Contact probe and socket for testing electrical component
The embodiments of the present disclosure provide a contact probe and a socket for testing an electrical component. The contact probe includes: a tubular structure in which a receiving cavity is formed, and a contact part for contacting with a terminal of a first electrical component is provided at a first end of the tubular structure; a spring arranged in the receiving cavity; a plunger connected with the tubular structure in a slidable manner, wherein a first end of the plunger is provided with a spring positioning part, which abuts against the spring and is an eccentric structure arranged offset from a central axis of the plunger, a second end of the plunger projects from a second end of the tubular structure. In the contact probe of the embodiment of the present disclosure, by means of setting the spring positioning part as an eccentric structure, the effect of increasing the energized contact load of the contact probe can be achieved, thereby reducing the occurrence of the resistance value of the contact probe being greater than the allowable resistance value, and further improving the reliability of electrical testing of sockets.
1. A contact probe comprising:
a tubular structure inside which a receiving cavity is formed, wherein a contact part for contacting with a terminal of a first electrical component is provided at a first end of the tubular structure;
a spring arranged in the receiving cavity;
a plunger connected with the tubular structure in a slidable manner, wherein a first end of the plunger is provided with a spring positioning part, which abuts against the spring and is an eccentric structure arranged offset from a central axis of the plunger, a second end of the plunger projects from a second end of the tubular structure;
wherein the eccentric structure is a semicircular cone or a semicircular-like cone; or
wherein the eccentric structure is a semicircular cylinder or a semicircular-like cylinder, and the semicircular cylinder is a structure formed by cutting off a half of a complete cylinder along a longitudinal section thereof; or
wherein the eccentric structure comprises a first segment and a second segment, wherein the first segment is a semicircular cylinder, and the second segment is a semicircular-like cylinder formed by cutting off more than ½ of a volume from a complete cylinder; or
wherein the eccentric structure is a quarter cone.
2. The contact probe of claim 1 , wherein the semicircular cone has a first side surface and a second side surface intersecting with the first side surface, wherein the first side surface is a conical surface, the second side surface is planar, and the second side surface coincides with a longitudinal section of the plunger.
3. The contact probe of claim 1 , wherein the semicircular-like cone has a third side surface and a fourth side surface intersecting with the third side surface, wherein the third side surface is a conical surface, and the fourth side surface does not coincide with a longitudinal section of the plunger.
4. The contact probe of claim 3 , wherein the fourth side surface is planar and is parallel to the longitudinal section of the plunger, and the semicircular-like cone is a structure formed by cutting off more than ½ of a volume from a complete cone in a longitudinal direction.
5. The contact probe of claim 3 , wherein the fourth side surface is planar, an included angle is formed between a plane where the fourth side surface is located and the longitudinal section of the plunger, the semicircular-like cone is a structure formed by cutting off more than ½ of a volume from a complete cone in a direction inclined with respect to a longitudinal direction, and an included angle between the fourth side surface and an end surface of the plunger is an acute angle.
6. The contact probe of claim 5 , wherein the included angle is greater than or equal to 5°.
7. The contact probe of claim 5 , wherein the included angle is greater than or equal to 10°.
8. The contact probe of claim 3 , wherein the fourth side surface is planar, an included angle is formed between a plane where the fourth side surface is located and the longitudinal section of the plunger, the semicircular-like cone is a structure formed by cutting off less than ½ of a volume from a complete cone in a direction inclined with respect to a longitudinal direction, and an included angle between the fourth side surface and an end surface of the plunger is an obtuse angle.
9. The contact probe of claim 3 , wherein the fourth side surface is a spherical surface, a convex surface of which faces towards the third side surface, and the semicircular-like cone is a structure formed by cutting off more than ½ of a volume from a complete cone through the spherical surface.
10. The contact probe of claim 3 , wherein the fourth side surface is a spherical surface, a concave surface of which faces towards the third side surface, and the semicircular-like cone is a structure formed by cutting off more than ½ of a volume from a complete cone through the spherical surface.
11. The contact probe of claim 1 , wherein the semicircular-like cylinder is a structure formed by cutting off more than ½ of a volume from a complete cylinder in a longitudinal direction.
12. The contact probe of claim 1 , wherein the semicircular-like cylinder is a structure formed by cutting off less than ½ of a volume from a complete cylinder in a longitudinal direction.
13. The contact probe of claim 1 , wherein a spring baffle is provided on an inner wall of the receiving cavity, and a first end of the spring abuts against the spring baffle, a second end of the spring abuts against the spring positioning part.
14. The contact probe of claim 1 , wherein the second end of the tubular structure is formed with a through hole for the plunger to pass through, the first end of the plunger is formed with an expanded part, and an outer diameter of the expanded part is greater than a diameter of the through hole.
15. A socket for testing an electrical component, comprising:
a socket body, in which a probe receiving hole is provided;
a contact probe, which is provided in the probe receiving hole;
wherein the contact probe comprises:
a tubular structure inside which a receiving cavity is formed, wherein a contact part for contacting with a terminal of a first electrical component is provided at a first end of the tubular structure;
a spring arranged in the receiving cavity;
a plunger connected with the tubular structure in a slidable manner, wherein a first end of the plunger is provided with a spring positioning part, which abuts against the spring and is an eccentric structure arranged offset from a central axis of the plunger, a second end of the plunger projects from a second end of the tubular structure;
wherein the eccentric structure is a semicircular cone or a semicircular-like cone; or
wherein the eccentric structure is a semicircular cylinder or a semicircular-like cylinder, and the semicircular cylinder is a structure formed by cutting off a half of a complete cylinder along a longitudinal section thereof; or
wherein the eccentric structure comprises a first segment and a second segment, wherein the first segment is a semicircular cylinder, and the second segment is a semicircular-like cylinder formed by cutting off more than ½ of a volume from a complete cylinder; or
wherein the eccentric structure is a quarter cone.