IP Library › Granted Patent US 12,557,649
Granted Patent B2
US 12,557,649 · App. 17/806,189 · Granted Feb 17, 2026

Semiconductor module

Inventor: Kosuke Yamaguchi (Tokyo, JP)
Assignee: Mitsubishi Electric Corporation
H01L23/3735H01L23/3672
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Quick Facts
Patent No.
US 12,557,649
App. No.
17/806,189
Granted
Feb 17, 2026
Kind
B2
Abstract

An object is to provide a semiconductor module capable achieving both a heat radiation property and an insulation property. A semiconductor module includes: a substrate having a main surface and a main surface on a side opposite to the main surface; a semiconductor device mounted on the main surface; and a heat sink attached to the main surface via an insulation sheet having a thermal conductivity, wherein the substrate includes a through hole passing from the main surface to the main surface, the semiconductor device includes a plurality of electrodes exposed from a surface facing the main surface and a protrusion formed between the plurality of electrodes to be inserted through the through hole, and the insulation sheet is formed so that a length in a thickness direction of the substrate is larger than a length of a tip end portion of the protrusion protruding from the through hole.

Claims (31)

1 . A semiconductor module, comprising:

a substrate having a first main surface and a second main surface on a side opposite to the first main surface in a first direction;

a semiconductor device mounted on the first main surface;

a joint material that joins the semiconductor device to the substrate; and

a heat sink attached to the second main surface via an insulation member having a thermal conductivity, wherein

the substrate includes a first through-hole passing from the first main surface to the second main surface,

the semiconductor device includes a plurality of electrodes on and exposed from a surface facing the first main surface, the plurality of electrodes being electrically connected to a metal pattern of the substrate by way of the joint material,

the semiconductor device includes a protrusion formed directly between the plurality of electrodes in a second direction perpendicular to the first direction, the protrusion being in direct contact with the plurality of electrodes, and the protrusion being inserted through the first through-hole, and the protrusion being a continuous structure with the semiconductor device, the protrusion extending from the semiconductor device, and

the insulation member is formed so that a length in a thickness direction of the substrate is larger than a length of a tip end portion of the protrusion protruding from the first through-hole.

2 . A semiconductor module, comprising:

a substrate having a first main surface and a second main surface on a side opposite to the first main surface;

a semiconductor device mounted on the first main surface; and

a heat sink attached to the second main surface via an insulation member having a thermal conductivity, wherein

the substrate includes a first through-hole passing from the first main surface to the second main surface,

the semiconductor device includes a plurality of electrodes exposed from a surface facing the first main surface and a protrusion formed between the plurality of electrodes to be inserted through the first through-hole,

the insulation member is formed so that a length in a thickness direction of the substrate is smaller than a length of a tip end portion of the protrusion protruding from the first through-hole, and

a groove in which the tip end portion of the protrusion is housed via the insulation member is formed in a surface of the heat sink facing the insulation member such that the insulation member extends along the second main surface between the substrate and the heat sink and across the groove.

3 . The semiconductor module according to claim 1 comprising a heat radiation plate having a length in a thickness direction of the substrate smaller than a length of the heat sink in place of the heat sink.

4 . The semiconductor module according to claim 2 comprising a heat radiation plate having a length in a thickness direction of the substrate smaller than a length of the heat sink in place of the heat sink.

5 . The semiconductor module according to claim 1 , wherein

a second through-hole passing from the first main surface to the second main surface is formed in the substrate separately from the first through-hole, and

a metal pattern covering the second through-hole is provided on the first main surface and the second main surface.

6 . The semiconductor module according to claim 2 , wherein

a second through-hole passing from the first main surface to the second main surface is formed in the substrate separately from the first through-hole, and

a metal pattern covering the second through-hole is provided on the first main surface and the second main surface.

7 . The semiconductor module according to claim 5 , wherein

the second through-hole is filled with a grease having a heat radiation property or a gel having a thermal conductivity.

8 . The semiconductor module according to claim 6 , wherein

the second through-hole is filled with a grease having a heat radiation property or a gel having a thermal conductivity.

9 . The semiconductor module according to claim 1 , wherein the semiconductor device is mounted on top of the first main surface and the plurality of electrodes are entirely above the first main surface.

10 . The semiconductor module according to claim 1 , wherein a thermal conductivity of the protrusion has a greater magnitude than a thermal conductivity of the substrate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 9, 2022
From: YAMAGUCHI, KOSUKE
To: MITSUBISHI ELECTRIC CORPORATION
Reel/Frame 060152/0706 →
Priority Claims (1)
JP 2021-133190 · Aug 18, 2021 · national
Continuity (1)
Related Publication 20230057915A1 · Feb 23, 2023
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