IP Library Granted Patent US 12,255,630
Granted Patent B2
US 12,255,630 · App. 17/719,311 · Granted Mar 18, 2025

Transversely-excited film bulk acoustic resonator with oxide strip acoustic confinement structures

Inventors: Andrew Kay (Provo, UT); Sean McHugh (Santa Barbara, CA); John Koulakis (Los Angeles, CA); Albert Cardona (Santa Barbara, CA)
Assignee: Murata Manufacturing Co., Ltd.
H03H9/568H03H3/02H03H9/02157H03H9/02228H03H9/205
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Quick Facts
Patent No.
US 12,255,630
App. No.
17/719,311
Granted
Mar 18, 2025
Kind
B2
Abstract

Acoustic resonators, filters, and methods. A filter includes a piezoelectric plate supported by a substrate; and three or more diaphragms of the piezoelectric plate spanning a respective cavity in the substrate. A conductor pattern on the plate has interdigital transducers (IDTs) of three or more acoustic resonators. Each IDT has two sets of interleaved fingers extending from two busbars respectively. Overlapping portions of the fingers define an aperture of each acoustic resonator. Sometimes, each of the resonators has two dielectric strips that overlap the IDT fingers in first and second margins of the aperture and that extend into first and second gaps between the first and second margins and the busbars. Other times, the first and second dielectric strips are on the front surface of the plate, have a first portion under the IDT fingers and have a second portion extending into a gap between the margins and the busbars.

Claims (72)

1. A filter comprising three or more acoustic resonators including:

a substrate;

a piezoelectric layer supported by the substrate;

a diaphragm comprising a respective portion of the piezoelectric layer that is over a cavity; and

a conductor pattern on the piezoelectric layer, the conductor pattern comprising an interdigital transducer (IDT) having first and second sets of interleaved fingers extending from first and second busbars, respectively,

wherein overlapping portions of the interleaved fingers define an aperture of the respective acoustic resonator,

wherein each of the three or more acoustic resonators further comprises:

a first dielectric strip that overlaps the interleaved fingers in a first margin of the aperture and extends into a first gap between the first margin and the first busbar; and

a second dielectric strip that overlaps the interleaved fingers in a second margin of the aperture and extends into a second gap between the second margin and the second busbar, and

wherein a thickness ts of each of the first and second dielectric strips of a first acoustic resonator of the three or more acoustic resonators is different than a thickness ts of each of the first and second dielectric strips of a second and a third acoustic resonator of the three or more acoustic resonators.

2. The filter of claim 1 , wherein the thickness ts of each of the first and second dielectric strips of the second acoustic resonator of the three or more acoustic resonators is different than the thickness ts of each of the first and second dielectric strips of the third acoustic resonator of the three or more acoustic resonators.

3. The filter of claim 2 , wherein the piezoelectric layer is one of Z-cut lithium niobate and Z-cut lithium tantalate, and wherein the first acoustic resonator of the three or more acoustic resonators is a shunt resonator and the second and third acoustic resonators of the three or more acoustic resonators are series resonators.

4. The filter of claim 3 , wherein:

each of the first and second dielectric strips of the first and second acoustic resonators has a first thickness ts 1 ; and

each of the first and second dielectric strips of the third acoustic resonator has a second different thickness ts 2 .

5. The filter of claim 4 , wherein:

a thickness td of the piezoelectric layer is 370 nm;

a thickness of a dielectric horizontally between fingers of the first acoustic resonator is 130 nm thick;

a thickness of a dielectric horizontally between fingers of the second and third acoustic resonators is 30 nm thick;

the first thickness ts 1 is 15 nm or 0.03 td for the first acoustic resonator;

the first thickness ts 1 is 15 nm or 0.0375 td for the second acoustic resonator; and

the first thickness ts 1 is 25 nm or 0.0625 td for the third acoustic resonator.

6. The filter of claim 1 , wherein each of the first and second dielectric strips extend over an entire length of the IDT of each of the three or more acoustic resonators; wherein at least one of a width ds of each of the first and second dielectric strips, or a width dol of each of the first and second margins of the aperture varies along a length of the IDT of each acoustic resonator; and wherein, in an aperture direction, the width ds or dol changes one of linearly or cyclically from a minimum value ts min to a maximum value of ts max .

7. A filter comprising:

a substrate;

a piezoelectric layer supported by the substrate;

three or more diaphragms, each diaphragm comprising a respective portion of the piezoelectric layer that is over a cavity; and

a conductor pattern on a front surface of the piezoelectric layer, the conductor pattern comprising interdigital transducers (IDTs) of three or more acoustic resonators, each IDT comprising first and second sets of interleaved fingers extending from first and second busbars respectively,

wherein;

the interleaved fingers extend onto a respective diaphragm of the three or more diaphragms, and

overlapping portions of the interleaved fingers define an aperture of the respective acoustic resonator;

wherein at least one of the three or more acoustic resonators further comprises:

a first dielectric strip on the front surface of the piezoelectric layer, a first portion of the first dielectric strip under the IDT fingers in a first margin of the aperture and a second portion of the first dielectric strip extending into a first gap between the first margin and the first busbar; and

a second dielectric strip on the front surface of the piezoelectric layer, a first portion of the second dielectric strip under the IDT fingers in a second margin of the aperture and a second portion of the second dielectric strip extending into a second gap between the second margin and the second busbar.

8. The filter of claim 7 , wherein each of the three or more acoustic resonators further comprises the first and second dielectric strip; wherein a thickness ts of each of the first and second dielectric strips of a first acoustic resonator of the three or more acoustic resonators is different than a thickness ts of each of the first and second dielectric strips of a second and a third acoustic resonator of the three or more acoustic resonators; and wherein a thickness ts of each of the first and second dielectric strips of the second acoustic resonator of the three or more acoustic resonators is different than a thickness ts of each of the first and second dielectric strips of the third acoustic resonator of the three or more acoustic resonators.

9. The filter of claim 8 , wherein the piezoelectric layer is one of Z-cut lithium niobate and Z-cut lithium tantalate, and wherein the first acoustic resonator of the three or more acoustic resonators is a shunt resonator and the second and third acoustic resonator of the three or more acoustic resonators are series resonators.

10. The filter of claim 9 , wherein:

each of the three or more acoustic resonators further comprises the first and second dielectric strip;

each of the first and second dielectric strips of the first and second acoustic resonators has a first thickness ts 1 ; and

each of the first and second dielectric strips of the third acoustic resonator has a second different thickness ts 2 .

11. The filter of claim 10 , wherein:

a thickness td of the piezoelectric layer is 370 nm;

a thickness of a dielectric horizontally between fingers of the first acoustic resonator is 130 nm thick;

a thickness of a dielectric horizontally between fingers of the second and third acoustic resonators is 30 nm thick;

the first thickness ts 1 is 15 nm or 0.03 td for the first acoustic resonator;

the first thickness ts 1 is 15 nm or 0.0375 td for the second acoustic resonator; and

the first thickness ts 1 is 25 nm or 0.0625 td for the third acoustic resonator.

12. The filter of claim 7 , wherein each of the three or more acoustic resonators further comprises the first and second dielectric strip; wherein each of the first and second dielectric strips extend over an entire length of the IDT of each acoustic resonator of the three or more acoustic resonators; wherein at least one of a width ds of each of the first and second dielectric strips, or a width dol of each of the first and second margins of the aperture varies along a length off the IDT of each acoustic resonator; and wherein in an aperture direction, the width ds or dol changes one of linearly or cyclically from a minimum value ts min to a maximum value of ts max .

13. A filter comprising:

three or more acoustic resonators, each of the three or more acoustic resonators including:

a substrate;

a piezoelectric layer supported by the substrate and that includes a diaphragm that is over a cavity; and

a conductor pattern on the piezoelectric layer, the conductor pattern comprising an interdigital transducer (IDT) having first and second sets of interleaved fingers extending from first and second busbars, respectively,

wherein overlapping portions of the interleaved fingers define an aperture of the respective acoustic resonator,

wherein at least one acoustic resonator of the three or more acoustic resonators further comprises:

a first dielectric strip that overlaps the interleaved fingers in a first margin of the aperture and extends into a first gap between the first margin and the first busbar; and

a second dielectric strip that overlaps the interleaved fingers in a second margin of the aperture and extends into a second gap between the second margin and the second busbar, and

wherein each of the first and second dielectric strips extend over an entire length of the IDT of the at least one acoustic resonator, and at least one of a width ds of each of the first and second dielectric strips or a width dol of each of the first and second margins of the aperture varies along a length of the IDT of the at least one acoustic resonator.

14. The filter of claim 13 , wherein, in an aperture direction, the width ds or the width dol changes one of linearly or cyclically from a minimum value ts min to a maximum value of ts max .

15. The filter of claim 13 , wherein each of the three or more acoustic resonators further comprises the first and second dielectric strip, and a thickness ts of each of the first and second dielectric strips of a first acoustic of the three or more acoustic resonators is different than a thickness ts of each of the first and second dielectric strips of a second and a third acoustic resonator of the three or more acoustic resonators.

16. The filter of claim 15 , wherein the thickness ts of each of the first and second dielectric strips of the second acoustic resonator of the three or more acoustic resonators is different than the thickness ts of each of the first and second dielectric strips of the third acoustic resonator of the three or more acoustic resonators.

17. The filter of claim 13 , wherein the piezoelectric layer is one of Z-cut lithium niobate and Z-cut lithium tantalate, and wherein a first acoustic resonator of the three or more acoustic resonators is a shunt resonator and a second and third acoustic resonators of the three or more acoustic resonators are series resonators.

18. The filter of claim 17 , wherein:

each of the first and second dielectric strips of the first and second acoustic resonators has a first thickness ts 1 ; and

each of the first and second dielectric strips of the third acoustic resonator has a second different thickness ts 2 .

19. The filter of claim 18 , wherein:

a thickness td of the piezoelectric layer is 370 nm;

a thickness of a dielectric horizontally between fingers of the first acoustic resonator is 130 nm thick;

a thickness of a dielectric horizontally between fingers of the second and third acoustic resonators is 30 nm thick;

the first thickness ts 1 is 15 nm or 0.03 td for the first acoustic resonator;

the first thickness ts 1 is 15 nm or 0.0375 td for the second acoustic resonator; and

the first thickness ts 1 is 25 nm or 0.0625 td for the third acoustic resonator.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 18, 2022
From: RESONANT INC.
To: MURATA MANUFACTURING CO., LTD
Reel/Frame 061966/0748 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 14, 2022
From: KAY, ANDREW; MCHUGH, SEAN; KOULAKIS, JOHN; CARDONA, ALBERT
To: RESONANT INC.
Reel/Frame 059604/0334 →
Continuity (8)
Continuation In Part 17555353 · Dec 17, 2021
Continuation In Part 17542290 · Dec 3, 2021
Provisional Application 63237050 · Aug 25, 2021
Provisional Application 63208503 · Jun 9, 2021
Provisional Application 63191897 · May 21, 2021
Provisional Application 63187932 · May 12, 2021
Provisional Application 63182465 · Apr 30, 2021
Related Publication 20220360251A1 · Nov 10, 2022
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