IP Library › Granted Patent US 12,487,528
Granted Patent B2
US 12,487,528 · App. 17/817,104 · Granted Dec 2, 2025

Resist composition and method for producing resist pattern

Inventors: Hiromu Nakamura (Osaka, JP); Koji Ichikawa (Osaka, JP)
Assignee: SUMITOMO CHEMICAL COMPANY, LIMITED
G03F7/039C08F212/24C08F220/06C08F220/281C08F220/282G03F7/038
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,487,528
App. No.
17/817,104
Granted
Dec 2, 2025
Kind
B2
Abstract

A resist composition includes (A1) a resin including a structural unit represented by formula (I) and a structural unit represented by formula (II), and no acid-labile group, (A2) a resin having an acid-labile group, and an acid generator: wherein R 1 and R 2 each represent a hydrogen atom, a halogen atom, or an alkyl group which may have a halogen atom, X 1 and X 2 each represent a single bond or *—CO—O—, L 1 represents a single bond or a hydrocarbon group which may have a substituent, and —CH 2 — included in the group may be replaced by —O—, —S—, —SO 2 — or —CO—, ring W represents a hydrocarbon ring which may have a substituent, mi and mk represent an integer of 1 to 4, and L 2 represents a single bond or a hydrocarbon group which may have a substituent, and —CH 2 — included in the group may be replaced by —O—, —S—, —SO 2 — or —CO—.

Claims (51)

1 . A resist composition comprising:

(A1) a resin which includes a structural unit represented by formula (I) and a structural unit represented by formula (II), and also has no acid-labile group,

(A2) a resin having an acid-labile group, and,

an acid generator:

wherein, in formula (I),

R 1 represents a hydrogen atom, a halogen atom, or an alkyl group having 1 to 6 carbon atoms which may have a halogen atom,

X 1 represents a single bond or *—CO—O—, and * represents a bonding site to carbon atoms to which R 1 is bonded,

L 1 represents a single bond, or a hydrocarbon group having 1 to 28 carbon atoms which may have a substituent, and —CH 2 — included in the hydrocarbon group may be replaced by —O—, —S—, —SO 2 — or —CO—,

ring W represents a hydrocarbon ring having 3 to 18 carbon atoms which may have a substituent, and

mi represents an integer of 1 to 4, and

wherein, in formula (II),

R 2 represents a hydrogen atom, a halogen atom, or an alkyl group having 1 to 6 carbon atoms which may have a halogen atom,

X 2 represents a single bond or *—CO—O—, and * represents a bonding site to carbon atoms to which R 2 is bonded,

L 2 represents a single bond, or a hydrocarbon group having 1 to 28 carbon atoms which may have a substituent other than a fluorine atom and an alkyl fluoride group, and —CH 2 — included in the hydrocarbon group may be replaced by —O—, —S—, —SO 2 — or —CO—, and

mk represents an integer of 1 to 4.

2 . The resist composition according to claim 1 , wherein the ring W is a ring represented by any one of formula (w1-1) to formula (w1-3), formula (w1-6), formula (w1-15), formula (w1-22) and formula (w1-23):

wherein, in formula (w1-1) to formula (w1-3), formula (w1-6), formula (w1-15), formula (w1-22) and formula (w1-23),

the ring may have a substituent, and the bonding site is any position.

3 . The resist composition according to claim 1 , wherein L 1 is a single bond, a chain hydrocarbon group having 1 to 6 carbon atoms which may have a substituent wherein —CH 2 — included in the chain hydrocarbon group may be replaced by —O— or —CO—, or a group obtained by combining a chain hydrocarbon group having 1 to 4 carbon atoms which may have a substituent with a cyclic hydrocarbon group having 3 to 18 carbon atoms which may have a substituent wherein —CH 2 — included in the chain hydrocarbon group may be replaced by —O— or —CO—, and —CH 2 — included in the cyclic hydrocarbon group may be replaced by —O— or —CO—.

4 . The resist composition according to claim 1 , wherein L 2 is a chain hydrocarbon group having 1 to 9 carbon atoms which may have a substituent wherein —CH 2 — included in the chain hydrocarbon group may be replaced by —O— or —CO— or a cyclic hydrocarbon group having 3 to 16 carbon atoms which may have a substituent wherein —CH 2 — included in the cyclic hydrocarbon group may be replaced by —O— or —CO—.

5 . The resist composition according to claim 1 , wherein the resin having an acid-labile group includes at least one selected from the group consisting of a structural unit represented by formula (a1-0), a structural unit represented by formula (a1-1) and a structural unit represented by formula (a1-2):

wherein, in formula (a1-0), formula (a1-1) and formula (a1-2),

L a01 , L a1 and L a2 each independently represent —O— or *—O—(CH 2 ) k1 —CO—O—, k1 represents an integer of 1 to 7, and * represents a bonding site to —CO—,

R a01 , R a4 and R a5 each independently represent a hydrogen atom, a halogen atom, or an alkyl group having 1 to 6 carbon atoms which may have a halogen atom,

R a02 , R a03 and R a04 each independently represent an alkyl group having 1 to 8 carbon atoms, an alicyclic hydrocarbon group having 3 to 18 carbon atoms, an aromatic hydrocarbon group having 6 to 18 carbon atoms, or a group obtained by combining these groups,

R a6 and R a7 each independently represent an alkyl group having 1 to 8 carbon atoms, an alkenyl group having 2 to 8 carbon atoms, an alicyclic hydrocarbon group having 3 to 18 carbon atoms, an aromatic hydrocarbon group having 6 to 18 carbon atoms, or a group formed by combining these groups,

m1 represents an integer of 0 to 14,

n1 represents an integer of 0 to 10, and

n1′ represents an integer of 0 to 3.

6 . The resist composition according to claim 1 , wherein the resin having an acid-labile group includes a structural unit represented by formula (a2-A):

wherein, in formula (a2-A),

R a50 represents a hydrogen atom, a halogen atom, or an alkyl group having 1 to 6 carbon atoms which may have a halogen atom,

R a51 represents a halogen atom, a hydroxy group, an alkyl group having 1 to 6 carbon atoms, an alkoxy group having 1 to 6 carbon atoms, an alkoxyalkyl group having 2 to 12 carbon atoms, an alkoxyalkoxy group having 2 to 12 carbon atoms, an alkylcarbonyl group having 2 to 4 carbon atoms, an alkylcarbonyloxy group having 2 to 4 carbon atoms, an acryloyloxy group or a methacryloyloxy group,

A a50 represents a single bond or *—X a51 -(A a52 -X a52 ) nb —, and * represents a bonding site to carbon atoms to which —R a50 is bonded,

A a52 represents an alkanediyl group having 1 to 6 carbon atoms,

X a51 and X a52 each independently represent —O—, —CO—O— or —O—CO—,

nb represents 0 or 1, and

mb represents an integer of 0 to 4, and when mb is an integer of 2 or more, a plurality of R a51 may be the same or different from each other.

7 . The resist composition according to claim 1 , wherein the acid generator comprises a salt represented by formula (B1):

wherein, in formula (B1),

Q b1 and Q b2 each independently represent a hydrogen atom, a fluorine atom, an alkyl group having 1 to 6 carbon atoms, or a perfluoroalkyl group having 1 to 6 carbon atoms,

L b1 represents a divalent saturated hydrocarbon group having 1 to 24 carbon atoms, —CH 2 — included in the divalent saturated hydrocarbon group may be replaced by —O— or —CO—, and a hydrogen atom included in the divalent saturated hydrocarbon group may be substituted with a fluorine atom or a hydroxy group,

Y represents a methyl group which may have a substituent, or an alicyclic hydrocarbon group having 3 to 24 carbon atoms which may have a substituent, and —CH 2 — included in the alicyclic hydrocarbon group may be replaced by —O—, —S—, —SO 2 — or —CO—, and

Z1 + represents an organic cation.

8 . The resist composition according to claim 1 , further comprising a salt generating an acid having an acidity lower than that of an acid generated from the acid generator.

9 . A method for producing a resist pattern, which comprises:

(1) a step of applying the resist composition according to any one of claims 1 to 8 on a substrate,

(2) a step of drying the applied resist composition to form a composition layer,

(3) a step of exposing the composition layer,

(4) a step of heating the exposed composition layer, and

(5) a step of developing the heated composition layer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 6, 2022
From: NAKAMURA, HIROMU; ICHIKAWA, KOJI
To: SUMITOMO CHEMICAL COMPANY, LIMITED
Reel/Frame 061334/0683 →
Priority Claims (1)
JP 2021-129697 · Aug 6, 2021 · national
Continuity (1)
Related Publication 20230113512A1 · Apr 13, 2023
References Cited (22)
US 9671693B2 · Ichikawa · 2017 [cited by examiner]
US 9897914B2 · Hatakeyama · 2018 [cited by examiner]
US 11327398B2 · Koh · 2022 [cited by examiner]
US 12050402B2 · Adachi · 2024 [cited by examiner]
US 12222648B2 · Shimada · 2025 [cited by examiner]
US 20070178405A1 · Kanda et al. · 2007 [cited by applicant]
US 20070254235A1 · Allen et al. · 2007 [cited by applicant]
US 20080305433A1 · Kanda et al. · 2008 [cited by applicant]
US 20100136482A1 · Harada et al. · 2010 [cited by applicant]
US 20120064459A1 · Maeda et al. · 2012 [cited by applicant]
US 20120077125A1 · Shiono · 2012 [cited by examiner]
US 20120115085A1 · Kanda et al. · 2012 [cited by applicant]
US 20140065546A1 · Hatakeyama · 2014 [cited by applicant]
US 20150185609A1 · Kanda et al. · 2015 [cited by applicant]
US 20160170300A1 · Masuyama et al. · 2016 [cited by applicant]
US 20160363866A1 · Hatakeyama · 2016 [cited by examiner]
US 20160377979A1 · Miyagawa · 2016 [cited by examiner]
US 20170123318A1 · Kanda et al. · 2017 [cited by applicant]
US 20200096866A1 · Masuyama · 2020 [cited by examiner]
US 20210311392A1 · Kita · 2021 [cited by examiner]
JP 2007304537A · 2007 [cited by applicant]
Search Report and Written Opinion issued Feb. 27, 2023, by the Belgium Patent Office in corresponding Belgium National Registration No. BE202205614, and an English translation of the Written Opinion. (14 pages). [cited by applicant]