Device for identifying a rotating component defect

1. A method of identifying at least one defect of a rotating component bearing, the at least one defect being selected from a group of predefined defects, comprising:

extracting frequency data related to each of the predefined defects;

forming a first spectrum signature for each of the predefined defects;

measuring vibrations produced by the rotating bearing to obtain at least two second spectrums;

filtering each second spectrum based on an exponential smoothing algorithm,

selecting peaks in each second spectrum according to a prominence of each of the peaks;

setting the selected peaks to zero if the selected peaks are not present in a predefined number of consecutive second spectrums, and

calculating a probability that at least one of the second spectrums indicates a presence of one of the predefined defects of the rotating bearing.

2. The method according to claim 1 , wherein the frequency data includes harmonics and sidebands of each predefined defect.

3. The method according to claim 1 , wherein selecting peaks includes applying an integrative leaky average algorithm to the second spectrums.

4. The method according to claim 1 ,

further including selecting the unknown peaks in each second spectrum based on the most probable first spectrum signature.

5. A device for identifying at least one defect selected from a group of predefined defects of a rotating bearing, comprising:

acquisition means configured to extract frequency data related to each of the predefined defects;

computing means configured to form a first spectrum signature from the frequency data related to each of the predefined defects;

a vibration sensor configured to measure vibrations produced by a rotation of the rotating bearing to obtain at least two second spectrums;

a filter configured to filter each of the at least two second spectrums based on an exponential smoothing algorithm, and

processing means configured to select peaks in each second spectrum according to their prominence, to set selected peaks to zero if they are not present in a predefined number of consecutive second spectrums and to compare the at least two second spectrums to each of the first spectrum signatures and to calculate a probability that each second spectrum signature corresponds to one of the predefined defects.

6. The device according to claim 5 , wherein the frequency data includes harmonics and sidebands of each predefined defect.

7. The device according to claim 6 , wherein the processing means are configured to select the peaks by using an integrative leaky average algorithm.

8. The device according to claim 5 , wherein the processing means are configured to select the unknown peaks in each second spectrum based on the most probable first spectrum signature.

9. An integrated circuit comprising a device according to claim 5 .

10. A bearing comprising an integrated circuit according to claim 9 .

11. A method of identifying at least one defect of a rotating bearing, the at least one defect being selected from a group of predefined defects, comprising:

providing a first spectrum signature for each of the predefined defects;

measuring vibrations produced by the rotating bearing to produce at least two second spectrums from the measured vibrations;

filtering each second spectrum based on an exponential smoothing algorithm,

selecting peaks in each second spectrum according to a prominence of each of the peaks;

setting the selected peaks to zero if the selected peaks are not present in a predefined number of consecutive second spectrums,

calculating a correlation between each first spectrum signature and each of the second spectrums, and

identifying a probability that each of the second spectrums indicates a presence of one of the predefined defects of the rotating bearing.