IP Library Patent Application 17783915
Patent Application
App. No. 17/783,915

DEVICE AND METHOD FOR GENERATING TEST DATA FOR TESTING A DISTANCE DETERMINATION IN AN OPTICAL TIME-OF-FLIGHT MEASUREMENT

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Patent No.
US None
App. No.
17/783,915
Abstract

A device for generating test data for testing a distance determination during an optical runtime measurement, comprising: A test pattern generator, which is set up to generate a chronological sequence of test events, so as to provide the latter to a test histogram channel for generating time-correlated test histogram data for testing the distance determination during the optical runtime measurement.

Claims (21)

1 . A device for generating test data for testing a distance determination during an optical runtime measurement, comprising:

A test pattern generator, which is set up to generate a chronological sequence of test events, so as to provide the latter to a test histogram channel for generating time-correlated test histogram data for testing the distance determination during the optical runtime measurement.

2 . The device according to claim 1 , wherein a time distance between two times of two chronologically sequential test events in the generated chronological sequence of test events is based upon a time resolution of the optical runtime measurement.

3 . The device according to claim 2 , wherein the chronological sequence of test events is generated based upon at least one input parameter.

4 . The device according to claim 2 , wherein the input parameter is an image counter.

5 . The device according to claim 2 , wherein the input parameter is a line index of a receiving matrix.

6 . The device according to claim 2 , wherein the input parameter is a system time.

7 . The device according to claim 2 , further comprising:

A hash generator, which is set up to generate a bit vector from the input parameters, and apply a hash function to the latter, so as to generate a binary sequence.

8 . The device according to claim 7 , wherein the chronological sequence of test events is further generated based upon the binary sequence.

9 . The device according to claim 1 , wherein the test events in the chronological sequence of test events are identical.

10 . A measuring device for testing a distance determination during an optical runtime measurement, comprising:

A device for generating test data for testing a distance determination during an optical runtime measurement, said device comprising a test pattern generator, which is set up to generate a chronological sequence of test events, so as to provide the latter to a test histogram channel for generating time-correlated test histogram data for testing the distance determination during the optical runtime measurement; and

at least one test histogram channel, which is set up to receive the chronological sequence of test events generated by the test pattern generator, and generate time-correlated test histogram data based thereupon.

11 . The measuring device according to claim 10 , wherein the test histogram channel provides the generated time-correlated test histogram data to a peak detection unit, which determines distances therefrom.

12 . The measuring device according to claim 11 , further comprising:

A test unit, which is set up to receive the distances determined by the peak detection unit and receive times of the chronological sequence of test events, so as to determine nominal distances from these times.

13 . The measuring device according to claim 12 , wherein the test unit is further set up to generate an error signal based upon a deviation between the determined distances and the nominal distances.

14 . The measuring device according to claim 13 , wherein the error signal is generated based upon a deviation that lies outside of a tolerance range

15 . A method for generating test data for testing a distance determination during an optical runtime measurement, comprising:

Generation of a chronological sequence of test events, so as to provide the latter to a test histogram channel for generating time-correlated test histogram data for testing the distance determination during the optical runtime measurement.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 3, 2023
From: BEUSCHEL, RALF
To: IBEO AUTOMOTIVE SYSTEMS GMBH
Reel/Frame 063518/0146 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 22, 2023
From: MICROVISION GMBH
To: MICROVISION, INC.
Reel/Frame 063061/0272 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 7, 2023
From: IBEO AUTOMOTIVE SYSTEMS GMBH
To: MICROVISION GMBH
Reel/Frame 062973/0909 →