Parallel bus phase correction method and device
View Patent ↗A parallel bus phase correction method and a device are provided. The method comprises: correcting a data bus, respectively performing phase correction tests on a clock line; determining a first optimal window of the clock line according to the clock test results; correcting the clock line by using a median value of the first optimal window, respectively performing phase correction tests on the data bus according to the multiple second phase adjustment values, and recording corresponding data test results; determining a second optimal window of the data bus according to the data test results; and performing phase correction on normal data transmission on the basis of the median value of the first optimal window and the median value of the second optimal window. The method achieves phase correction and ensures the correctness and accuracy of data transmission, even if a small clock offset is present.
1. A parallel bus phase correction method, comprising the following steps:
correcting a data bus by using a minimum value in multiple preset second phase adjustment values of the data bus, respectively performing phase correction tests on a clock line according to multiple preset first phase adjustment values of the clock line, and recording corresponding clock test results;
determining a first optimal window of the clock line according to the clock test results;
correcting the clock line by using a median value of the first optimal window, respectively performing phase correction tests on the data bus according to the multiple second phase adjustment values, and recording corresponding data test results;
determining a second optimal window of the data bus according to the data test results; and
performing phase correction on normal data transmission on the basis of the median value of the first optimal window and the median value of the second optimal window.
2. The method of claim 1 , wherein the correcting a data bus by using a minimum value in multiple preset second phase adjustment values of the data bus, respectively performing phase correction tests on a clock line according to multiple preset first phase adjustment values of the clock line, and recording corresponding clock test results further comprises:
correcting the data bus according to the minimum second phase adjustment value;
respectively performing phase correction and testing on the clock line in an order from smallest to largest according to the multiple first phase adjustment values; and
recording the corresponding clock test results according to a test order.
3. The method of claim 2 , wherein the determining a first optimal window of the clock line according to the clock test results further comprises:
setting a number of consecutive first phase adjustment values whose clock test results are correct to a phase adjustment window, and taking the phase adjustment window containing the largest number of the first phase adjustment values as the first optimal window.
4. The method of claim 1 , wherein the correcting the clock line by using a median value of the first optimal window, respectively performing phase correction on the data bus according to the multiple second phase adjustment values, and recording corresponding data test results further comprises:
correcting the clock line according to the median value of the first optimal window;
respectively performing phase correction and testing on the bus of each bit in the data bus in an order from smallest to largest according to the multiple second phase adjustment values; and
recording the corresponding data test results of the bus of each bit according to a test order.
5. The method of claim 4 , wherein the determining a second optimal window of the data bus according to the data test results further comprises:
for the bus of each bit, setting a number of consecutive second phase adjustment values whose data test results are correct to a phase adjustment window, and taking the phase adjustment window containing the largest number of the second phase adjustment values as the second optimal window of the bus of the corresponding bit.
6. The method of claim 1 , wherein the phase correction tests further comprise:
generating a clock sequence and a test sequence;
sending and receiving the clock sequence and the test sequence on the clock line and the data bus; and
verifying the received test sequence to judge whether the reception of the data is correct.
7. A parallel bus phase correction device, comprising:
at least one processor; and
a memory, wherein the memory stores program instructions executable by the processors, and the program instructions perform the following steps when executed by the processors: correcting the data bus by using a minimum value in multiple preset second phase adjustment values of the data bus, respectively performing phase correction tests on the clock line according to multiple preset first phase adjustment values of the clock line, and recording corresponding clock test results;
determining a first optimal window of the clock line according to the clock test results;
correcting the clock line by using a median value of the first optimal window, respectively performing phase correction tests on the data bus according to the multiple second phase adjustment values, and recording corresponding data test results;
determining a second optimal window of the data bus according to the data test results; and
performing phase correction on normal data transmission on the basis of the median value of the first optimal window and the median value of the second optimal window.
8. The device of claim 7 , wherein the correcting a data bus by using a minimum value in multiple preset second phase adjustment values of the data bus, respectively performing phase correction tests on a clock line according to multiple preset first phase adjustment values of the clock line, and recording corresponding clock test results further comprises:
correcting the data bus according to the minimum second phase adjustment value;
respectively performing phase correction and testing on the clock line in an order from smallest to largest according to the multiple first phase adjustment values; and
recording the corresponding clock test results according to a test order; moreover, the determining a first optimal window of the clock line according to the clock test results further comprises:
setting a number of consecutive first phase adjustment values whose clock test results are correct to a phase adjustment window, and taking the phase adjustment window containing the largest number of the first phase adjustment values as the first optimal window.
9. The device of claim 7 , wherein the correcting the clock line by using a median value of the first optimal window, respectively performing phase correction on the data bus according to the multiple second phase adjustment values, and recording corresponding data test results further comprises:
correcting the clock line according to the optimal first phase adjustment value;
respectively performing phase correction and testing on the bus of each bit in the data bus in an order from smallest to largest according to the multiple second phase adjustment values; and
recording the corresponding data test results of the bus of each bit according to a test order;
moreover,
the determining a second optimal window of the data bus according to the data test results further comprises:
for the bus of each bit, setting a number of consecutive second phase adjustment values whose data test results are correct to a phase adjustment window, and taking the phase adjustment window containing the largest number of the second phase adjustment values as the second optimal window of the bus of the corresponding bit.
10. The device of claim 7 , wherein the phase correction tests further comprise:
generating a clock sequence and a test sequence;
sending and receiving the clock sequence and the test sequence on the clock line and the data bus; and
verifying the received test sequence to judge whether the reception of the data is correct.