Memory compaction management in memory devices

1. A system comprising:

a memory device; and

a processing device, operatively coupled to the memory device, to perform operations comprising:

selecting a source set of memory cells of the memory device, wherein the source set of memory cells are configured to store a first number of bits per memory cell;

performing a data integrity check on the source set of memory cells to obtain a data integrity metric value;

determining whether the data integrity metric value satisfies a threshold criterion; and

responsive to determining that the data integrity metric value fails to satisfy the threshold criterion, causing the memory device to copy data from the source set of memory cells to a destination set of memory cells of the memory device, wherein the destination set of memory cells are configured to store a second number of bits per memory cell, wherein the second number of bits per memory cells is greater than the first number of bits per memory cell.

2. The system of claim 1 , wherein the processing device is to perform further operations comprising:

responsive to determining that the data integrity metric value satisfies the threshold criterion, performing an error handling operation on the data stored on the source set of memory cells to generate corrected data.

3. The system of claim 2 , wherein the processing device is to perform further operations comprising:

copying the corrected data to the destination set of memory cells.

4. The system of claim 1 , wherein the source set of memory cells are configured as single-level cell (SLC) memory.

5. The system of claim 1 , wherein the destination set of memory cells are configured as higher-level cell (HLC) memory.

6. The system of claim 1 , wherein the data integrity metric value reflects at least one of a bit error count (BEC) value or a raw bit error rate (RBER) value.

7. The system of claim 1 , wherein the processing device is to perform further operations comprising

performing the data integrity check on the source set of memory cells responsive to determining that a flag is set.

8. A method, comprising:

selecting, by a processor, a first set of memory cells of a memory device, wherein the first set of memory cells are configured to store a first number of bits per memory cell;

determining whether a data integrity metric value satisfies an integrity threshold criterion;

responsive to determining that the data integrity metric value satisfies the integrity threshold criterion, selecting a second set of memory cells of the memory device, wherein the second set of memory cells are configured to use the first number of bits per memory cell; and

copying data from the first set of memory cells and the second set of memory cells to a third set of memory cells of the memory device, wherein the third set of memory cells are configured to store a second number of bits per memory cell, wherein the second number of bits per memory cells is greater than the first number of bits per memory cell.

9. The method of claim 8 , further comprising:

determining a data validity metric value with respect to the first set of memory cells;

determining whether the data validity metric value satisfies a validity threshold criterion;

responsive to determining that the data validity metric value satisfies the validity threshold criterion, determining whether the data integrity metric value satisfies the integrity threshold criterion.

10. The method of claim 9 , wherein the data validity metric value reflects at least one of a program/erase cycles (PECs) value, a time after program (TAP) value, or a block read count value.

11. The method of claim 8 , further comprising:

responsive to failing to select the second set of memory cells, programing data from the first set of memory cells to a fourth set of memory cells of the memory device, wherein the fourth set of memory cells are configured to store the second number of bits per memory cell.

12. The method of claim 8 , further comprising:

performing another data integrity check on the second set of memory cells to obtain another data integrity metric value;

determining whether the another data integrity metric value satisfies another integrity threshold criterion; and

responsive to determining that the another data integrity metric value fails to satisfy the another threshold criterion, copying data from the first set of memory cells and the second set of memory cells to a third set of memory cells of the memory device.

13. The method of claim 12 , further comprising:

responsive to determining that the another data integrity metric value satisfies the another threshold criterion, performing an error handling operation on the data stored on at least one of the first set of memory cells or the second set of memory cells to generate corrected data.

14. The method of claim 8 , wherein the data integrity metric value reflects at least one of a bit error count (BEC) value or a raw bit error rate (RBER) value.

15. The method of claim 8 , wherein the first set of memory cells are configured as single-level cell (SLC) memory.

16. The method of claim 8 , wherein the third set of memory cells are configured as higher-level cell (HLC) memory cells.

17. A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device operatively coupled to a memory, performs operations comprising:

selecting a source set of memory cells of a memory device, wherein the source set of memory cells are configured to store a first number of bits per memory cell;

performing a data integrity check on the source set of memory cells to obtain a data integrity metric value;

determining whether the data integrity metric value satisfies a threshold criterion; and

responsive to determining that the data integrity metric value fails to satisfy the threshold criterion, causing the memory device to copy data from the source set of memory cells to a destination set of memory cells of the memory device, wherein the destination set of memory cells are configured to store a second number of bits per memory cell, wherein the second number of bits per memory cells is greater than the first number of bits per memory cell.

18. The non-transitory computer-readable storage medium of claim 17 , wherein the processing device is to perform further operations comprising:

responsive to determining that the data integrity metric value satisfies the threshold criterion, performing an error handling operation on the data stored on the source set of memory cells to generate corrected data.

19. The non-transitory computer-readable storage medium of claim 17 , wherein the processing device is to perform further operations comprising:

performing the data integrity check on the source set of memory cells responsive to determining that a flag is set.