Ultrasonic testing apparatus with variable frequency
The present invention relates to an ultrasonic testing apparatus with a variable frequency, which can automatically change the frequency according to thickness and thereby detect internal defects in objects having various thicknesses. The ultrasonic testing apparatus may comprise: a nozzle jetting a medium toward an object so as to form a medium column; and a plurality of probes disposed in the nozzle so as to generate ultrasonic waves.
1. An ultrasonic testing apparatus, comprising:
a nozzle jetting a medium towards an object to form a medium column; and
a plurality of probes disposed on the nozzle to oscillate an ultrasonic wave, and
an ultrasonic reflector rotatably installed between the plurality of probes in the nozzle so that an ultrasonic wave of a probe selected from the plurality of probes is transmitted to the object.
2. The ultrasonic testing apparatus of claim 1 , wherein a relationship between an inner diameter d of the nozzle and a width w or a diameter of a probe surface of a probe is established in the following [Equation 1]
d/ 2< w<d [Equation 1].
3. The ultrasonic testing apparatus of claim 1 , wherein the plurality of probes oscillate ultrasonic waves having different frequencies.
4. The ultrasonic testing apparatus of claim 3 , wherein the plurality of probes are fixedly installed to be spaced apart from each other on a sidewall of the nozzle.
5. The ultrasonic testing apparatus of claim 1 , wherein the ultrasonic reflector comprises a material reflecting ultrasonic waves and which is not corroded by the medium.
6. The ultrasonic testing apparatus of claim 1 , wherein the ultrasonic reflector is fixed to a rotation shaft installed across an inside of the nozzle, and a motor installed outside the nozzle is connected to one end of the rotation shaft.
7. The ultrasonic testing apparatus of claim 6 , further comprising:
a main controller receiving thickness information of the object;
an on-off controller for a probe selecting the probe from the plurality of probes based on the thickness information of the object transmitted from the main controller;
a first pulser receiver and a second pulser receiver selectively oscillating an ultrasonic wave of a corresponding probe according to a command of the on-off controller for probe; and
a direction controller for an ultrasonic reflector controlling a rotation angle of the ultrasonic reflector by operating the motor based on the thickness information of the object transmitted from the main controller.
8. The ultrasonic testing apparatus of claim 1 , further comprising:
a medium circulation unit forming a medium column by jetting the medium from the nozzle, recovering the medium falling from the medium column, and circulating the medium back to the nozzle.
9. The ultrasonic testing apparatus of claim 8 , wherein the medium circulation unit includes:
a medium receiver installed outside the nozzle and receiving the medium falling from the medium column;
a recovery pipe connected to the medium receiver;
a supply pipe supplying the medium of the recovery pipe to the nozzle; and
a circulation pump installed between the recovery pipe and the supply pipe to provide jetting pressure to the nozzle.
10. An ultrasonic testing apparatus, comprising:
a nozzle jetting a medium towards an object to form a medium column;
a plurality of probes disposed on the nozzle to oscillate an ultrasonic wave; and
a plurality of inlet waveguides,
wherein the nozzle includes one outlet waveguide,
the plurality of inlet waveguides are branched from the outlet waveguide and having the plurality of probes distributed to each of the plurality of inlet waveguides.
11. The ultrasonic testing apparatus of claim 10 , wherein the plurality of probes are respectively installed inside the corresponding inlet waveguide, and
the medium supplied to the inlet waveguide is jetted through the outlet waveguide.
12. The ultrasonic testing apparatus of claim 10 , wherein an ultrasonic velocity V 1 in a medium in the waveguide is smaller than an ultrasonic velocity V 2 in an inner interface of the waveguide, and
in a portion in which the plurality of inlet waveguides are coupled to one outlet waveguide, an angle θ between a propagation direction of the ultrasonic wave traveling from the inlet waveguide to the outlet waveguide and a direction perpendicular to an inner interface of the outlet waveguide is greater than a critical angle θc, and
the critical angle θc is defined by the following Equation 2,
θ
C
=
arcsin
(
V
1
V
2
)
.
[
Equation
2
]
13. The ultrasonic testing apparatus of claim 10 , further comprising:
a main controller receiving thickness information of the object;
an on-off controller for probe selecting the probe from the plurality of probes based on the thickness information of the object transmitted from the main controller; and
a first pulser receiver and a second pulser receiver selectively oscillating an ultrasonic wave of a corresponding probe according to a command of the on-off controller for probe.