IP Library Granted Patent US 12,218,192
Granted Patent B2
US 12,218,192 · App. 17/705,980 · Granted Feb 4, 2025

Metal substrate structure for a semiconductor power module

Inventors: David Guillon (Vorderthal, CH); Harald Beyer (Lenzburg, CH); Roman Ehrbar (Zürich, CH)
Assignee: Hitachi Energy Ltd
H01L29/0649H01L29/66037
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Quick Facts
Patent No.
US 12,218,192
App. No.
17/705,980
Granted
Feb 4, 2025
Kind
B2
Abstract

A method can be used for manufacturing a metal substrate structure for a semiconductor power module. A plurality of terminals are welded to a metal top layer. After the welding, a dielectric layer is coupled between the metal top layer and a metal bottom layer. The dielectric can be laminated or molded, as examples.

Claims (43)

1. A method for manufacturing a metal substrate structure for a semiconductor power module, the method comprising:

welding a plurality of terminals to a metal top layer; and

after the welding, coupling a dielectric layer between the metal top layer and a metal bottom layer.

2. The method according to claim 1 , wherein coupling the dielectric layer between the metal top layer and the metal bottom layer comprises:

aligning the metal top layer, the dielectric layer and the metal bottom layer relative to each other; and

laminating the metal top layer, the dielectric layer and the metal bottom layer.

3. The method according to claim 1 , further comprising masking and etching a recess in the metal top layer.

4. The method according to claim 1 , further comprising stamping and/or cutting a recess in the metal top layer.

5. The method according to claim 4 , wherein the terminals are welded to the metal top layer before stamping and/or cutting the metal top layer.

6. The method according to claim 4 , wherein the terminals are welded to the metal top layer after stamping and/or cutting the metal top layer.

7. The method according to claim 1 , wherein welding the terminals to the metal top layer comprises welding by ultrasonic welding.

8. The method according to claim 1 , wherein welding the terminals to the metal top layer comprises welding by laser welding.

9. The method according to claim 1 , further comprising cleaning and/or levelling the terminals, the metal top layer, the dielectric layer and/or the metal bottom layer.

10. A method of making a semiconductor power module, the method comprising electrically coupling electronics with the metal top layer of the metal substrate structure of claim 1 .

11. The method of claim 10 , wherein the semiconductor power module comprises:

the metal bottom layer;

the metal top layer, a plurality of pads being formed within the metal top layer;

the plurality of terminals; and

the dielectric layer disposed between the metal top layer and the metal bottom layer, the dielectric layer including a ditch located in a region between a first pad and a second pad and also including a rib located in a region between the second pad and a third pad, the ditch extending below a top surface of the metal top layer and the rib protruding above the top surface of the metal top layer; and

the electronics electrically coupled with the metal top layer.

12. The semiconductor power module according to claim 11 , wherein each terminal has an L-shape including a first portion parallel to the respective pad and a second portion extending away from the respective pad, the second portion being longer than the first portion.

13. A method for manufacturing a metal substrate structure for a semiconductor power module, the method comprising:

welding a plurality of terminals to a metal top layer; and

after the welding, coupling a dielectric layer between the metal top layer and a metal bottom layer, wherein coupling the dielectric layer between the metal top layer and the metal bottom layer comprises:

providing a molding substance;

aligning the metal top layer and the metal bottom layer relative to each other with a predetermined distance in between; and

bringing the molding substance between the aligned metal top layer and the metal bottom layer and thereby forming the dielectric layer by molding.

14. A method for manufacturing a metal substrate structure for a semiconductor power module, the method comprising:

welding a plurality of terminals to a metal top layer;

forming a plurality of pad regions within the metal top layer;

after the welding, aligning the metal top layer with a metal bottom layer; and

molding a dielectric material between the aligned metal top layer and metal bottom layer.

15. The method according to claim 14 , wherein the pad regions are formed before welding the terminals to the metal top layer.

16. The method according to claim 14 , wherein the pad regions are formed after welding the terminals to the metal top layer.

17. The method according to claim 14 , wherein welding the terminals to the metal top layer comprises welding by ultrasonic welding or laser welding.

18. The method according to claim 14 , further comprising cleaning and/or levelling the terminals, the metal top layer, the dielectric material and/or the metal bottom layer.

19. A method for manufacturing a metal substrate structure for a semiconductor power module, the method comprising:

welding a plurality of terminals to a metal top layer; and

after the welding, aligning the metal top layer with a dielectric layer and a metal bottom layer;

laminating the metal top layer, the dielectric layer and the metal bottom layer; and

etching portions of the metal top layer to form electrically isolated pads, each terminal being welded to a respective one of the pads.

20. The method according to claim 19 , wherein welding the terminals to the metal top layer comprises welding by ultrasonic welding or laser welding.

21. The method according to claim 19 , further comprising cleaning and/or levelling the terminals, the metal top layer, the dielectric layer and/or the metal bottom layer.

Assignments (3)
MERGER Recorded Nov 13, 2023
From: HITACHI ENERGY SWITZERLAND AG
To: HITACHI ENERGY LTD
Reel/Frame 065548/0905 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 6, 2022
From: GUILLON, DAVID; BEYER, HARALD; EHRBAR, ROMAN
To: ABB POWER GRIDS SWITZERLAND AG
Reel/Frame 059519/0968 →
CHANGE OF NAME Recorded Apr 6, 2022
From: ABB POWER GRIDS SWITZERLAND AG
To: HITACHI ENERGY SWITZERLAND AG
Reel/Frame 060401/0355 →
Priority Claims (1)
EP 21166412 · Mar 31, 2021 · regional
Continuity (1)
Related Publication 20220344456A1 · Oct 27, 2022
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