IP Library › Granted Patent US 11,988,729
Granted Patent B2
US 11,988,729 · App. 17/761,065 · Granted May 21, 2024

Measuring device and measuring method

Inventors: Norikazu Mizuochi (Kyoto, JP); Ernst David Herbschleb (Kyoto, JP)
Assignees: KYOTO UNIVERSITY; SUMIDA CORPORATION
G01R33/323G01N24/006
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,988,729
App. No.
17/761,065
Granted
May 21, 2024
Kind
B2
Abstract

In a measurement using a quantum sensor, the range of measurable physical quantities is increased while maintaining sensor sensitivity. A measuring device ( 10 ) comprises an irradiation unit ( 2 ) that irradiates a quantum sensor element ( 1 ) with electromagnetic waves for operating an electron spin state of the quantum sensor element ( 1 ) that changes due to interaction ( 8 ) with a measurement target ( 9 ), in a pulse sequence in which a time τ between n/2 pulses is a variable value; and a physical quantity measuring unit ( 3 ) that calculates a physical quantity of the measurement target based on the electron spin state after the interaction with the measurement target ( 9 ).

Claims (29)

1. A measuring device comprising:

an irradiation unit that irradiates a quantum sensor element with electromagnetic waves for operating an electron spin state of the quantum sensor element that changes due to interaction with a measurement target, in a pulse sequence in which a time τ between π/2 pulses is a variable value according to the intensity of a physical quantity of the measurement target; and

a physical quantity measuring unit that calculates the physical quantity of the measurement target based on the electron spin state after the interaction with the measurement target.

2. A measuring method comprising the steps of:

irradiating a quantum sensor element with electromagnetic waves for operating an electron spin state of the quantum sensor element that changes due to interaction with a measurement target, in a pulse sequence in which a time τ between π/2 pulses is a variable value according to the intensity of a physical quantity of the measurement target; and

calculating the physical quantity of the measurement target based on the electron spin state after the interaction with the measurement target.

3. The measuring device according to claim 1 , wherein the irradiation unit irradiates the quantum sensor element with the electromagnetic waves for operation in a plurality of pulse sequences with different times τ between π/2 pulses.

4. The measuring device according to claim 3 , wherein the physical quantity measuring unit calculates the physical quantity by combining a plurality of the electron spin states in a plurality of the pulse sequences based on a method of inferential statistics.

5. The measuring device according to claim 4 , wherein the method of inferential statistics is Bayes' estimation.

6. The measuring device according to claim 1 , wherein the pulse sequence comprises:

application of a first π/2 pulse to tilt an electron spin along a quantization axis to a plane perpendicular to the quantization axis,

application of a π pulse to invert the electron spin dephased by the interaction with the measurement target in the plane after a first time τ 1 from the first π/2 pulse, and

application of a second π/2 pulse to project the dephased electron spin onto the quantization axis after a second time τ 2 from the π pulse; and

wherein the first time τ 1 and the second time τ 2 are variable values according to the intensity of the physical quantity of the measurement target.

7. The measuring device according to claim 1 , wherein the pulse sequence comprises:

application of a third π/2 pulse to tilt an electron spin along a quantization axis to a plane perpendicular to the quantization axis, and

application of a fourth π/2 pulse to project the electron spin dephased by the interaction with the measurement target onto the quantization axis after a third time τ 3 from the third π/2 pulse; and

wherein the third time τ 3 is a variable value according to the intensity of the physical quantity of the measurement target.

8. The measuring device according to claim 1 , wherein the physical quantity measuring unit comprises:

a light irradiation part that irradiates the quantum sensor element with light for reading phase information of the electron spin state after the interaction with the measurement target;

a detection part that detects a change generated in the quantum sensor element due to the irradiation of the light; and

a data processing part that reads the phase information from the detected change and calculates the physical quantity based on the read phase information.

9. The measuring device according to claim 1 , wherein the quantum sensor element is a sensor element having a color center.

10. The measuring device according to claim 9 , wherein the color center is a complex of nitrogen (N) replacing a carbon atom and a vacancy (V) adjacent to the nitrogen.

11. The measuring device according to claim 1 , wherein the physical quantity measuring unit calculates at least one of a magnetic field, an electric field, a temperature, and a dynamic quantity as the physical quantity related to interaction with the electron spin.

12. The measuring method according to claim 2 , wherein the step of calculating the physical quantity comprises:

irradiating the quantum sensor element with light for reading phase information of the electron spin state after the interaction with the measurement target;

detecting a change generated in the quantum sensor element due to the irradiation of the light; and

reading the phase information from the detected change and calculating the physical quantity based on the read phase information.

Assignments (3)
CORRECTIVE ASSIGNMENT TO CORRECT THE THE SECOND ASSIGNEE'S ADDRESS PREVIOUSLY RECORDED AT REEL: 060569 FRAME: 0954. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Aug 1, 2022
From: KYOTO UNIVERSITY
To: KYOTO UNIVERSITY; SUMIDA CORPORATION
Reel/Frame 061007/0153 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 20, 2022
From: KYOTO UNIVERSITY
To: KYOTO UNIVERSITY; SUMIDA CORPORATION
Reel/Frame 060569/0954 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 16, 2022
From: MIZUOCHI, NORIKAZU; HERBSCHLEB, ERNST DAVID
To: KYOTO UNIVERSITY
Reel/Frame 059285/0724 →
Priority Claims (1)
JP 2019-168515 · Sep 17, 2019 · national
Continuity (1)
Related Publication 20220349964A1 · Nov 3, 2022