Multi-wavelength laser inspection
An example system for inspecting a surface includes a laser, an optical system, a gated camera, and a control system. The laser is configured to emit pulses of light, with respective wavelengths of the pulses of light varying over time. The optical system includes at least one optical element, and is configured to direct light emitted by the laser to points along a scan line one point at a time. The gated camera is configured to record a fluorescent response of the surface from light having each wavelength of a plurality of wavelengths at each point along the scan line. The control system is configured to control the gated camera such that an aperture of the gated camera is open during fluorescence of the surface but closed during exposure of the surface to light emitted by the laser.
1. A system for inspecting a surface, comprising:
an optical system including at least one optical element, the optical system configured to:
direct a first pulse of light having a first wavelength to a first point along a scan line and a second pulse of light having a second wavelength to a second point along the scan line during a first time period, and
direct a third pulse of light having the first wavelength to the second point and a fourth pulse of light having the second wavelength to the first point during a second time period; and
a gated camera configured to:
record a first fluorescent response of the surface to the first pulse of light and a second fluorescent response of the surface to the second pulse of light, and
record a third fluorescent response of the surface to the third pulse of light and a fourth fluorescent response of the surface to the fourth pulse of light.
2. The system of claim 1 , wherein:
the gated camera comprises an image intensifier, and
the system further comprises a control system configured to control the image intensifier such that an aperture of the gated camera is closed during exposure of the surface to the pulses of light.
3. The system of claim 1 , further comprising a laser configured to emit the first pulse of light and the third pulse of light.
4. The system of claim 3 , wherein:
the laser comprises a shutter, and
the system further comprises a control system configured to control the shutter such that the shutter intermittingly blocks light emitted by the laser, yielding pulses of light.
5. The system of claim 4 , wherein the control system is configured to control the shutter such that the shutter blocks light emitted by the laser when an aperture of the gated camera is open.
6. The system of claim 1 , wherein directing the first pulse of light to the first point along the scan line and the second pulse of light to the second point along the scan line comprises passing the first pulse of light and the second pulse of light through a prism.
7. The system of claim 1 , wherein directing the first pulse of light to the first point along the scan line and the second pulse of light to the second point along the scan line comprises controlling a scanning mirror such that the scanning mirror is in a first position when the first pulse of light impinges on the scanning mirror and the scanning mirror is in a second position when the second pulse of light impinges on the scanning mirror.
8. The system of claim 7 , wherein directing the third pulse of light to the second point along the scan line and the fourth pulse of light to the first point along the scan line comprises controlling the scanning mirror such that the scanning mirror is in the second position when the third pulse of light impinges on the scanning mirror and the scanning mirror is in the first position when the second pulse of light impinges on the scanning mirror.
9. The system of claim 1 , further comprising a control system configured to identify a material on the surface by analyzing the first fluorescent response and the fourth fluorescent response.
10. The system of claim 9 , wherein identifying the material on the surface comprises comparing the first fluorescent response and the fourth fluorescent response to chemical signatures stored in a database of known chemical signatures.
11. The system of claim 9 , wherein the control system is further configured to:
determine that the identified material is an acceptable material; and
based on the determining, provide an acceptance indication.
12. The system of claim 9 , wherein the control system is further configured to:
determine that the identified material is not an acceptable material; and
based on the determining, provide a rejection indication.
13. A system for inspecting a surface, comprising:
an optical system including at least one optical element;
a gated camera; and
a control system configured to perform a set of acts comprising:
causing the at least one optical element to direct a first pulse of light having a first wavelength to a first point along a scan line and a second pulse of light having a second wavelength to a second point along the scan line,
causing the gated camera to record a first fluorescent response of the surface to the first pulse of light and a second fluorescent response of the surface to the second pulse of light,
causing the at least one optical element to direct a third pulse of light having the first wavelength to the second point and a fourth pulse of light having the second wavelength to the first point, and
causing the gated camera to record a third fluorescent response of the surface to the third pulse of light and a fourth fluorescent response of the surface to the fourth pulse of light.
14. The system of claim 13 , wherein the set of acts further comprise controlling an aperture of the gated camera such that the aperture is closed during exposure of the surface to the first pulse of light and the second pulse of light.
15. The system of claim 13 , further comprising a laser configured to emit the first pulse of light and the third pulse of light.
16. The system of claim 15 , wherein:
the laser comprises a shutter, and
the control system is configured to control the shutter such that the shutter intermittingly blocks light emitted by the laser, yielding pulses of light.
17. The system of claim 16 , wherein the control system is configured to control the shutter such that the shutter blocks light emitted by the laser when an aperture of the gated camera is open.
18. The system of claim 13 , wherein:
the gated camera comprises an image intensifier, and
the control system is configured to control the image intensifier such that an aperture of the gated camera is closed during exposure of the surface to the pulses of light.
19. The system of claim 13 , wherein the control system is configured to identify a material on the surface by analyzing the first fluorescent response and the fourth fluorescent response.
20. The system of claim 19 , wherein identifying the material on the surface comprises comparing the first fluorescent response and the fourth fluorescent response to chemical signatures stored in a database of known chemical signatures.