Systems and methods for assessing electrical connectivity between elements of assay devices
Disclosed are devices, systems and methods for assessing the integrity of electrical connections between elements of interfacing electronic devices. In some aspects, a system includes an analysis device having electronics that interface with an assay cartridge inserted into the analysis device, wherein the analysis device is configured to conduct a preflight test in which impedance values for each circuit between the assay cartridge and analysis device are rearranged and assessed to determine the electrical connection integrity of the assay cartridge to the analysis device prior to implementing the assay.
1. A method for assessing the integrity of electrical connections between interfacing electronic devices the method comprising:
establishing an electrical connection between a first electronic device and a second electronic device;
measuring impedance values for one or more electrodes on the first electronic device;
reordering the impedance values to create reordered impedance values; and
determining a quality factor of the reordered impedance values, wherein if the quality factor is above a predetermined threshold, the first electronic device is electrically connected to the second electronic device.
2. The method of claim 1 , wherein the first electronic device is an assay cartridge and the second electronic device is an assay processing device.
3. The method of claim 2 , further comprising sending a command signal for initiating an assay procedure when the quality factor is above the predetermined threshold.
4. The method of claim 2 , further comprising sending a command signal for ejecting the assay cartridge from the assay processing device when the quality factor is at or below the predetermined threshold.
5. The method of claim 1 , wherein determining a quality factor of the reordered impedance values comprises excluding one or more impedance values.
6. The method of claim 1 , wherein measuring impedance values comprises applying a voltage to the first electronic device.
7. The method of claim 6 , wherein the voltage is 100 kHz.
8. The method of claim 6 , wherein the voltage is between 100 kHz-1000 kHz.
9. The method of claim 1 , further comprising sending a display command signal for displaying, on a graphical user interface, a verification of the electrical connection between the first electronic device and the second electronic device.
10. A method for assessing the integrity of electrical connections between interfacing electronic devices the method comprising:
establishing an electrical connection between a first electronic device and a second electronic device;
measuring impedance values for one or more electrodes on the first electronic device;
reordering the impedance values to create reordered impedance values; and
determining a quality factor of the reordered impedance value, wherein if the quality factor is within a predetermined threshold range, the first electronic device is electrically connected to the second electronic device.
11. The method of claim 10 , wherein reordering the impedance values comprises matching the impedance values to at least one reference order.
12. The method of claim 11 , wherein at least one impedance value is adjusted to fit the reference order.
13. The method of claim 11 , wherein the reference order is based on prior impedance values obtained from a previous qualified run on the second electric device or impedance values derived from devices of the same type as the second electronic device.
14. The method of claim 11 , wherein the reference order is based on prior impedance values obtained from a previous qualified run on the second electric device and impedance values derived from devices of the same type as the second electronic device.
15. The method of claim 11 , wherein the reference order creates a monotonic sequence of the reordered impedance values or does not create a monotonic sequence of the reordered impedance values.
16. The method of claim 11 , wherein the reference order is created from the average of the highest and lowest impedance value at each electrode circuit from devices of the same type as the second electronic device.
17. The method of claim 11 , wherein when the quality factor is at or below the predetermined threshold range there is an open or short caused by a contaminant.
18. A method for assessing the integrity of electrical connections between interfacing electronic devices the method comprising:
establishing an electrical connection between a first electronic device and a second electronic device;
measuring impedance values for one or more electrodes on the first electronic device;
ordering the impedance values to match at least one reference order wherein the reference order is based on prior impedance values obtained from a previous qualified run on the second electric device or impedance values derived from devices of the same type as the second electronic device;
determining a command for operating or terminating a procedure using the first electronic device and second electronic device; and
actuating the first electronic device, the second electronic device or both in accordance with the determined command.
19. The method of claim 18 , wherein determining a command for operating or terminating a procedure comprises determining a quality factor, wherein if the quality factor is above a predetermined threshold, the first electronic device is electrically connected to the second electronic device.
20. The method of claim 18 , wherein prior to the actuating step determining if additional data should be analyzed.