Stroboscopic electron-beam signal image mapping
Pulsed beam prober systems, devices, and techniques are described herein related to providing a beam detection frequency that is less than a electrical test frequency. An electrical test signal at the electrical test frequency is provided to die under test. A pulsed beam is applied to the die such that the pulsed beam has packets of beam pulses or a frequency delta with respect to the electrical test frequency. The packets of beam pulses or the frequency delta elicits a detectable beam modulation in an imaging signal reflected from the die such that the imaging signal is modulated at a detection frequency less than the electrical test frequency.
1. A method, comprising:
providing a modulated electrical test signal to an integrated circuit structure of a die, wherein the modulated electrical test signal has a first frequency;
applying a pulsed beam to the integrated circuit structure, wherein the pulsed beam comprises one of a frequency delta relative to the first frequency or a number of packets of beam pulses at the first frequency within each packet; and
detecting an imaging signal from the integrated circuit structure at a detector, wherein the frequency delta or the packets of beam pulses establishes a modulation of the imaging signal at a second frequency less than the first frequency and distinguishable by the detector.
2. The method of claim 1 , wherein the pulsed beam comprises the number of packets of beam pulses at the first frequency within each packet, wherein temporally adjacent ones of the packets are separated by durations of fewer or no pulses.
3. The method of claim 2 , wherein the packets of beam pulses of the pulsed beam are at the second frequency.
4. The method of claim 2 , wherein the modulated electrical test signal comprises alternating on and off signal durations, and wherein the beam pulses of each packet are offset from the on and off signal durations by a time offset less than individual ones of the on or off signal durations.
5. The method of claim 4 , wherein the time offset is less than individual ones of the off signal durations, and wherein each of the beam pulses within the packet of beam pulses aligns with an individual one of the off signal durations.
6. The method of claim 1 , wherein the pulsed beam comprises a third frequency having the frequency delta relative to the first frequency.
7. The method of claim 6 , wherein the pulsed beam comprises a third frequency having the frequency delta relative to the first frequency.
8. The method of claim 7 , further comprising:
determining the third frequency as a sum of the first frequency and the second frequency.
9. The method of claim 1 , wherein the pulsed beam comprises a pulsed electron beam, the method further comprising:
evaluating the imaging signal or an electrical signal corresponding thereto using phase lock detection by providing the imaging signal or the electrical signal to a lock-in amplifier or spectrum analyzer tuned to the second frequency.
10. The method of claim 1 , wherein the pulsed beam comprises a pulsed electron beam and the detector comprises a phosphor screen detector.
11. The method of claim 1 , further comprising:
comparing an output mapping image generated using the imaging signal to a predefined output mapping to detect a failure of the integrated circuit structure.
12. A system, comprising:
a probe to provide a modulated electrical test signal to an integrated circuit structure of a die, wherein the modulated electrical test signal has a first frequency;
an electron-beam (e-beam) column to apply a pulsed electron beam to the integrated circuit structure, wherein the pulsed beam comprises one of a frequency delta relative to the first frequency or a number of packets of beam pulses at the first frequency within each packet;
a detector to detect an imaging signal from the integrated circuit structure at a detector, wherein the frequency delta or the packets of beam pulses establishes a modulation of the imaging signal at a second frequency less than the first frequency and distinguishable by the detector; and
a lock-in amplifier or spectrum analyzer tuned to the second frequency.
13. The system of claim 12 , wherein the pulsed beam comprises the number of packets of beam pulses at the first frequency within each packet, wherein temporally adjacent ones of the packets are separated by durations of fewer or no pulses.
14. The system of claim 13 , wherein the packets of beam pulses of the pulsed beam are at the second frequency.
15. The system of claim 12 , wherein the pulsed electron beam comprises a third frequency having the frequency delta relative to the first frequency.
16. The system of claim 15 , wherein the frequency delta is substantially equal to the second frequency.
17. The system of claim 12 , wherein the detector comprises a phosphor screen detector.
18. A system, comprising:
a memory to store a data structure corresponding to a modulated electrical test signal; and
processor circuitry coupled to the memory, the processor circuitry to:
control a probe to provide the modulated electrical test signal to an integrated circuit structure of a die, wherein the modulated electrical test signal has a first frequency;
control a beam column to apply a pulsed beam to the integrated circuit structure, wherein the pulsed beam comprises one of a frequency delta relative to the first frequency or a number of packets of beam pulses at the first frequency within each packet;
receive an imaging signal from the integrated circuit structure at a detector, wherein the frequency delta or the packets of beam pulses establishes a modulation of the imaging signal at a second frequency less than the first frequency; and
generate an image based on the imaging signal.
19. The system of claim 18 , wherein the pulsed beam comprises the number of packets of beam pulses at the first frequency within each packet, wherein temporally adjacent ones of the packets are separated by durations of fewer or no pulses.
20. The system of claim 19 , wherein the packets of beam pulses of the pulsed beam are at the second frequency.
21. The system of claim 18 , wherein the pulsed beam comprises a third frequency having the frequency delta relative to the first frequency.
22. The system of claim 21 , wherein the frequency delta is substantially equal to the second frequency.