IP Library Granted Patent US 12,480,757
Granted Patent B2
US 12,480,757 · App. 17/829,379 · Granted Nov 25, 2025

Method for distance measurement by means of OCT and associated computer program product

Inventors: Martin Stambke (Dunningen, DE); Jan-Patrick Hermani (Markgroeningen, DE)
Assignee: TRUMPF LASER GMBH
G01B11/026B23K26/032G01B9/02091G01B11/0608G01B9/0209G01B11/0675
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Quick Facts
Patent No.
US 12,480,757
App. No.
17/829,379
Granted
Nov 25, 2025
Kind
B2
Abstract

A method for distance measurement includes: (a) measuring a focus distance between a z-focus position of a processing laser beam and a reference surface, and measuring a reference distance between a reference arm mirror of a coherence tomography apparatus and the reference surface using a measurement beam. The processing laser beam is directed onto the reference surface via a laser processing optical unit. The measurement beam is directed onto a same point of the reference surface as the processing beam or onto a point of the reference surface next to an impingement point of the processing beam. The method further includes (b) measuring a workpiece distance between the reference arm mirror and a workpiece surface using the measurement beam directed onto the workpiece surface, and (c) determining the distance between workpiece surface and the z-focus position based on the reference distance and the workpiece distance and the focus distance.

Claims (13)

1 . A method for distance measurement using an optical coherence tomography apparatus, the method comprising:

(a) measuring a focus distance between a z-focus position of a processing laser beam and a reference surface, the processing laser beam being directed onto the reference surface via a laser processing optical unit,

directing a measurement beam onto the reference surface, and measuring a reference distance between a reference arm mirror of the coherence tomography apparatus and the reference surface using the measurement beam, the measurement beam being directed onto a same point of the reference surface as the processing beam or onto a point of the reference surface next to an impingement point of the processing beam;

(b) directing the measurement beam onto a workpiece surface, and measuring a workpiece distance between the reference arm mirror and the workpiece surface using the measurement beam, and

(c) determining the distance between workpiece surface and the z-focus position based on the reference distance and the workpiece distance and the measured focus distance.

2 . The method as claimed in claim 1 , wherein, in step (a), the processing laser beam and the measurement beam are directed onto the reference surface perpendicularly.

3 . The method as claimed in claim 1 , wherein, in step (b), the measurement beam is directed onto the workpiece surface perpendicularly or obliquely.

4 . The method as claimed in claim 1 , wherein, in step (c), a movement of a processing head or of a focusing optical unit of the processing head that has taken place in a z-direction between step (a) and step (b) is taken into account when determining the distance.

5 . The method as claimed in claim 1 , wherein in step (b) the measurement beam is directed onto the workpiece surface by the laser processing optical unit or by an x-y relative movement between the laser processing optical unit and the workpiece.

6 . The method as claimed in claim 1 , wherein the z-focus position of the processing laser beam directed onto the workpiece surface relative to the workpiece surface is set based on the distance as determined.

7 . The method as claimed in claim 1 , wherein a target distance between workpiece surface and the z-focus position is corrected to the distance as determined, wherein the target distance is stored in a machine controller.

8 . The method as claimed in claim 1 , wherein the distance is determined cyclically based on a currently measured reference distance and a currently measured workpiece distance.

9 . A non-transitory computer-readable medium having a program code embodied thereon, the program code, when executed by a machine controller of a laser processing machine, causing the machine controller to perform the method as claimed in claim 1 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 23, 2022
From: STAMBKE, MARTIN; HERMANI, JAN-PATRICK
To: TRUMPF LASER GMBH
Reel/Frame 060286/0233 →
Priority Claims (1)
DE 10 2019 132 619.2 · Dec 2, 2019 · national
Continuity (2)
Continuation PCTEP2020084161 · Dec 1, 2020
Related Publication 20220290973A1 · Sep 15, 2022
References Cited (27)
US 6667458B1 · Sirat · 2003 [cited by third party]
US 8822875B2 · Webster · 2014 [cited by examiner]
US 10376992B2 · Hildebrand et al. · 2019 [cited by applicant]
US 20050109742A1 · Nagai et al. · 2005 [cited by applicant]
US 20100155375A1 · Dietz et al. · 2010 [cited by applicant]
US 20140027421A1 · Notheis · 2014 [cited by applicant]
US 20150338210A1 · Lessmüller et al. · 2015 [cited by applicant]
US 20160202045A1 · Schönleber · 2016 [cited by examiner]
US 20170157711A1 · Spiess et al. · 2017 [cited by applicant]
US 20190015931A1 · Kogel-Hollacher · 2019 [cited by examiner]
US 20220290973A1 · Stambke et al. · 2022 [cited by applicant]
CN 1611319A · 2005 [cited by applicant]
CN 105277568A · 2016 [cited by applicant]
CN 105658372A · 2016 [cited by applicant]
CN 105829828A · 2016 [cited by applicant]
CN 106030238A · 2016 [cited by applicant]
CN 106660168A · 2017 [cited by applicant]
DE 102011006553A1 · 2012 [cited by applicant]
DE 102016001661B3 · 2017 [cited by applicant]
DE 102016014564A1 · 2018 [cited by applicant]
DE 102017001353A1 · 2018 [cited by applicant]
EP 1977850A · 2008 [cited by applicant]
Raele, et al., “Development of a Dynamic Interferometric Focusing System for Femtosecond Laser Machining,” [cited by applicant]
Rouwen, et al., “Monitoring of Laser Material Processing Using Machine Integrated Low-Coherence Interferometry,” [cited by applicant]
Ji, et al., “Real-Time Depth Monitoring and Control of Laser Machining Through Scanning Beam Delivery System,” [cited by applicant]
Dorsch, et al., “Controlling Laser Processing Via Optical Coherence Topography,” [cited by applicant]
Third-Party Pre-Issuance Submission for U.S. Appl. No. 17/829,379 (379 Application). [cited by third party]