IP Library › Granted Patent US 12,191,367
Granted Patent B2
US 12,191,367 · App. 17/752,888 · Granted Jan 7, 2025

Multi-finger transistor structure and method of manufacturing the same

Inventors: Su Xing (Singapore, SG); Purakh Raj Verma (Singapore, SG); Rudy Octavius Sihombing (North Sumatera, ID); Shyam Parthasarathy (Singapore, SG); Jinyu Liao (Singapore, SG)
Assignee: UNITED MICROELECTRONICS CORP.
H01L29/4238H01L21/823418H01L21/823481H01L29/0653H01L29/41758
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Quick Facts
Patent No.
US 12,191,367
App. No.
17/752,888
Granted
Jan 7, 2025
Kind
B2
Abstract

A multi-finger transistor structure is provided in the present invention, including multiple active areas, a gate structure consisting of multiple gate parts and connecting parts, wherein each gate part crosses over one of the active areas and each connecting part alternatively connects one end and the other end of the gate parts so as to form a meander gate structure, and multiple sources and drains, wherein one source and one drain are set between two adjacent gate parts, and each gate parts is accompanied by one source and one drain at two sides respectively, and the distance between the drain and the gate part is larger than the distance between the source and the gate part, so that the source and the drain are asymmetric with respect to the corresponding gate part, and air gaps are formed in the dielectric layer between each drain and the corresponding gate part.

Claims (13)

1. A multi-finger transistor structure, comprising:

multiple active areas;

a gate structure, comprising multiple gate parts and multiple connecting parts, wherein each said gate part traverses one of said active areas, and each connecting part alternatively connect one end and the other end of two adjacent said gate parts, so as to form meander said gate structure;

multiple sources and drains, wherein one of said sources and one of said drains are set between two adjacent said gate parts, and one of said sources and one of said drains are set at two sides of each said gate part, and a distance between said drain and corresponding said gate part is larger than a distance between said source and corresponding said gate part; and

air gaps in a dielectric layer between each said drain and corresponding said gate part.

2. The multi-finger transistor structure of claim 1 , further comprising multiple contacts on each said drains and each said source, wherein a distance between said contacts on said drain and corresponding said gate part is larger than a distance between said contacts on said source and corresponding said gate part, so that said contacts on said source and said contacts on corresponding said drain are asymmetric with respect to corresponding said gate part.

3. The multi-finger transistor structure of claim 2 , wherein said contacts on each said source connect to one corresponding first metal layer, and said contacts on each said drain connect to another corresponding first metal layer.

4. The multi-finger transistor structure of claim 1 , further comprising multiple contacts on each said connecting part.

5. The multi-finger transistor structure of claim 1 , wherein said air gaps are further between adjacent said drain and said source.

6. The multi-finger transistor structure of claim 1 , wherein multiple said air gaps are formed in said dielectric layer between each said drain and corresponding said gate part.

7. The multi-finger transistor structure of claim 1 , wherein said dielectric layer comprises an interlayer dielectric layer, a first inter-metal layer and a second inter-metal layer.

8. The multi-finger transistor structure of claim 1 , wherein said gate structure connects to a radio frequency input, and said source connects to a ground, and said drain connects to a radio frequency output.

9. The multi-finger transistor structure of claim 1 , wherein a shallow trench isolation is formed between adjacent said active areas to isolate therebetween.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 25, 2022
From: XING, SU; VERMA, PURAKH RAJ; SIHOMBING, RUDY OCTAVIUS; PARTHASARATHY, SHYAM; LIAO, JINYU
To: UNITED MICROELECTRONICS CORP.
Reel/Frame 060008/0042 →
Priority Claims (1)
CN 202111397934.X · Nov 19, 2021 · national
Continuity (1)
Related Publication 20230163184A1 · May 25, 2023
References Cited (1)
US 10847466B2 · Saka · 2020 [cited by applicant]