IP Library › Granted Patent US 12,172,886
Granted Patent B2
US 12,172,886 · App. 17/747,856 · Granted Dec 24, 2024

Micro-electro-mechanical system (MEMS) vibration sensor and fabricating method thereof

Inventors: Hsien-Lung Ho (New Taipei, TW); Hsi-Wen Tung (New Taipei, TW)
Assignee: UPBEAT TECHNOLOGY CO., LTD
B81B3/0021B81B7/02B81C1/00373B81B2201/0257B81B2203/04B81C2201/013B81C2201/0156
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Quick Facts
Patent No.
US 12,172,886
App. No.
17/747,856
Granted
Dec 24, 2024
Kind
B2
Abstract

A MEM vibration sensor includes a substrate including a first supporting-portion and a cavity and a sensing-device disposed on the substrate. The sensing-device includes a second supporting-portion correspondingly disposed over and connected with the first supporting-portion, a first sensing-unit disposed on the cavity, a first mass-block disposed on the cavity, a second sensing-unit disposed on the first sensing-unit and the first mass-block, a first metal pad disposed on the third supporting-portion and electrically coupled with the first sensing-unit, and a second metal pad disposed on the third supporting-portion and electrically coupled with the second sensing-unit.

Claims (22)

1. A micro-electro-mechanical system (MEMS) vibration sensor, comprising:

a substrate, comprising a first supporting-portion and a cavity; and

a sensing-device disposed on the substrate, comprising:

a second supporting-portion, correspondingly disposed over and connected with the first supporting-portion via a first dielectric material;

a first sensing-unit, disposed on the cavity and connected to the second supporting-portion;

a first mass-block, disposed on the cavity;

a second sensing-unit, disposed on the first sensing-unit and the first mass-block, wherein the second sensing-unit connects to the first mass-block via a second dielectric material; and a gap is forming between the second sensing-unit and the first sensing-unit; wherein the second sensing-unit further comprises a third supporting-portion correspondingly disposed over and connected to the second supporting-portion via a third dielectric material;

a first metal pad, disposed on the third supporting-portion and electrically coupled with the first sensing-unit; and

a second metal pad, disposed on the third supporting-portion and electrically coupled with the second sensing-unit.

2. The MEMS vibration sensor according to claim 1 , wherein the second supporting-portion, the first sensing-unit and the first mass-block are included in a patterned first device material layer; and the third supporting-portion and the second sensing-unit are included in a patterned second device material layer.

3. The MEMS vibration sensor according to claim 2 , wherein the patterned first device material layer comprises metal and a semiconductor material.

4. The MEMS vibration sensor according to claim 2 , wherein the patterned second device material layer comprises metal and a semiconductor material.

5. The MEMS vibration sensor according to claim 1 , wherein the first sensing-unit further comprises a plurality of through holes.

6. The MEMS vibration sensor according to claim 1 , wherein an opening is formed between the first mass-block and the first sensing-unit and surrounds the first mass-block, so as to make the first mass-block and the first sensing-unit being independent of each other.

7. The MEMS vibration sensor according to claim 1 , wherein the third supporting-portion further comprises a first portion and a second portion electrically isolated from each other; the first metal pad is formed on the first portion; and the second metal pad is formed on the second portion.

8. The MEMS vibration sensor according to claim 1 , further comprising a second mass-block disposed in the cavity and connected to the first mass-block via a fourth dielectric material.

9. The MEMS vibration sensor according to claim 8 , wherein the second mass-block shifts within a limited range in the cavity in conjunction with actions of the second sensing-unit.

10. The MEMS vibration sensor according to claim 8 , wherein the second mass-block and the first supporting-portion are made of the same material; the fourth dielectric material and the first dielectric material are made of the same material.

11. The MEMS vibration sensor according to claim 1 , wherein the second dielectric material and the third dielectric material are made of the same material.

12. The MEMS vibration sensor according to claim 1 , further comprising a plurality of dimples/bumps disposed between the second sensing-unit and the first sensing-unit.

13. The MEMS vibration sensor according to claim 1 , wherein the plurality of dimples/bumps are connected to the second sensing-unit.

14. The MEMS vibration sensor according to claim 1 , further comprising a protection layer formed on a first surface of the second sensing-unit facing the first sensing-unit or on a second surface of the second sensing-unit away from the first sensing-unit, wherein the protection layer comprises a plurality of dimples/bumps disposed between the second sensing-unit and the first sensing-unit.

Assignments (2)
CORRECTIVE ASSIGNMENT TO CORRECT THE THE ASSIGNEE NAME AND ADDRESS PREVIOUSLY RECORDED AT REEL: 059950 FRAME: 0994. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded May 20, 2022
From: HO, HSIEN-LUNG; TUNG, HSI-WEN
To: UPBEAT TECHNOLOGY CO., LTD
Reel/Frame 060136/0157 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 18, 2022
From: HO, HSIEN-LUNG; TUNG, HSI-WEN
To: SAMSUNG DISPLAY CO., LTD.
Reel/Frame 059950/0994 →
Continuity (2)
Provisional Application 63189749 · May 18, 2021
Related Publication 20220371881A1 · Nov 24, 2022
Cited By (1)
US 12,704,929