wherein the processing device performs further operations comprising:

responsive to determining that a third data state metric value obtained from the second data integrity check satisfies a second condition, performing a media management operation with respect to one or more wordlines.

7. The system of claim 6 , wherein the second condition comprises the third data state metric value exceeding a refresh threshold criterion.

8. The system of claim 6 , wherein the media management operation comprises writing data stored at the one or more wordlines to a new block.

9. A method, comprising, by a processor, a first data integrity check on memory pages of a first set of wordlines of the memory device, wherein the data integrity check comprises determining a data state metric value of each wordline of the first set of wordlines;

performing a second data integrity check on memory pages of a second set of wordlines comprising a plurality of wordlines from the first set of wordlines;

identifying, among the first set of wordlines and the second set of wordlines, a wordline having a first data state metric value obtained from the first data integrity check equal to a second data state metric value obtained from the second data integrity check; and

performing a third data integrity check on a third set of wordlines comprising at least one wordline from the first set of wordlines, wherein the third data integrity check excludes the identified wordline.

10. The method of claim 9 , further comprising:

including the excluded wordline in a subsequent determining of further new values of the data state metric.

11. The method of claim 9 , wherein the first data state metric value comprises a residual bit error rate (RBER) value.

12. The method of claim 9 , further comprising:

identifying, among the first plurality of wordlines, a wordline having a current data state metric value satisfying a first condition; and

excluding the identified wordline from the second data integrity check.

13. The method of claim 12 , wherein the first condition comprises the current value of the data state metric being below an inclusion threshold criterion.

14. The method of claim 9 , further comprising:

responsive to determining that a third data state metric value obtained from the second data integrity check satisfies a second condition, performing a media management operation with respect to one or more wordlines.

15. The method of claim 14 , wherein the second condition comprises the third data state metric value exceeding a refresh threshold criterion.

16. The method of claim 14 , wherein the media management operation comprises writing data stored at the one or more wordlines to a new block.

17. A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device operatively coupled to a memory, performs operations comprising:

performing a first data integrity check on memory pages of a first set of wordlines of a memory device, wherein the data integrity check comprises determining a data state metric value of each wordline of the first set of wordlines;

performing a second data integrity check on memory pages of a second set of wordlines comprising a plurality of wordlines from the first set of wordlines;

identifying, among the first set of wordlines and the second set of wordlines, a wordline having a first data state metric value obtained from the first data integrity check equal to a second data state metric value obtained from the second data integrity check; and

performing a third data integrity check on a third set of wordlines comprising at least one wordline from the first set of wordlines, wherein the third data integrity check excludes the identified wordlines.

18. The non-transitory computer-readable storage medium of claim 17 , wherein the processing device performs further operations comprising:

including the excluded wordline in a subsequent determining of further new values of the data state metric.

19. The non-transitory computer-readable storage medium of claim 17 , wherein the processing device performs further operations comprising:

identifying, among the first plurality of wordlines, a wordline having a current data state metric value satisfying a first condition; and

excluding the identified wordline from the second data integrity check.

20. The non-transitory computer-readable storage medium of claim 17 , wherein the processing device performs further operations comprising:

responsive to determining that a third data state metric value obtained from the second data integrity check satisfies a second condition, performing a media management operation with respect to one or more wordlines.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 22, 2023
From: RAYAPROLU, VAMSI PAVAN; MUCHHERLA, KISHORE KUMAR; SINGIDI, HARISH R.; MALSHE, ASHUTOSH; ALSASUA, GIANNI S.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 064024/0439 →
Continuity (2)
Continuation 17094970 · Nov 11, 2020
Related Publication 20220180922A1 · Jun 9, 2022