Ion production system with efficient ion collection
A system includes an ion source configured to generate ions having a first polarity, one or more extraction electrodes configured to extract the ions from the ion source as an ion beam having an extraction energy, a mass resolving slit or aperture configured to select a desired isotope from the ion beam such that a desired isotopic ion beam passes through the mass resolving slit or aperture, a target positioned relative to the mass resolving slit or aperture so that the desired isotopic ion beam is incident on the target, and a voltage source coupled to the target and configured to hold the target at a first voltage having the first polarity. The first voltage causes a reduction of the extraction energy as the desired isotopic ion beam approaches the target to minimize sputtering and maximize collection of the ions on the target to reconstitute an ionized material.
1. A system, comprising:
an ion source configured to generate ions having a first polarity;
one or more extraction electrodes configured to extract the ions from the ion source as an ion beam having an extraction energy;
a mass resolving slit or aperture configured to select a desired isotope from the ion beam such that a desired isotopic ion beam passes through the mass resolving slit or aperture;
a target positioned relative to the mass resolving slit or aperture so that the desired isotopic ion beam is incident on the target, wherein the target comprises a carbon fiber material; and
a voltage source coupled to the target and configured to hold the target at a first voltage having the first polarity, wherein the first voltage causes a reduction of the extraction energy as the desired isotopic ion beam approaches the target and at least one of minimizes sputtering, reduces heat load on the target, or maximizes collection of the ions on the target to reconstitute an ionized material.
2. The system of claim 1 , wherein the first voltage is less than the extraction energy.
3. The system of claim 2 , wherein the first voltage is greater than 95% of the extraction energy.
4. The system of claim 2 , wherein the first voltage is greater than 99% of the extraction energy.
5. The system of claim 1 , wherein the first voltage is less than the extraction energy by an amount that corresponds to a thermal energy of the ions.
6. The system of claim 1 , wherein the extraction energy is between 20 kV and 80 kV.
7. The system of claim 1 , wherein the extraction energy is between 40 kV and 60 kV.
8. The system of claim 1 , wherein the first voltage is approximately 100 V less than the extraction energy such that the desired isotopic ion beam has an energy of approximately 100 V when the desired isotopic ion beam reaches the target.
9. The system of claim 1 , wherein the first polarity is positive.
10. The system of claim 1 , wherein the target is configured to collect the ionized material as a film on the target.
11. The system of claim 1 , further comprising a magnetic analyzer between the one or more extraction electrodes and the mass resolving slit or aperture, wherein the magnetic analyzer is configured to generate a magnetic field configured to cause a separation of the desired isotopes from other isotopes of the ion beam.
12. The system of claim 1 , wherein the ions comprise ytterbium ions.
13. The system of claim 1 , wherein the target comprises a crystal structure.
14. A method for collecting ions, comprising:
generating, by an ion source, ions having a first polarity;
extracting, by one or more extraction electrodes, the ions from the ion source as an ion beam having an extraction energy;
selecting, by a mass resolving slit or aperture, a desired isotope from the ion beam by allowing a desired isotopic ion beam to pass through the mass resolving slit or aperture;
positioning a target relative to the mass resolving slit or aperture such that the ion beam is incident on the target;
holding, by a voltage source coupled to the target, the target at a voltage having the first polarity such that the voltage causes a reduction of the extraction energy as the desired isotopic ion beam approaches the target and at least one of minimizes sputtering, reduces heat load on the target, or maximizes collection of the ions on the target to reconstitute an ionized material; and
collecting the ions on the target; and
removing the collected ions from the target as a constituted ionized material.
15. The method of claim 14 , wherein the target comprises a carbon fiber material.
16. The method of claim 14 , wherein the voltage and the extraction energy differ by an amount corresponding to a thermal energy of the ions.
17. The method of claim 14 , wherein extracting, by one or more extraction electrodes, the ions from the ion source as the ion beam comprises accelerating the ions out of the ion source by holding the one or more extraction electrodes at an extraction voltage, wherein the extraction voltage has the first polarity and is greater than the voltage of the target.
18. The method of claim 14 , wherein the extraction energy is greater than the voltage.
19. The method of claim 14 , wherein the ions comprise ytterbium atoms.
20. A system, comprising:
an ion source configured to generate ions having a first polarity, wherein the ions comprise ytterbium ions;
one or more extraction electrodes configured to extract the ions from the ion source as an ion beam having an extraction energy;
a mass resolving slit or aperture configured to select a desired isotope from the ion beam such that a desired isotopic ion beam passes through the mass resolving slit or aperture;
a target positioned relative to the mass resolving slit or aperture so that the desired isotopic ion beam is incident on the target; and
a voltage source coupled to the target and configured to hold the target at a first voltage having the first polarity, wherein the first voltage causes a reduction of the extraction energy as the desired isotopic ion beam approaches the target and at least one of minimizes sputtering, reduces heat load on the target, or maximizes collection of the ions on the target to reconstitute an ionized material.
21. A method for collecting ions, comprising:
generating, by an ion source, ions having a first polarity;
extracting, by one or more extraction electrodes, the ions from the ion source as an ion beam having an extraction energy;
selecting, by a mass resolving slit or aperture, a desired isotope from the ion beam by allowing a desired isotopic ion beam to pass through the mass resolving slit or aperture;
positioning a target relative to the mass resolving slit or aperture such that the ion beam is incident on the target;
holding, by a voltage source coupled to the target, the target at a voltage having the first polarity such that the voltage causes a reduction of the extraction energy as the desired isotopic ion beam approaches the target and at least one of minimizes sputtering, reduces heat load on the target, or maximizes collection of the ions on the target to reconstitute an ionized material, wherein the voltage and the extraction energy differ by an amount corresponding to a thermal energy of the ions; and
collecting the ions on the target.
22. The method of claim 21 , wherein the target comprises a carbon fiber material.
23. The method of claim 22 , further comprising removing the collected ions from the target as a constituted ionized material.
24. A method for collecting ions, comprising:
generating, by an ion source, ions having a first polarity, wherein the ions comprise ytterbium atoms;
extracting, by one or more extraction electrodes, the ions from the ion source as an ion beam having an extraction energy;
selecting, by a mass resolving slit or aperture, a desired isotope from the ion beam by allowing a desired isotopic ion beam to pass through the mass resolving slit or aperture;
positioning a target relative to the mass resolving slit or aperture such that the ion beam is incident on the target;
holding, by a voltage source coupled to the target, the target at a voltage having the first polarity such that the voltage causes a reduction of the extraction energy as the desired isotopic ion beam approaches the target and at least one of minimizes sputtering, reduces heat load on the target, or maximizes collection of the ions on the target to reconstitute an ionized material, wherein the voltage and the extraction energy differ by an amount corresponding to a thermal energy of the ions; and
collecting the ions on the target.
25. The method of claim 24 , wherein the target comprises a carbon fiber material.