Shaped central electrode inside radio frequency rail to control aspects of an ion trap
A shaped central electrode is described that is placed between a pair of radio frequency (RF) rails of a trap configured to hold atomic-based qubits to control aspects of the operation of the trap. In one aspect, the shaping may involve forming a pinched region in the middle of the central electrode. The middle of the central electrode may correspond to the middle portion of the trap. The shaping of the central electrode may be achieved in different ways and may involve varying the width of the central electrode. The trap may be fabricated on a glass die or substrate, which itself may be shaped or not. The trap may be fabricated by various methods such as, but not limited to, patterned metal layers on glass or silicon substrates. A quantum information processing (QIP) system is also described that may include a trap having any of these features.
1. A trap for holding atomic-based qubits, comprising:
a pair of radio frequency (RF) rails including a first RF electrode placed on a top surface of the trap along a length of the trap and a second RF electrode placed on the top surface of the trap along the length of the trap and parallel to the first RF electrode; and
a direct current (DC) electrode placed on the top surface of the trap and between the first RF electrode and the second RF electrode, wherein a portion of the DC electrode is shaped to provide desired potentials for trapping ions used as the atomic-based qubits.
2. The trap of claim 1 , wherein the DC electrode is placed parallel to the first RF electrode and to the second RF electrode and along a longitudinal direction of the trap.
3. The trap of claim 1 , wherein the DC electrode has a substantially uniform width along a length of the DC electrode other than the portion of the DC electrode that is shaped.
4. The trap of claim 1 , wherein the trap is made of a glass die or glass substrate, and the first RF electrode, the second RF electrode, and the DC electrode are placed on the top surface of the glass die or glass substrate.
5. The trap of claim 1 , wherein the portion of the DC electrode that is shaped includes a non-uniform variation of a width of the DC electrode.
6. The trap of claim 5 , wherein the non-uniform variation of the width of the DC electrode is a pinching of the width of the DC electrode.
7. The trap of claim 5 , wherein the non-uniform variation of the width of the DC electrode includes having one or more sections of the DC electrode with a wider width than a substantially uniform width along a length the DC electrode.
8. The trap of claim 1 , wherein the first RF electrode, the second RF electrode, and the DC electrode are made of a conductive material.
9. The trap of claim 1 , wherein the trap is made of a glass die or glass substrate, and the DC electrode is isolated from the first RF electrode and the second RF electrode through undercuts formed in the glass die or glass substrate.
10. The trap of claim 1 , further comprising additional DC electrodes placed and routed on the top surface of the trap, an end of the additional DC electrodes being placed near the outside of the pair of RF rails and perpendicular to the pair of RF rails and the DC electrode.
11. A quantum information processing (QIP) system, comprising:
a trap including a pair of radio frequency (RF) rails having a first RF electrode placed on a top surface of the trap along a length of the trap and a second RF electrode placed on the top surface of the trap along the length of the trap and parallel to the first RF electrode, and a direct current (DC) electrode placed on the top surface of the trap and between the first RF electrode and the second RF electrode, wherein a portion of the DC electrode is shaped to provide desired potentials for trapping ions used as atomic-based qubits in the QIP system; and
an optical and trap controller configured to control the generation of signals to be applied to the trap, including RF signals to be applied to the pair of RF rails and DC signals to be applied to the DC electrode.
12. The QIP system of claim 11 , wherein the DC electrode is placed parallel to the first RF electrode and to the second RF electrode and along a longitudinal axis of the trap.
13. The QIP system of claim 11 , wherein the DC electrode has a substantially uniform width along a length of the DC electrode other than the portion of the DC electrode that is shaped.
14. The QIP system of claim 11 , wherein the trap is made of a glass die or glass substrate, and the first RF electrode, the second RF electrode, and the DC electrode are placed on the top surface of the glass die or glass substrate.
15. The QIP system of claim 11 , wherein the portion of the DC electrode that is shaped includes a non-uniform variation of a width of the DC electrode.
16. The QIP system of claim 15 , wherein the non-uniform variation of the width of the DC electrode is a pinching of the width of the DC electrode or having one or more sections of the DC electrode with a wider width than a substantially uniform width along a length the DC electrode.
17. The QIP system of claim 11 , wherein the first RF electrode, the second RF electrode, and the DC electrode are made of a conductive material.
18. The QIP system of claim 11 , wherein the trap is made of a glass die or glass substrate, and the DC electrode is isolated from the first RF electrode and the second RF electrode through undercuts formed in the glass die or glass substrate.
19. The QIP system of claim 11 , further comprising additional DC electrodes placed and routed on the top surface of the trap, an end of the additional DC electrodes being placed near the outside of the pair of RF rails and perpendicular to the pair of RF rails and the DC electrode.
20. The QIP system of claim 11 , further comprising a chamber within which the trap is disposed, the optical and trap controller being configured to provide the RF signals and the DC signals to the trap within the chamber.