IP Library › Patent Application 17709002
Patent Application
App. No. 17/709,002

INTELLIGENT MOTION CONTROL THROUGH SURFACE SCAN COMPARISON AND FEATURE RECOGNITION

Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US None
App. No.
17/709,002
Abstract

The disclosed technology relates to an intelligent motion control system that utilizes onboard sensors and processing to guide a surface manipulation machine along a path of travel on a surface, confirm a position of the machine with respect to the surface, and actuate a surface manipulation tool to achieve a desired surface profile or locate a point of interest. The system may include a first and second surface profiler that is configured to scan a surface on which the system travels and a positional sensor configured to generate positional data representing a position of the machine. The processor is configured to generate topography data based on output received from the first surface profiler, generate intermediate data based on output received from the second profiler, compare the intermediate data with the topography data to calculate an offset; and control motion of the system based on the offset.

Claims (9)

1 . An intelligent motion controlled machine, comprising:

a first surface profiler disposed on a leading surface of a cart, the first surface profiler configured to scan a surface on which the cart travels;

a second surface profiler disposed on an actuating tool, the second surface profiler configured to scan the surface;

a positional sensor configured to generate positional data representing a position of the cart;

a processor configured to:

generate topography data based on output received from the first surface profiler and the positional sensor;

generate intermediate data based on output received from the second profiler and the positional sensor;

compare the intermediate data with the topography data to calculate an offset; and

control motion of the cart based on the offset.