IP Library › Granted Patent US 11,761,759
Granted Patent B2
US 11,761,759 · App. 17/831,975 · Granted Sep 19, 2023

Probe unit correction method

Inventor: Kohju Kasahara (Tochigi, JP)
Assignee: MITUTOYO CORPORATION
G01B21/045G01B5/008G01B5/0014G01B21/042G01B21/047
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Quick Facts
Patent No.
US 11,761,759
App. No.
17/831,975
Granted
Sep 19, 2023
Kind
B2
Abstract

There is provided a probe unit correction method for correcting linear expansion of a probe unit to obtain an accurate measurement value. First, a probe offset value is calculated as a model. Then, a probe unit correction method includes a temperature data acquisition step of acquiring a temperature difference between a temperature at a time of calibration and a temperature of a current measurement environment, a reference tip coordinate correction step of calculating, as a reference tip correction coordinate value, a correction value of a reference tip coordinate value to which linear expansion is added, and a probe offset correction step of calculating, as a probe offset correction value, a correction value of a probe offset value to which the linear expansion is added.

Claims (13)

1. A correction method of a probe unit configured to detect a surface of an object to be measured with a measuring tip at a tip end,

the probe unit comprising:

a first tip being a measuring tip in a standard form set as an initial standard specification; and

a second tip being a measuring tip in an alteration form changed from the standard form, wherein

the first tip and the second tip are exchangeable,

the first tip and the second tip are calibrated, when the probe unit is calibrated, to acquire a coordinate value of the first tip as a reference tip coordinate value and acquire an offset value from the first tip to the second tip as a probe offset value, and

the probe offset value is added to the reference tip coordinate value to acquire a measurement value when the second tip is used,

the correction method of the probe unit comprising:

a temperature data acquisition step of acquiring a temperature difference between a temperature at a time of the calibration and a temperature of a current measurement environment;

a reference tip coordinate correction step of calculating, as a reference tip correction coordinate value, a correction value of the reference tip coordinate value to which linear expansion is added;

a probe offset correction step of calculating, as a probe offset correction value, a correction value of the probe offset value to which the linear expansion is added; and

a measurement value calculation step of obtaining a corrected measurement value when the second tip is used in the current measurement environment by adding the probe offset correction value to the reference tip correction coordinate value.

2. A recording medium storing a program causing a computer to execute the correction method of the probe unit according to claim 1 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 3, 2022
From: KASAHARA, KOHJU
To: MITUTOYO CORPORATION
Reel/Frame 060099/0049 →
Priority Claims (1)
JP 2021-094809 · Jun 4, 2021 · national
Continuity (1)
Related Publication 20220390227A1 · Dec 8, 2022