Force deflection and resistance testing system and method of use
A testing system for electrical interconnects having a removable device under test printed circuit board (DUT PCB) that electrically connects with the electrical testing components of the system. A removable top plate is placed on top of the DUT PCB and is locked in place by a plurality of locking posts that selectively connect to cam surfaces in the top plate that pull the top plate down sandwiching the DUT PCB between the top plate and the electrical testing components of the system. An actuator is also presented that presses the device under test into the electrical interconnect at increments where tests are performed on one, some or all of the contact points of the electrical interconnect. This information is then analyzed and graphed to assist with determine the optimum force and/or height to use during actual use.
1. A method of testing an electrical interconnect, the steps comprising:
providing an electrical interconnect testing device;
providing an electrical interconnect having a plurality of contact points;
attaching the electrical interconnect to the electrical interconnect testing device;
providing a device under test having a plurality of contact points;
aligning the plurality of contact points of the device under test with the plurality of contact points of the electrical interconnect;
pressing the device under test into the electrical interconnect with a plurality of different levels of force; and
taking at least one measurement of at least one electrical property at the plurality of different levels of force.
2. The method of claim 1 , further comprising the step of taking a position measurement at the plurality of different levels of force.
3. The method of claim 1 , wherein the at least one electrical property is resistance; and
wherein the measurement of the at least one electrical property is taken on one of the plurality of contact points of the electrical interconnect.
4. The method of claim 1 , wherein the measurement of the at least one electrical property is taken on a group of the plurality of contact points of the electrical interconnect.
5. The method of claim 1 , wherein the measurement of the at least one electrical property is taken on all of the plurality of contact points of the electrical interconnect.
6. The method of claim 1 , further comprising:
providing an actuator configured to press on the device under test in the electrical interconnect;
moving the actuator in a plurality of increments thereby pressing the device under test into the electrical interconnect with the plurality of different levels of force;
wherein the actuator is held within a gantry;
wherein the actuator facilitates movement in the Z axis or vertical axis to press down upon the device under test; and
wherein the gantry facilitates movement in the X axis and Y axis.
7. The method of claim 1 , further comprising the step of cycling the device under test through the plurality of different levels of force multiple times to provide statistically improved results.
8. The method of claim 1 , wherein pressing the device under test into the electrical interconnect with the plurality of different levels of force includes moving the device under test to a plurality of height increments.
9. The method of claim 1 , further comprising the step of providing software associated with the electrical interconnect testing device and creating a testing recipe that specifies the plurality of different levels of force and specifies the plurality of contact points of the electrical interconnect that are tested.
10. The method of claim 1 , further comprising the step of outputting results of the test and graphing the results.
11. The method of claim 1 , further comprising the step of selecting an optimum vertical height for testing based on results of the test.
12. The method of claim 1 , further comprising the step of selecting an optimum force for testing based on results of the test.
13. The method of claim 1 , wherein the device under test is a shorting device or a reference standard.
14. A test method, the steps comprising:
providing an electrical interconnect testing device;
providing an electrical interconnect having a plurality of contact points;
attaching the electrical interconnect to the electrical interconnect testing device;
providing a semiconductor chip device having a plurality of contact points;
aligning the plurality of contact points of the semiconductor chip device with the plurality of contact points of the electrical interconnect after the electrical interconnect has been attached to the electrical interconnect testing device such that the plurality of contact points of the semiconductor chip device connect with the plurality of contact points of the electrical interconnect;
pressing the semiconductor chip device into the electrical interconnect with a plurality of different levels of force;
and
wherein the electrical interconnect testing device is capable of taking a resistance measurement on one of the plurality of contact points of the electrical interconnect, or a combination of the plurality of contact points of the electrical interconnect at the plurality of different levels of force.
15. The method of claim 14 , further comprising taking a position measurement at the plurality of different levels of force.
16. The method of claim 14 , wherein the semiconductor chip device is a shorting device or a reference standard.
17. The method of claim 14 ,
wherein the resistance measurement is taken on one of the plurality of contact points of the electrical interconnect.
18. The method of claim 14 , wherein the resistance measurement is taken on a group of the plurality of contact points of the electrical interconnect.
19. The method of claim 14 , wherein the resistance measurement is taken on all of the plurality of contact points of the electrical interconnect.
20. The method of claim 14 , further comprising:
providing an actuator configured to press on the semiconductor chip device in the electrical interconnect;
moving the actuator in a plurality of increments thereby pressing the semiconductor chip device into the electrical interconnect with the plurality of different levels of force;
wherein the actuator is held within a gantry;
wherein the actuator facilitates movement in the Z axis or vertical axis to press down upon the semiconductor chip device; and
wherein the gantry facilitates movement in the X axis and Y axis.
21. The method of claim 14 , wherein pressing the semiconductor chip device into the electrical interconnect with the plurality of different levels of force includes moving the semiconductor chip device to a plurality of height increments.
22. The method of claim 14 , further comprising outputting results of the test and graphing the results.
23. The method of claim 14 , further comprising the step of selecting an optimum vertical height for testing based on results of the test.
24. The method of claim 14 , further comprising the step of selecting an optimum force for testing based on results of the test.
25. An apparatus, comprising:
an electrical interconnect testing device;
an electrical interconnect having a plurality of contact points,
one or more connectors, the connectors configured to attach the electrical interconnect to the electrical interconnect testing device;
wherein the electrical interconnect is configured to receive a device under test;
wherein the electrical interconnect includes a raised peripheral edge configured to align
a plurality of contact points of the device under test with the plurality of contact points of the electrical interconnect;
an actuator;
wherein the actuator is configured to press the device under test into the electrical interconnect with a plurality of different levels of force; and
wherein the electrical interconnect testing device is configured to take at least one resistance measurement at the plurality of different levels of force.
26. The apparatus of claim 25 , wherein the electrical interconnect testing device is configured to take a position measurement at the plurality of different levels of force.
27. The apparatus of claim 25 , wherein the electrical interconnect testing device is configured to take a resistance measurement on one of the plurality of contact points of the electrical interconnect.
28. The apparatus of claim 25 , wherein the electrical interconnect testing device is configured to take a resistance measurement on a group of the plurality of contact points of the electrical interconnect.
29. The apparatus of claim 25 , wherein the electrical interconnect testing device is configured to take a resistance measurement on all of the plurality of contact points of the electrical interconnect.
30. The apparatus of claim 25 , wherein the actuator is held within a gantry, wherein the actuator facilitates movement in the Z axis or vertical axis to press down upon the device under test, and wherein the gantry facilitates movement in the X axis and Y axis.
31. The apparatus of claim 25 , wherein the actuator is configured to cycle through the plurality of different levels of force multiple times to provide statistically improved results.
32. The apparatus of claim 25 , wherein the electrical interconnect testing device is configured to output results of a test and graph the results.
33. The apparatus of claim 25 , wherein the electrical interconnect testing device is configured to select an optimum vertical height for testing based on results of a test.
34. The apparatus of claim 25 , wherein the device under test is a shorting device or a reference standard.
35. A method, the steps comprising:
providing at least one electrical interconnect testing device;
providing at least one electrical interconnect having a plurality of contact points;
attaching the at least one electrical interconnect to the at least one electrical interconnect testing device;
providing at least one device under test having a plurality of contact points;
aligning the plurality of contact points of the at least one device under test with the plurality of contact points of the at least one electrical interconnect;
pressing the at least one device under test into the at least one electrical interconnect with a plurality of different levels of force; and
taking at least one measurement of at least one electrical property at the plurality of different levels of force.
36. The method of claim 35 , further comprising the step of taking a position measurement at the plurality of different levels of force.
37. The method of claim 35 , wherein the at least one electrical property includes resistance; and
wherein the at least one measurement of the at least one electrical property is taken on one of the plurality of contact points of the at least one electrical interconnect.
38. The method of claim 35 , wherein the at least one device under test is a shorting device or a reference standard.
39. A method, the steps comprising:
providing at least one electrical interconnect testing device;
providing at least one electrical interconnect having a plurality of contact points;
attaching the at least one electrical interconnect to the at least one electrical interconnect testing device;
providing at least one device under test having a plurality of contact points;
aligning the plurality of contact points of the at least one device under test with the plurality of contact points of the at least one electrical interconnect;
measuring at least one electrical property while pressing the at least one device under test into the at least one electrical interconnect to determine an effective test range of the at least one electrical interconnect for at least one testing parameter.
40. The method of claim 39 , further comprising, using the at least one electrical interconnect, testing a set of devices with the at least one testing parameter in the determined effective test range.
41. The method of claim 39 , further comprising determining an optimum value for the at least one testing parameter.
42. The method of claim 39 , further comprising determining an optimum value for the at least one testing parameter;
wherein the at least one testing parameter includes height of the at least one device under test relative to the at least one electrical interconnect.
43. The method of claim 39 , further comprising determining an optimum value for the at least one testing parameter;
wherein the at least one testing parameter includes a level of force that the at least one device under test is pressed into the at least one electrical interconnect.
44. The method of claim 39 , wherein the measuring of the at least one electrical property while pressing the at least one device under test into the at least one electrical interconnect includes pressing the at least one device under test into the at least one electrical interconnect to a plurality of positions.
45. The method of claim 39 , wherein the at least one device under test is a shorting device or a reference standard.
46. The method of claim 39 , wherein the measurement of the at least one electrical property is taken on a group of the plurality of contact points of the at least one electrical interconnect.
47. The method of claim 39 , wherein the measurement of the at least one electrical property is taken on all of the plurality of contact points of the at least one electrical interconnect.